{"id":"https://openalex.org/W2760024198","doi":"https://doi.org/10.1109/ms.2017.3571576","title":"KLOVER: Automatic Test Generation for C and C++ Programs, Using Symbolic Execution","display_name":"KLOVER: Automatic Test Generation for C and C++ Programs, Using Symbolic Execution","publication_year":2017,"publication_date":"2017-01-01","ids":{"openalex":"https://openalex.org/W2760024198","doi":"https://doi.org/10.1109/ms.2017.3571576","mag":"2760024198"},"language":"en","primary_location":{"id":"doi:10.1109/ms.2017.3571576","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ms.2017.3571576","pdf_url":null,"source":{"id":"https://openalex.org/S6725529","display_name":"IEEE Software","issn_l":"0740-7459","issn":["0740-7459","1937-4194"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Software","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073098982","display_name":"Hiroaki Yoshida","orcid":"https://orcid.org/0000-0002-5370-7451"},"institutions":[{"id":"https://openalex.org/I4210094759","display_name":"Fujitsu (United States)","ror":"https://ror.org/0073whr05","country_code":"US","type":"company","lineage":["https://openalex.org/I2252096349","https://openalex.org/I4210094759"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Hiroaki Yoshida","raw_affiliation_strings":["Fujitsu Laboratories of America"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories of America","institution_ids":["https://openalex.org/I4210094759"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100662852","display_name":"Guodong Li","orcid":"https://orcid.org/0000-0002-1327-0005"},"institutions":[{"id":"https://openalex.org/I4210094759","display_name":"Fujitsu (United States)","ror":"https://ror.org/0073whr05","country_code":"US","type":"company","lineage":["https://openalex.org/I2252096349","https://openalex.org/I4210094759"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Guodong Li","raw_affiliation_strings":["Fujitsu Laboratories of America"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories of America","institution_ids":["https://openalex.org/I4210094759"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050048011","display_name":"Takuki Kamiya","orcid":null},"institutions":[{"id":"https://openalex.org/I4210094759","display_name":"Fujitsu (United States)","ror":"https://ror.org/0073whr05","country_code":"US","type":"company","lineage":["https://openalex.org/I2252096349","https://openalex.org/I4210094759"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Takuki Kamiya","raw_affiliation_strings":["Fujitsu Laboratories of America"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories of America","institution_ids":["https://openalex.org/I4210094759"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102001964","display_name":"Indradeep Ghosh","orcid":"https://orcid.org/0000-0003-3146-4003"},"institutions":[{"id":"https://openalex.org/I4210094759","display_name":"Fujitsu (United States)","ror":"https://ror.org/0073whr05","country_code":"US","type":"company","lineage":["https://openalex.org/I2252096349","https://openalex.org/I4210094759"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Indradeep Ghosh","raw_affiliation_strings":["Fujitsu Laboratories of America"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories of America","institution_ids":["https://openalex.org/I4210094759"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111449373","display_name":"Sreeranga P. Rajan","orcid":null},"institutions":[{"id":"https://openalex.org/I4210094759","display_name":"Fujitsu (United States)","ror":"https://ror.org/0073whr05","country_code":"US","type":"company","lineage":["https://openalex.org/I2252096349","https://openalex.org/I4210094759"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sreeranga Rajan","raw_affiliation_strings":["Fujitsu Laboratories of America"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories of America","institution_ids":["https://openalex.org/I4210094759"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103435667","display_name":"Susumu Tokumoto","orcid":null},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Susumu Tokumoto","raw_affiliation_strings":["Fujitsu Laboratories Limited"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Limited","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060738878","display_name":"Kazuki Munakata","orcid":"https://orcid.org/0009-0005-8286-448X"},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazuki Munakata","raw_affiliation_strings":["Fujitsu Laboratories Limited"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Limited","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056739446","display_name":"Tadahiro Uehara","orcid":null},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tadahiro Uehara","raw_affiliation_strings":["Fujitsu Laboratories Limited"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Limited","institution_ids":["https://openalex.org/I2252096349"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5073098982"],"corresponding_institution_ids":["https://openalex.org/I4210094759"],"apc_list":null,"apc_paid":null,"fwci":1.6959,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.85588972,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"34","issue":"5","first_page":"30","last_page":"37"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12810","display_name":"Real-time simulation and control systems","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/symbolic-execution","display_name":"Symbolic execution","score":0.735404908657074},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6833974123001099},{"id":"https://openalex.org/keywords/unit-testing","display_name":"Unit testing","score":0.6043368577957153},{"id":"https://openalex.org/keywords/test-management-approach","display_name":"Test Management Approach","score":0.571963906288147},{"id":"https://openalex.org/keywords/concolic-testing","display_name":"Concolic testing","score":0.5075300931930542},{"id":"https://openalex.org/keywords/software-testing","display_name":"Software testing","score":0.4781844913959503},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.4649810492992401},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.45098552107810974},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.44959700107574463},{"id":"https://openalex.org/keywords/test-harness","display_name":"Test harness","score":0.43427902460098267},{"id":"https://openalex.org/keywords/embedded-software","display_name":"Embedded software","score":0.43267756700515747},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.38003382086753845},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.3584265410900116},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.29159432649612427},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.22020390629768372}],"concepts":[{"id":"https://openalex.org/C2779639559","wikidata":"https://www.wikidata.org/wiki/Q7661178","display_name":"Symbolic execution","level":3,"score":0.735404908657074},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6833974123001099},{"id":"https://openalex.org/C148027188","wikidata":"https://www.wikidata.org/wiki/Q907375","display_name":"Unit testing","level":3,"score":0.6043368577957153},{"id":"https://openalex.org/C7435765","wikidata":"https://www.wikidata.org/wiki/Q7705776","display_name":"Test Management Approach","level":5,"score":0.571963906288147},{"id":"https://openalex.org/C11219265","wikidata":"https://www.wikidata.org/wiki/Q5158734","display_name":"Concolic testing","level":4,"score":0.5075300931930542},{"id":"https://openalex.org/C2984328558","wikidata":"https://www.wikidata.org/wiki/Q188522","display_name":"Software testing","level":3,"score":0.4781844913959503},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.4649810492992401},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.45098552107810974},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.44959700107574463},{"id":"https://openalex.org/C109852812","wikidata":"https://www.wikidata.org/wiki/Q2406355","display_name":"Test harness","level":5,"score":0.43427902460098267},{"id":"https://openalex.org/C154488198","wikidata":"https://www.wikidata.org/wiki/Q1335007","display_name":"Embedded software","level":3,"score":0.43267756700515747},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.38003382086753845},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.3584265410900116},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.29159432649612427},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.22020390629768372},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ms.2017.3571576","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ms.2017.3571576","pdf_url":null,"source":{"id":"https://openalex.org/S6725529","display_name":"IEEE Software","issn_l":"0740-7459","issn":["0740-7459","1937-4194"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Software","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5099999904632568,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W157156687","https://openalex.org/W208073541","https://openalex.org/W1549880792","https://openalex.org/W1590404294","https://openalex.org/W1710734607","https://openalex.org/W1738817570","https://openalex.org/W2061548807","https://openalex.org/W2092231696","https://openalex.org/W2101512909","https://openalex.org/W2129487583","https://openalex.org/W2133900335","https://openalex.org/W2137351629","https://openalex.org/W2153185479","https://openalex.org/W2296467253","https://openalex.org/W4240271815","https://openalex.org/W4246166885","https://openalex.org/W6606430823","https://openalex.org/W6635334600","https://openalex.org/W6637688222"],"related_works":["https://openalex.org/W1983849186","https://openalex.org/W34311366","https://openalex.org/W2553223552","https://openalex.org/W2155539595","https://openalex.org/W844671342","https://openalex.org/W1968929858","https://openalex.org/W2887544299","https://openalex.org/W59863474","https://openalex.org/W2157499124","https://openalex.org/W2125922439"],"abstract_inverted_index":{"Fujitsu":[0],"researchers":[1,31],"have":[2,32],"developed":[3],"a":[4,22],"methodology":[5,38],"to":[6,34],"automate":[7,35],"testing":[8],"of":[9],"industrial-strength":[10],"embedded":[11],"software":[12],"implemented":[13],"in":[14],"C":[15],"or":[16],"C++.":[17],"The":[18,37],"methodology's":[19],"core":[20],"is":[21],"program":[23],"analysis":[24],"technique":[25],"called":[26],"symbolic":[27],"execution,":[28],"which":[29],"the":[30],"customized":[33],"testing.":[36],"generates":[39],"unit-level":[40],"tests,":[41],"greatly":[42],"reducing":[43],"test":[44,52],"generation":[45],"time":[46],"and":[47],"cost":[48],"while":[49],"providing":[50],"excellent":[51],"coverage.":[53]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}