{"id":"https://openalex.org/W2114424039","doi":"https://doi.org/10.1109/mtdt.2002.1029771","title":"A fault modeling technique to test memory BIST algorithms","display_name":"A fault modeling technique to test memory BIST algorithms","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2114424039","doi":"https://doi.org/10.1109/mtdt.2002.1029771","mag":"2114424039"},"language":"en","primary_location":{"id":"doi:10.1109/mtdt.2002.1029771","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mtdt.2002.1029771","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010942252","display_name":"R. Venkatesh","orcid":"https://orcid.org/0000-0002-0174-9908"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"R. Venkatesh","raw_affiliation_strings":["Paxonet Communications, CA, USA","Paxonet Commun., CA, USA"],"affiliations":[{"raw_affiliation_string":"Paxonet Communications, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Paxonet Commun., CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101788564","display_name":"Santhosh Kumar","orcid":"https://orcid.org/0000-0001-5720-3042"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Kumar","raw_affiliation_strings":["Paxonet Communications, CA, USA","Paxonet Commun., CA, USA"],"affiliations":[{"raw_affiliation_string":"Paxonet Communications, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Paxonet Commun., CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061884049","display_name":"J. Philip","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. Philip","raw_affiliation_strings":["Paxonet Communications, CA, USA","Paxonet Commun., CA, USA"],"affiliations":[{"raw_affiliation_string":"Paxonet Communications, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Paxonet Commun., CA, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012408072","display_name":"Sunil Shukla","orcid":"https://orcid.org/0000-0002-9268-4096"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Shukla","raw_affiliation_strings":["Paxonet Communications, CA, USA","Paxonet Commun., CA, USA"],"affiliations":[{"raw_affiliation_string":"Paxonet Communications, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Paxonet Commun., CA, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5010942252"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5031,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.66478324,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"109","last_page":"116"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6764925718307495},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.6557748317718506},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5591092705726624},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.548126220703125},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.49242910742759705},{"id":"https://openalex.org/keywords/memory-model","display_name":"Memory model","score":0.4806317389011383},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4491991400718689},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.44712337851524353},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.44544070959091187},{"id":"https://openalex.org/keywords/memory-test","display_name":"Memory test","score":0.4385776221752167},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3813646733760834},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3776339292526245},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.35038796067237854},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3317809998989105},{"id":"https://openalex.org/keywords/shared-memory","display_name":"Shared memory","score":0.16609665751457214},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16595381498336792},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.11352813243865967},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11199763417243958}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6764925718307495},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.6557748317718506},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5591092705726624},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.548126220703125},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.49242910742759705},{"id":"https://openalex.org/C12186640","wikidata":"https://www.wikidata.org/wiki/Q6815743","display_name":"Memory model","level":3,"score":0.4806317389011383},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4491991400718689},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.44712337851524353},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.44544070959091187},{"id":"https://openalex.org/C3017990537","wikidata":"https://www.wikidata.org/wiki/Q6815759","display_name":"Memory test","level":3,"score":0.4385776221752167},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3813646733760834},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3776339292526245},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.35038796067237854},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3317809998989105},{"id":"https://openalex.org/C133875982","wikidata":"https://www.wikidata.org/wiki/Q764810","display_name":"Shared memory","level":2,"score":0.16609665751457214},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16595381498336792},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.11352813243865967},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11199763417243958},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C169760540","wikidata":"https://www.wikidata.org/wiki/Q207011","display_name":"Neuroscience","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C169900460","wikidata":"https://www.wikidata.org/wiki/Q2200417","display_name":"Cognition","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mtdt.2002.1029771","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mtdt.2002.1029771","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6800000071525574,"id":"https://metadata.un.org/sdg/11","display_name":"Sustainable cities and communities"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2007400650","https://openalex.org/W2027087300","https://openalex.org/W2078063367","https://openalex.org/W2106935654","https://openalex.org/W2112727903","https://openalex.org/W2116427723","https://openalex.org/W2118910735","https://openalex.org/W2119511720","https://openalex.org/W2136607719","https://openalex.org/W2151905636","https://openalex.org/W2153282966","https://openalex.org/W2416032159","https://openalex.org/W4249693631"],"related_works":["https://openalex.org/W2051500795","https://openalex.org/W3150960233","https://openalex.org/W2107097146","https://openalex.org/W4240473904","https://openalex.org/W3148663848","https://openalex.org/W2905357958","https://openalex.org/W2024194466","https://openalex.org/W2005680954","https://openalex.org/W2474604829","https://openalex.org/W1647641933"],"abstract_inverted_index":{"The":[0,39,75,97],"amount":[1],"of":[2,69,81,95],"memory":[3,15,48,70,76],"being":[4],"embedded":[5],"on":[6,24],"chip":[7,25],"is":[8],"growing":[9],"rapidly.":[10],"This":[11,61],"strongly":[12],"implies":[13],"that":[14,84],"built-in-self-test":[16],"(BIST)":[17],"logic":[18,32],"assumes":[19],"utmost":[20],"importance":[21],"amongst":[22],"all":[23],"self":[26],"test":[27],"logic.":[28],"Therefore":[29],"the":[30,79,88,107],"BIST":[31],"should":[33],"be":[34,110],"comprehensively":[35],"validated":[36],"before":[37],"fabrication.":[38],"key":[40],"to":[41,65],"this":[42,52],"achievement":[43],"lies":[44],"in":[45,73,87,93],"a":[46,56],"robust":[47],"fault":[49,58,83,108],"model.":[50],"In":[51],"paper":[53],"we":[54],"propose":[55],"novel":[57],"modeling":[59],"technique.":[60],"technique":[62,98],"can":[63,85,109],"scale":[64],"emulate":[66],"any":[67,82],"kind":[68],"architecture":[71,77],"currently":[72],"use.":[74],"and":[78,102],"location":[80],"occur":[86],"cell":[89],"array":[90],"are":[91],"represented":[92],"terms":[94],"equations.":[96],"applies":[99],"these":[100],"equations":[101],"calculates":[103],"an":[104],"address":[105],"where":[106],"modeled.":[111]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}