{"id":"https://openalex.org/W2125941023","doi":"https://doi.org/10.1109/mse.2003.1205283","title":"Need for undergraduate and graduate-level education in testing of microelectronic circuits and systems","display_name":"Need for undergraduate and graduate-level education in testing of microelectronic circuits and systems","publication_year":2004,"publication_date":"2004-03-22","ids":{"openalex":"https://openalex.org/W2125941023","doi":"https://doi.org/10.1109/mse.2003.1205283","mag":"2125941023"},"language":"en","primary_location":{"id":"doi:10.1109/mse.2003.1205283","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mse.2003.1205283","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings 2003 IEEE International Conference on Microelectronic Systems Education. MSE'03","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102967917","display_name":"Minsu Choi","orcid":"https://orcid.org/0000-0002-9104-0563"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Choi","raw_affiliation_strings":["Electrical and Computer Engineering, University of Missouri, Rolla, MO, USA","Dept. of Electr. & Comput. Eng, Missouri Univ., Rolla, MO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, University of Missouri, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng, Missouri Univ., Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072565131","display_name":"Hardy J. Pottinger","orcid":"https://orcid.org/0000-0001-8549-9354"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H.J. Pottinger","raw_affiliation_strings":["Electrical and Computer Engineering, University of Missouri, Rolla, MO, USA","Dept. of Electr. & Comput. Eng, Missouri Univ., Rolla, MO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, University of Missouri, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng, Missouri Univ., Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112970883","display_name":"N. Park","orcid":"https://orcid.org/0009-0000-0825-402X"},"institutions":[{"id":"https://openalex.org/I115475287","display_name":"Oklahoma State University","ror":"https://ror.org/01g9vbr38","country_code":"US","type":"education","lineage":["https://openalex.org/I115475287"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N. Park","raw_affiliation_strings":["Computer Science, Oklahoma State University, Stillwater, OK, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Science, Oklahoma State University, Stillwater, OK, USA","institution_ids":["https://openalex.org/I115475287"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108418214","display_name":"Y.-B. Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I12912129","display_name":"Northeastern University","ror":"https://ror.org/04t5xt781","country_code":"US","type":"education","lineage":["https://openalex.org/I12912129"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Y.-B. Kim","raw_affiliation_strings":["Electrical and Computer Engineering, Northeastern University, Boston, MA, USA","Electrical and Computer Engineering,, Northeastern University,, Boston,, MA,, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, Northeastern University, Boston, MA, USA","institution_ids":["https://openalex.org/I12912129"]},{"raw_affiliation_string":"Electrical and Computer Engineering,, Northeastern University,, Boston,, MA,, USA","institution_ids":["https://openalex.org/I12912129"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"121","last_page":"122"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11283","display_name":"Experimental Learning in Engineering","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microelectronics","display_name":"Microelectronics","score":0.9058754444122314},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6328948140144348},{"id":"https://openalex.org/keywords/graduate-students","display_name":"Graduate students","score":0.5348327159881592},{"id":"https://openalex.org/keywords/quality-assurance","display_name":"Quality assurance","score":0.5257164835929871},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.520345151424408},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.5038179755210876},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47678259015083313},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.47058171033859253},{"id":"https://openalex.org/keywords/post-graduate","display_name":"Post graduate","score":0.416763037443161},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.41341865062713623},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.40558645129203796},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.37540432810783386},{"id":"https://openalex.org/keywords/engineering-management","display_name":"Engineering management","score":0.3559629023075104},{"id":"https://openalex.org/keywords/medical-education","display_name":"Medical education","score":0.10496559739112854}],"concepts":[{"id":"https://openalex.org/C187937830","wikidata":"https://www.wikidata.org/wiki/Q175403","display_name":"Microelectronics","level":2,"score":0.9058754444122314},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6328948140144348},{"id":"https://openalex.org/C3020528894","wikidata":"https://www.wikidata.org/wiki/Q20820271","display_name":"Graduate students","level":2,"score":0.5348327159881592},{"id":"https://openalex.org/C106436119","wikidata":"https://www.wikidata.org/wiki/Q836575","display_name":"Quality assurance","level":3,"score":0.5257164835929871},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.520345151424408},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.5038179755210876},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47678259015083313},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.47058171033859253},{"id":"https://openalex.org/C3020750885","wikidata":"https://www.wikidata.org/wiki/Q141212","display_name":"Post graduate","level":2,"score":0.416763037443161},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.41341865062713623},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.40558645129203796},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.37540432810783386},{"id":"https://openalex.org/C110354214","wikidata":"https://www.wikidata.org/wiki/Q6314146","display_name":"Engineering management","level":1,"score":0.3559629023075104},{"id":"https://openalex.org/C509550671","wikidata":"https://www.wikidata.org/wiki/Q126945","display_name":"Medical education","level":1,"score":0.10496559739112854},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C2778618615","wikidata":"https://www.wikidata.org/wiki/Q4008393","display_name":"External quality assessment","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/mse.2003.1205283","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mse.2003.1205283","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings 2003 IEEE International Conference on Microelectronic Systems Education. MSE'03","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.123.9556","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.123.9556","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://csdl.computer.org/comp/proceedings/mse/2003/1973/00/19730121.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5699999928474426}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1878844118","https://openalex.org/W1906601541","https://openalex.org/W2126809811","https://openalex.org/W2151331896","https://openalex.org/W2162949881"],"related_works":["https://openalex.org/W2041294738","https://openalex.org/W2018464517","https://openalex.org/W294051742","https://openalex.org/W2616923172","https://openalex.org/W2993473248","https://openalex.org/W2125003958","https://openalex.org/W2392027857","https://openalex.org/W3029242567","https://openalex.org/W2382453404","https://openalex.org/W2374973901"],"abstract_inverted_index":{"As":[0],"deep-sub-micron":[1],"and":[2,11,27,48,66,74,77,85,88],"beyond":[3],"technology":[4],"emerges,":[5],"quality":[6],"assurance":[7],"of":[8,62],"microelectronic":[9,25,46],"circuits":[10,26,47,65],"systems":[12,28,49,67],"becomes":[13],"more":[14],"important":[15],"than":[16],"ever.":[17],"Consequentially,":[18],"(1)":[19],"a":[20],"strong":[21],"need":[22],"for":[23,83],"well-educated":[24],"test":[29,50,68],"engineers":[30],"is":[31,54],"desired":[32],"by":[33],"the":[34,63],"industry,":[35],"(2)":[36],"graduate-level":[37,86],"research":[38],"efforts":[39],"are":[40],"also":[41],"called":[42],"to":[43,55,59,78],"overcome":[44],"numerous":[45],"issues.":[51],"This":[52],"paper":[53],"address":[56],"issues":[57],"related":[58],"increasing":[60],"impact":[61],"electronic":[64],"field":[69],"on":[70],"education":[71],"in":[72],"electrical":[73,87],"computer":[75,89],"engineering":[76,90],"propose":[79],"suitable":[80],"educational":[81],"topics":[82],"undergraduate":[84],"courses.":[91]},"counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}