{"id":"https://openalex.org/W2083364254","doi":"https://doi.org/10.1109/mwscas.2013.6674647","title":"Enhanced event-driven modeling of a CP-PLL with nonlinearities and nonidealities","display_name":"Enhanced event-driven modeling of a CP-PLL with nonlinearities and nonidealities","publication_year":2013,"publication_date":"2013-08-01","ids":{"openalex":"https://openalex.org/W2083364254","doi":"https://doi.org/10.1109/mwscas.2013.6674647","mag":"2083364254"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas.2013.6674647","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2013.6674647","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017444581","display_name":"Christian Hangmann","orcid":null},"institutions":[{"id":"https://openalex.org/I206945453","display_name":"Paderborn University","ror":"https://ror.org/058kzsd48","country_code":"DE","type":"education","lineage":["https://openalex.org/I206945453"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Christian Hangmann","raw_affiliation_strings":["Sensor Technology Group, University of Paderborn, Germany","Sensor Technol. Group, Univ. of Paderborn, Paderborn, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sensor Technology Group, University of Paderborn, Germany","institution_ids":["https://openalex.org/I206945453"]},{"raw_affiliation_string":"Sensor Technol. Group, Univ. of Paderborn, Paderborn, Germany","institution_ids":["https://openalex.org/I206945453"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091650490","display_name":"Christian Hedayat","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120526","display_name":"Fraunhofer Institute for Electronic Nano Systems","ror":"https://ror.org/02h12bg79","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210120526","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Christian Hedayat","raw_affiliation_strings":["Fraunhofer ENAS, Paderborn, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer ENAS, Paderborn, Germany","institution_ids":["https://openalex.org/I4210120526"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091462785","display_name":"Ulrich Hilleringmann","orcid":"https://orcid.org/0000-0002-1621-0067"},"institutions":[{"id":"https://openalex.org/I206945453","display_name":"Paderborn University","ror":"https://ror.org/058kzsd48","country_code":"DE","type":"education","lineage":["https://openalex.org/I206945453"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ulrich Hilleringmann","raw_affiliation_strings":["Sensor Technology Group, University of Paderborn, Germany","Sensor Technol. Group, Univ. of Paderborn, Paderborn, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sensor Technology Group, University of Paderborn, Germany","institution_ids":["https://openalex.org/I206945453"]},{"raw_affiliation_string":"Sensor Technol. Group, Univ. of Paderborn, Paderborn, Germany","institution_ids":["https://openalex.org/I206945453"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.2159,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.77794468,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"309","last_page":"312"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9941999912261963,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.8709476590156555},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5965260863304138},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5612486004829407},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5510799884796143},{"id":"https://openalex.org/keywords/pll-multibit","display_name":"PLL multibit","score":0.4635336399078369},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21845844388008118},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.09831038117408752},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.09688910841941833},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.07339772582054138}],"concepts":[{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.8709476590156555},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5965260863304138},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5612486004829407},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5510799884796143},{"id":"https://openalex.org/C77881186","wikidata":"https://www.wikidata.org/wiki/Q7119642","display_name":"PLL multibit","level":4,"score":0.4635336399078369},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21845844388008118},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09831038117408752},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.09688910841941833},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.07339772582054138}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/mwscas.2013.6674647","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2013.6674647","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},{"id":"pmh:oai:publica.fraunhofer.de:publica/382319","is_oa":false,"landing_page_url":"https://publica.fraunhofer.de/handle/publica/382319","pdf_url":null,"source":{"id":"https://openalex.org/S4306400318","display_name":"Fraunhofer-Publica (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"conference paper"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Decent work and economic growth","score":0.4300000071525574,"id":"https://metadata.un.org/sdg/8"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W136502164","https://openalex.org/W1797924133","https://openalex.org/W1972139540","https://openalex.org/W2058084164","https://openalex.org/W2098928452","https://openalex.org/W2125125139","https://openalex.org/W2127604288","https://openalex.org/W2153267648","https://openalex.org/W2167618048","https://openalex.org/W2540801527"],"related_works":["https://openalex.org/W1576949837","https://openalex.org/W984417604","https://openalex.org/W2498262093","https://openalex.org/W2188779191","https://openalex.org/W3134930219","https://openalex.org/W2967785526","https://openalex.org/W188830667","https://openalex.org/W1605914315","https://openalex.org/W4360861688","https://openalex.org/W4225994594"],"abstract_inverted_index":{"The":[0],"characterization":[1,89],"of":[2,39,53,57,90],"nonidealities":[3,27],"in":[4,10,20],"a":[5,8,21,98],"CP-PLL":[6,17,60],"is":[7,18,46,64,76],"challenge":[9],"modeling":[11,67],"and":[12,28,35,48,88],"simulation.":[13,100],"In":[14,69],"general":[15],"the":[16,33,36,40,42,54,58,61,91],"implemented":[19],"transistor-level":[22,45,99],"simulation":[23,43],"platform,":[24],"including":[25],"all":[26],"parasitic":[29],"effects.":[30],"Due":[31],"to":[32],"low-frequency":[34],"high-frequency":[37],"part":[38],"CP-PLL,":[41],"at":[44],"time":[47],"computer":[49],"resource":[50],"consuming.":[51],"Because":[52],"triggered":[55],"nature":[56],"mixed-signal":[59],"event-driven":[62,74],"model":[63,75,83],"an":[65,72,85],"efficient":[66,86],"technique.":[68],"this":[70],"paper":[71],"enhanced":[73],"investigated,":[77],"considering":[78],"some":[79],"typical":[80],"nonidealities.":[81],"This":[82],"allows":[84],"analysis":[87],"nonideality-effects.":[92],"All":[93],"results":[94],"are":[95],"validated":[96],"by":[97]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}