{"id":"https://openalex.org/W1972682015","doi":"https://doi.org/10.1109/mwscas.2013.6674594","title":"A bandgap voltage reference in 0.18&amp;#x00B5;m CMOS technology","display_name":"A bandgap voltage reference in 0.18&amp;#x00B5;m CMOS technology","publication_year":2013,"publication_date":"2013-08-01","ids":{"openalex":"https://openalex.org/W1972682015","doi":"https://doi.org/10.1109/mwscas.2013.6674594","mag":"1972682015"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas.2013.6674594","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2013.6674594","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050857383","display_name":"Javier Alejandro Mart\u00ednez-Nieto","orcid":"https://orcid.org/0000-0002-1405-1808"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":true,"raw_author_name":"A. Martinez-Nieto","raw_affiliation_strings":["Electronics Department, Instituto Nacional de Astrof\u00edsica Optica y Electr\u00f3nica (INAOE), Tonantzintla, Puebla, Mexico","Electron. Dept., Inst. Nac. de Astrofis., Tonantzintla, Mexico"],"affiliations":[{"raw_affiliation_string":"Electronics Department, Instituto Nacional de Astrof\u00edsica Optica y Electr\u00f3nica (INAOE), Tonantzintla, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]},{"raw_affiliation_string":"Electron. Dept., Inst. Nac. de Astrofis., Tonantzintla, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025165034","display_name":"M.T. Sanz","orcid":"https://orcid.org/0000-0002-5820-7608"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"M.T. Sanz-Pascual","raw_affiliation_strings":["Electronics Department, Instituto Nacional de Astrof\u00edsica Optica y Electr\u00f3nica (INAOE), Tonantzintla, Puebla, Mexico","Electron. Dept., Inst. Nac. de Astrofis., Tonantzintla, Mexico"],"affiliations":[{"raw_affiliation_string":"Electronics Department, Instituto Nacional de Astrof\u00edsica Optica y Electr\u00f3nica (INAOE), Tonantzintla, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]},{"raw_affiliation_string":"Electron. Dept., Inst. Nac. de Astrofis., Tonantzintla, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078392704","display_name":"Pedro Rosales","orcid":"https://orcid.org/0000-0002-8352-5114"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"P. Rosales-Quintero","raw_affiliation_strings":["Electronics Department, Instituto Nacional de Astrof\u00edsica Optica y Electr\u00f3nica (INAOE), Tonantzintla, Puebla, Mexico","Electron. Dept., Inst. Nac. de Astrofis., Tonantzintla, Mexico"],"affiliations":[{"raw_affiliation_string":"Electronics Department, Instituto Nacional de Astrof\u00edsica Optica y Electr\u00f3nica (INAOE), Tonantzintla, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]},{"raw_affiliation_string":"Electron. Dept., Inst. Nac. de Astrofis., Tonantzintla, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075718351","display_name":"S. Celma","orcid":"https://orcid.org/0000-0003-0182-7723"},"institutions":[{"id":"https://openalex.org/I255234318","display_name":"Universidad de Zaragoza","ror":"https://ror.org/012a91z28","country_code":"ES","type":"education","lineage":["https://openalex.org/I255234318"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Santiago Celma","raw_affiliation_strings":["Electronic Design Group (GDE_CDAM), University of Zaragoza, Zaragoza, Spain","Electron. Design Group (GDE CDAM), Univ. of Zaragoza, Zaragoza, Spain"],"affiliations":[{"raw_affiliation_string":"Electronic Design Group (GDE_CDAM), University of Zaragoza, Zaragoza, Spain","institution_ids":["https://openalex.org/I255234318"]},{"raw_affiliation_string":"Electron. Design Group (GDE CDAM), Univ. of Zaragoza, Zaragoza, Spain","institution_ids":["https://openalex.org/I255234318"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5050857383"],"corresponding_institution_ids":["https://openalex.org/I39824353"],"apc_list":null,"apc_paid":null,"fwci":0.3997,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.62563688,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"97","last_page":"100"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bandgap-voltage-reference","display_name":"Bandgap voltage reference","score":0.9582232236862183},{"id":"https://openalex.org/keywords/temperature-coefficient","display_name":"Temperature coefficient","score":0.7450786232948303},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7227636575698853},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.63407301902771},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5725778341293335},{"id":"https://openalex.org/keywords/trimming","display_name":"Trimming","score":0.5513767600059509},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5066086053848267},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4948548674583435},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.4907439947128296},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4872490465641022},{"id":"https://openalex.org/keywords/line-regulation","display_name":"Line regulation","score":0.4448697566986084},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4364824593067169},{"id":"https://openalex.org/keywords/silicon-bandgap-temperature-sensor","display_name":"Silicon bandgap temperature sensor","score":0.41813042759895325},{"id":"https://openalex.org/keywords/atmospheric-temperature-range","display_name":"Atmospheric temperature range","score":0.4121689796447754},{"id":"https://openalex.org/keywords/power-supply-rejection-ratio","display_name":"Power supply rejection ratio","score":0.41106608510017395},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2728462815284729},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2663595378398895},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2140553891658783},{"id":"https://openalex.org/keywords/dropout-voltage","display_name":"Dropout voltage","score":0.20051640272140503}],"concepts":[{"id":"https://openalex.org/C127033052","wikidata":"https://www.wikidata.org/wiki/Q48635","display_name":"Bandgap voltage reference","level":5,"score":0.9582232236862183},{"id":"https://openalex.org/C16643434","wikidata":"https://www.wikidata.org/wiki/Q898642","display_name":"Temperature coefficient","level":2,"score":0.7450786232948303},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7227636575698853},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.63407301902771},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5725778341293335},{"id":"https://openalex.org/C56951928","wikidata":"https://www.wikidata.org/wiki/Q3539213","display_name":"Trimming","level":2,"score":0.5513767600059509},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5066086053848267},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4948548674583435},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.4907439947128296},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4872490465641022},{"id":"https://openalex.org/C2777901765","wikidata":"https://www.wikidata.org/wiki/Q6553328","display_name":"Line regulation","level":5,"score":0.4448697566986084},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4364824593067169},{"id":"https://openalex.org/C168032602","wikidata":"https://www.wikidata.org/wiki/Q7515014","display_name":"Silicon bandgap temperature sensor","level":5,"score":0.41813042759895325},{"id":"https://openalex.org/C39353612","wikidata":"https://www.wikidata.org/wiki/Q5283759","display_name":"Atmospheric temperature range","level":2,"score":0.4121689796447754},{"id":"https://openalex.org/C15892472","wikidata":"https://www.wikidata.org/wiki/Q1482413","display_name":"Power supply rejection ratio","level":4,"score":0.41106608510017395},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2728462815284729},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2663595378398895},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2140553891658783},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.20051640272140503},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mwscas.2013.6674594","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2013.6674594","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8799999952316284,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W613096942","https://openalex.org/W1536738200","https://openalex.org/W1560079243","https://openalex.org/W1754632526","https://openalex.org/W1976272148","https://openalex.org/W2020076701","https://openalex.org/W2100463091","https://openalex.org/W2125507119","https://openalex.org/W2136039263","https://openalex.org/W2155754904","https://openalex.org/W6632187241","https://openalex.org/W6637980105"],"related_works":["https://openalex.org/W2347289947","https://openalex.org/W2270379489","https://openalex.org/W2251517804","https://openalex.org/W2388455624","https://openalex.org/W1575870214","https://openalex.org/W3182889680","https://openalex.org/W3160631618","https://openalex.org/W2115376998","https://openalex.org/W2385198939","https://openalex.org/W2354544661"],"abstract_inverted_index":{"A":[0],"low-temperature":[1],"coefficient,":[2],"curvature-compensated":[3],"CMOS":[4,21],"bandgap":[5,84],"voltage":[6,37,64],"reference":[7,85],"(BGR)":[8],"is":[9,29,65,93],"presented":[10],"in":[11,18],"this":[12],"paper.":[13],"The":[14,27,62,83],"design":[15,51],"was":[16],"implemented":[17],"standard":[19],"0.18\u03bcm":[20],"process":[22,60],"with":[23,38],"1.8V":[24],"power":[25],"supply.":[26],"compensation":[28],"achieved":[30],"generating":[31],"the":[32,50],"negative":[33],"temperature":[34,41,76],"coefficient":[35],"(TC)":[36],"a":[39,45,53,69,75],"quadratic":[40],"dependent":[42],"current":[43],"biasing":[44],"bipolar":[46],"transistor.":[47],"In":[48],"addition,":[49],"has":[52],"4-bit":[54],"trimming":[55],"circuit":[56],"to":[57,81],"compensate":[58],"for":[59],"variations.":[61],"output":[63],"1.225V":[66],"and":[67,88],"shows":[68],"TC":[70],"lower":[71],"than":[72],"2ppm/\u00b0C":[73],"over":[74],"range":[77],"of":[78],"160\u00b0C":[79],"(-20\u00b0C":[80],"140\u00b0C).":[82],"consumes":[86],"620\u03bcW":[87],"its":[89],"total":[90],"layout":[91],"area":[92],"217\u00d7147\u03bcm":[94],"<sup":[95],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[96],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[97],".":[98]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}