{"id":"https://openalex.org/W4412560764","doi":"https://doi.org/10.1109/mocast65744.2025.11083950","title":"Real-Time FPGA-Based Strain Monitoring System","display_name":"Real-Time FPGA-Based Strain Monitoring System","publication_year":2025,"publication_date":"2025-06-11","ids":{"openalex":"https://openalex.org/W4412560764","doi":"https://doi.org/10.1109/mocast65744.2025.11083950"},"language":"en","primary_location":{"id":"doi:10.1109/mocast65744.2025.11083950","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mocast65744.2025.11083950","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 14th International Conference on Modern Circuits and Systems Technologies (MOCAST)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5119047416","display_name":"Evangelia - Agni Alexopoulou","orcid":null},"institutions":[{"id":"https://openalex.org/I4210094138","display_name":"University of West Attica","ror":"https://ror.org/00r2r5k05","country_code":"GR","type":"education","lineage":["https://openalex.org/I4210094138"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Evangelia - Agni Alexopoulou","raw_affiliation_strings":["University of West Attica,Department of Electrical and Electronics Engineering,Athens,Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of West Attica,Department of Electrical and Electronics Engineering,Athens,Greece","institution_ids":["https://openalex.org/I4210094138"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075200425","display_name":"Ermioni D. Pasiou","orcid":"https://orcid.org/0000-0003-1580-3415"},"institutions":[{"id":"https://openalex.org/I174458059","display_name":"National Technical University of Athens","ror":"https://ror.org/03cx6bg69","country_code":"GR","type":"education","lineage":["https://openalex.org/I174458059"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Ermioni D. Pasiou","raw_affiliation_strings":["National Technical University of Athens,Department of Mechanics,Athens,Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Technical University of Athens,Department of Mechanics,Athens,Greece","institution_ids":["https://openalex.org/I174458059"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064500708","display_name":"Ilias Daradimos","orcid":"https://orcid.org/0000-0001-7778-2942"},"institutions":[{"id":"https://openalex.org/I4210094138","display_name":"University of West Attica","ror":"https://ror.org/00r2r5k05","country_code":"GR","type":"education","lineage":["https://openalex.org/I4210094138"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Ilias Daradimos","raw_affiliation_strings":["University of West Attica,Department of Electrical and Electronics Engineering,Athens,Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of West Attica,Department of Electrical and Electronics Engineering,Athens,Greece","institution_ids":["https://openalex.org/I4210094138"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016282675","display_name":"Ilias Stavrakas","orcid":"https://orcid.org/0000-0001-8484-8751"},"institutions":[{"id":"https://openalex.org/I4210094138","display_name":"University of West Attica","ror":"https://ror.org/00r2r5k05","country_code":"GR","type":"education","lineage":["https://openalex.org/I4210094138"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Ilias Stavrakas","raw_affiliation_strings":["University of West Attica,Department of Electrical and Electronics Engineering,Athens,Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of West Attica,Department of Electrical and Electronics Engineering,Athens,Greece","institution_ids":["https://openalex.org/I4210094138"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058522486","display_name":"E.D. Kyriakis-Bitzaros","orcid":"https://orcid.org/0000-0002-4497-6158"},"institutions":[{"id":"https://openalex.org/I4210094138","display_name":"University of West Attica","ror":"https://ror.org/00r2r5k05","country_code":"GR","type":"education","lineage":["https://openalex.org/I4210094138"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Efstathios D. Kyriakis-Bitzaros","raw_affiliation_strings":["University of West Attica,Department of Electrical and Electronics Engineering,Athens,Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of West Attica,Department of Electrical and Electronics Engineering,Athens,Greece","institution_ids":["https://openalex.org/I4210094138"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.22498658,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.7997999787330627,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.7997999787330627,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.7942000031471252,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13292","display_name":"Embedded Systems and FPGA Applications","score":0.7789999842643738,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7434811592102051},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6077829599380493},{"id":"https://openalex.org/keywords/strain","display_name":"Strain (injury)","score":0.5483284592628479},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4436451494693756},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3307582437992096}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7434811592102051},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6077829599380493},{"id":"https://openalex.org/C2778022156","wikidata":"https://www.wikidata.org/wiki/Q576145","display_name":"Strain (injury)","level":2,"score":0.5483284592628479},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4436451494693756},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3307582437992096},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mocast65744.2025.11083950","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mocast65744.2025.11083950","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 14th International Conference on Modern Circuits and Systems Technologies (MOCAST)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2115979091","https://openalex.org/W4313582011","https://openalex.org/W4407253488"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2111241003","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2096844293","https://openalex.org/W2363944576","https://openalex.org/W2351041855","https://openalex.org/W2570254841"],"abstract_inverted_index":{"An":[0],"FPGA-based":[1],"strain":[2,38],"monitoring":[3,14],"system":[4,21,58],"for":[5,25,65],"real-time":[6],"data":[7],"acquisition":[8],"and":[9,28,40,54,73],"visualization":[10,31],"in":[11,17],"structural":[12,67],"health":[13],"is":[15],"presented":[16],"this":[18],"paper.":[19],"The":[20,56],"supports":[22],"serial":[23],"communication":[24],"MATLAB-based":[26],"analysis":[27,68],"independent":[29],"onboard":[30],"by":[32],"integrating":[33],"the":[34,60],"MAX10":[35],"FPGA,":[36],"KYOWA":[37],"gauges,":[39],"a":[41,71],"custom":[42],"signal":[43],"conditioning":[44],"unit.":[45],"Experiments":[46],"with":[47],"different":[48],"loading":[49],"scenarios":[50],"showed":[51],"excellent":[52],"accuracy":[53],"dependability.":[55],"suggested":[57],"demonstrates":[59],"potential":[61],"of":[62],"FPGA":[63],"technology":[64],"realtime":[66],"while":[69],"providing":[70],"scalable":[72],"affordable":[74],"solution.":[75]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}