{"id":"https://openalex.org/W2089514329","doi":"https://doi.org/10.1109/mwscas.2012.6292101","title":"Performance of a resistance-to-voltage read circuit for sensing magnetic tunnel junctions","display_name":"Performance of a resistance-to-voltage read circuit for sensing magnetic tunnel junctions","publication_year":2012,"publication_date":"2012-08-01","ids":{"openalex":"https://openalex.org/W2089514329","doi":"https://doi.org/10.1109/mwscas.2012.6292101","mag":"2089514329"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas.2012.6292101","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2012.6292101","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088626634","display_name":"Michael J. Hall","orcid":"https://orcid.org/0000-0002-5823-6580"},"institutions":[{"id":"https://openalex.org/I204465549","display_name":"Washington University in St. Louis","ror":"https://ror.org/01yc7t268","country_code":"US","type":"education","lineage":["https://openalex.org/I204465549"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael J. Hall","raw_affiliation_strings":["Department of Computer Science & Engineering, Washington University in St. Louis","[Department of Computer Science and Engineering, Washington University in St. Louis, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science & Engineering, Washington University in St. Louis","institution_ids":["https://openalex.org/I204465549"]},{"raw_affiliation_string":"[Department of Computer Science and Engineering, Washington University in St. Louis, USA]","institution_ids":["https://openalex.org/I204465549"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107412730","display_name":"Viktor Gruev","orcid":null},"institutions":[{"id":"https://openalex.org/I204465549","display_name":"Washington University in St. Louis","ror":"https://ror.org/01yc7t268","country_code":"US","type":"education","lineage":["https://openalex.org/I204465549"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Viktor Gruev","raw_affiliation_strings":["Department of Computer Science & Engineering, Washington University in St. Louis","[Department of Computer Science and Engineering, Washington University in St. Louis, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science & Engineering, Washington University in St. Louis","institution_ids":["https://openalex.org/I204465549"]},{"raw_affiliation_string":"[Department of Computer Science and Engineering, Washington University in St. Louis, USA]","institution_ids":["https://openalex.org/I204465549"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006814645","display_name":"Roger D. Chamberlain","orcid":"https://orcid.org/0000-0002-7207-6106"},"institutions":[{"id":"https://openalex.org/I204465549","display_name":"Washington University in St. Louis","ror":"https://ror.org/01yc7t268","country_code":"US","type":"education","lineage":["https://openalex.org/I204465549"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Roger D. Chamberlain","raw_affiliation_strings":["Department of Computer Science & Engineering, Washington University in St. Louis","[Department of Computer Science and Engineering, Washington University in St. Louis, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science & Engineering, Washington University in St. Louis","institution_ids":["https://openalex.org/I204465549"]},{"raw_affiliation_string":"[Department of Computer Science and Engineering, Washington University in St. Louis, USA]","institution_ids":["https://openalex.org/I204465549"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2136,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.58447965,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"639","last_page":"642"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.8199853897094727},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6339818239212036},{"id":"https://openalex.org/keywords/skew","display_name":"Skew","score":0.5846181511878967},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5583693385124207},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.532578706741333},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.45569223165512085},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.44960784912109375},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.4467242956161499},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.44515734910964966},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.4181619882583618},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4002806544303894},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.37259215116500854},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36368727684020996},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28734737634658813},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2566640377044678},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12265366315841675}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.8199853897094727},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6339818239212036},{"id":"https://openalex.org/C43711488","wikidata":"https://www.wikidata.org/wiki/Q7534783","display_name":"Skew","level":2,"score":0.5846181511878967},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5583693385124207},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.532578706741333},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.45569223165512085},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.44960784912109375},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.4467242956161499},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.44515734910964966},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.4181619882583618},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4002806544303894},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.37259215116500854},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36368727684020996},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28734737634658813},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2566640377044678},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12265366315841675},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mwscas.2012.6292101","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2012.6292101","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8799999952316284}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1838422046","https://openalex.org/W1969781437","https://openalex.org/W2017569700","https://openalex.org/W2025922849","https://openalex.org/W2110276925","https://openalex.org/W2112670920","https://openalex.org/W2126439455","https://openalex.org/W2146235148","https://openalex.org/W6638705515"],"related_works":["https://openalex.org/W2121182846","https://openalex.org/W2155789024","https://openalex.org/W2315668284","https://openalex.org/W3213608175","https://openalex.org/W2109491806","https://openalex.org/W3117675750","https://openalex.org/W2796521923","https://openalex.org/W95651076","https://openalex.org/W2770163697","https://openalex.org/W2110521006"],"abstract_inverted_index":{"Magnetic":[0],"tunnel":[1],"junction":[2],"devices":[3],"represent":[4],"state":[5,26],"in":[6,54,68,114],"the":[7,75,102],"form":[8],"of":[9,104],"a":[10,17,30,37,55,65,69],"magnetic":[11,118],"field":[12],"that":[13,116],"is":[14],"accessed":[15],"as":[16],"resistance.":[18],"Read":[19],"circuits":[20,109],"are":[21,130],"needed":[22],"to":[23,28,64,79],"sense":[24],"this":[25,42],"and":[27,51,60,96,129],"produce":[29],"digital":[31],"logic":[32],"voltage":[33],"output.":[34],"We":[35,99],"designed":[36],"resistance-to-voltage":[38],"read":[39,108],"circuit":[40],"for":[41,110],"purpose.":[43],"This":[44],"paper":[45],"presents":[46],"area,":[47],"transient":[48],"response,":[49],"power,":[50],"jitter":[52,97],"characterizations":[53],"3M2P":[56],"0.5":[57],"\u03bcm":[58,72],"process":[59,76],"compares":[61],"these":[62],"results":[63],"second":[66],"implementation":[67],"5M1P":[70],"0.18":[71],"process.":[73],"As":[74],"scales":[77],"down":[78],"smaller":[80],"dimensions,":[81],"area":[82],"decreases,":[83,95],"rise/fall":[84],"times":[85,88],"decrease,":[86,89],"propagation":[87],"maximum":[90],"frequency":[91],"increases,":[92],"power":[93],"consumption":[94],"decreases.":[98],"then":[100],"evaluate":[101],"quality":[103],"phase":[105],"measurements":[106],"between":[107],"assessing":[111],"clock":[112],"skew":[113],"systems":[115],"use":[117],"global":[119],"clocking.":[120],"Phase":[121],"delays":[122],"above":[123,132],"1.25":[124],"ns":[125],"can":[126],"be":[127],"detected":[128],"linear":[131],"2":[133],"ns.":[134]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}