{"id":"https://openalex.org/W2136912904","doi":"https://doi.org/10.1109/mse.2009.5270823","title":"Towards heterogeneous microsystems design-for-test in a graduate student environment","display_name":"Towards heterogeneous microsystems design-for-test in a graduate student environment","publication_year":2009,"publication_date":"2009-07-01","ids":{"openalex":"https://openalex.org/W2136912904","doi":"https://doi.org/10.1109/mse.2009.5270823","mag":"2136912904"},"language":"en","primary_location":{"id":"doi:10.1109/mse.2009.5270823","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mse.2009.5270823","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE International Conference on Microelectronic Systems Education","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060825274","display_name":"Peter A. Stokes","orcid":"https://orcid.org/0000-0002-9060-9340"},"institutions":[{"id":"https://openalex.org/I4210129216","display_name":"CMC Microsystems (Canada)","ror":"https://ror.org/03k70ea39","country_code":"CA","type":"company","lineage":["https://openalex.org/I4210129216"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Peter A. Stokes","raw_affiliation_strings":["CMC Microsystems, Kingston, ONT, Canada","CMC Microsystems, Kingston, Ontario, Canada"],"affiliations":[{"raw_affiliation_string":"CMC Microsystems, Kingston, ONT, Canada","institution_ids":["https://openalex.org/I4210129216"]},{"raw_affiliation_string":"CMC Microsystems, Kingston, Ontario, Canada","institution_ids":["https://openalex.org/I4210129216"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070901333","display_name":"R. E. Mallard","orcid":null},"institutions":[{"id":"https://openalex.org/I4210129216","display_name":"CMC Microsystems (Canada)","ror":"https://ror.org/03k70ea39","country_code":"CA","type":"company","lineage":["https://openalex.org/I4210129216"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Robert E. Mallard","raw_affiliation_strings":["CMC Microsystems, Kingston, ONT, Canada","CMC Microsystems, Kingston, Ontario, Canada"],"affiliations":[{"raw_affiliation_string":"CMC Microsystems, Kingston, ONT, Canada","institution_ids":["https://openalex.org/I4210129216"]},{"raw_affiliation_string":"CMC Microsystems, Kingston, Ontario, Canada","institution_ids":["https://openalex.org/I4210129216"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5060825274"],"corresponding_institution_ids":["https://openalex.org/I4210129216"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15288293,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"81","last_page":"84"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12452","display_name":"Electrowetting and Microfluidic Technologies","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12452","display_name":"Electrowetting and Microfluidic Technologies","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12784","display_name":"Modular Robots and Swarm Intelligence","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9941999912261963,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.7229356169700623},{"id":"https://openalex.org/keywords/microsystem","display_name":"Microsystem","score":0.6461885571479797},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6382724046707153},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.629072368144989},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.6052828431129456},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5956239700317383},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.5827574729919434},{"id":"https://openalex.org/keywords/rapid-prototyping","display_name":"Rapid prototyping","score":0.4495682120323181},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.371415376663208},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.36989283561706543},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.27454832196235657},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2660452723503113}],"concepts":[{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.7229356169700623},{"id":"https://openalex.org/C151054161","wikidata":"https://www.wikidata.org/wiki/Q379385","display_name":"Microsystem","level":2,"score":0.6461885571479797},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6382724046707153},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.629072368144989},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.6052828431129456},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5956239700317383},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.5827574729919434},{"id":"https://openalex.org/C2780395129","wikidata":"https://www.wikidata.org/wiki/Q1128971","display_name":"Rapid prototyping","level":2,"score":0.4495682120323181},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.371415376663208},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.36989283561706543},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.27454832196235657},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2660452723503113},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mse.2009.5270823","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mse.2009.5270823","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE International Conference on Microelectronic Systems Education","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6600000262260437,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320337291","display_name":"Infrastructure Canada","ror":"https://ror.org/007kz3b20"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2100292671","https://openalex.org/W2105371448","https://openalex.org/W2115606997","https://openalex.org/W2115833542","https://openalex.org/W2136076469","https://openalex.org/W2161189583","https://openalex.org/W3149395070","https://openalex.org/W6680074756"],"related_works":["https://openalex.org/W2107525390","https://openalex.org/W2157191248","https://openalex.org/W2150046587","https://openalex.org/W2142405811","https://openalex.org/W2114980936","https://openalex.org/W2164493372","https://openalex.org/W1594445436","https://openalex.org/W2128920253","https://openalex.org/W2164349885","https://openalex.org/W1768820276"],"abstract_inverted_index":{"Advances":[0],"in":[1,70,126],"the":[2,101],"microfabrication":[3],"of":[4,100,123,131],"heterogeneous":[5,135],"microsystems":[6],"is":[7,60,62,85],"enabling":[8],"increasingly":[9],"complex":[10],"devices.":[11],"Modeling,":[12],"simulation":[13],"and":[14,30,56,66],"test":[15,23],"methodologies":[16],"are":[17,31,40],"unable":[18],"to":[19,28,42,47,121,128],"keep":[20],"pace.":[21],"Custom":[22],"solutions":[24,53],"require":[25],"significant":[26],"resources":[27],"implement":[29],"often":[32],"not":[33,36],"reusable.":[34],"Devices":[35],"performing":[37],"as":[38],"expected":[39],"difficult":[41],"diagnose.":[43],"Design-for-testability":[44],"techniques":[45],"familiar":[46],"silicon":[48],"microelectronics":[49],"designers":[50],"may":[51],"offer":[52],"for":[54,78,89],"validating":[55],"debugging":[57],"designs.":[58],"What":[59],"desirable":[61],"a":[63,71,113],"system":[64],"design":[65,77],"operational":[67],"algorithm":[68],"optimization":[69],"rapid":[72],"prototyping":[73],"environment":[74],"that":[75],"incorporates":[76],"testability":[79],"considerations.":[80],"The":[81],"university":[82],"research":[83,114],"setting":[84],"particularly":[86],"well":[87],"suited":[88],"developing":[90],"such":[91],"an":[92],"environment.":[93],"In":[94],"this":[95],"paper,":[96],"we":[97,117],"review":[98],"some":[99],"generic":[102],"tests":[103],"performed":[104],"on":[105],"microsystems-based":[106],"sensor":[107],"systems":[108],"by":[109],"graduate":[110],"students.":[111],"Taking":[112],"infrastructure":[115],"perspective,":[116],"then":[118],"propose":[119],"improvements":[120],"proof":[122],"concept":[124],"environments":[125],"universities":[127],"facilitate":[129],"addition":[130],"design-for-test":[132],"features":[133],"into":[134],"microsystems.":[136]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}