{"id":"https://openalex.org/W2621261390","doi":"https://doi.org/10.1109/mocast.2017.7937666","title":"Development of a modular 64-electrodes Electrical Impedance Tomography system","display_name":"Development of a modular 64-electrodes Electrical Impedance Tomography system","publication_year":2017,"publication_date":"2017-05-01","ids":{"openalex":"https://openalex.org/W2621261390","doi":"https://doi.org/10.1109/mocast.2017.7937666","mag":"2621261390"},"language":"en","primary_location":{"id":"doi:10.1109/mocast.2017.7937666","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mocast.2017.7937666","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 6th International Conference on Modern Circuits and Systems Technologies (MOCAST)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044099113","display_name":"Christos Dimas","orcid":"https://orcid.org/0000-0002-8641-2414"},"institutions":[{"id":"https://openalex.org/I174458059","display_name":"National Technical University of Athens","ror":"https://ror.org/03cx6bg69","country_code":"GR","type":"education","lineage":["https://openalex.org/I174458059"]}],"countries":["GR"],"is_corresponding":true,"raw_author_name":"Christos Dimas","raw_affiliation_strings":["Dept. of Electrical and Computer Engineering, National Technical University of Athens, Greece"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, National Technical University of Athens, Greece","institution_ids":["https://openalex.org/I174458059"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061649145","display_name":"Petros Tsampas","orcid":null},"institutions":[{"id":"https://openalex.org/I174458059","display_name":"National Technical University of Athens","ror":"https://ror.org/03cx6bg69","country_code":"GR","type":"education","lineage":["https://openalex.org/I174458059"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Petros Tsampas","raw_affiliation_strings":["Dept. of Electrical and Computer Engineering, National Technical University of Athens, Greece"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, National Technical University of Athens, Greece","institution_ids":["https://openalex.org/I174458059"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082421783","display_name":"\u039d\u03b9\u03ba\u03cc\u03bb\u03b1\u03bf\u03c2 \u039a. \u039f\u03c5\u03b6\u03bf\u03cd\u03bd\u03bf\u03b3\u03bb\u03bf\u03c5","orcid":null},"institutions":[{"id":"https://openalex.org/I174458059","display_name":"National Technical University of Athens","ror":"https://ror.org/03cx6bg69","country_code":"GR","type":"education","lineage":["https://openalex.org/I174458059"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Nikolaos Ouzounoglou","raw_affiliation_strings":["Dept. of Electrical and Computer Engineering, National Technical University of Athens, Greece"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, National Technical University of Athens, Greece","institution_ids":["https://openalex.org/I174458059"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013213336","display_name":"Paul P. Sotiriadis","orcid":"https://orcid.org/0000-0001-6030-4645"},"institutions":[{"id":"https://openalex.org/I174458059","display_name":"National Technical University of Athens","ror":"https://ror.org/03cx6bg69","country_code":"GR","type":"education","lineage":["https://openalex.org/I174458059"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Paul P. Sotiriadis","raw_affiliation_strings":["Dept. of Electrical and Computer Engineering, National Technical University of Athens, Greece"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, National Technical University of Athens, Greece","institution_ids":["https://openalex.org/I174458059"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5044099113"],"corresponding_institution_ids":["https://openalex.org/I174458059"],"apc_list":null,"apc_paid":null,"fwci":1.0034,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.77675811,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.9024028778076172},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.7510331273078918},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6782227158546448},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.6699551343917847},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.5829061269760132},{"id":"https://openalex.org/keywords/electrical-resistivity-tomography","display_name":"Electrical resistivity tomography","score":0.5170955657958984},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4365948438644409},{"id":"https://openalex.org/keywords/electrical-resistivity-and-conductivity","display_name":"Electrical resistivity and conductivity","score":0.40628260374069214},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.39681434631347656},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36830365657806396},{"id":"https://openalex.org/keywords/biomedical-engineering","display_name":"Biomedical engineering","score":0.3335452079772949},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.32775846123695374},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.30351585149765015},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.261430561542511},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.21054542064666748},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.15657645463943481}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.9024028778076172},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.7510331273078918},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6782227158546448},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.6699551343917847},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.5829061269760132},{"id":"https://openalex.org/C60591178","wikidata":"https://www.wikidata.org/wiki/Q488986","display_name":"Electrical resistivity tomography","level":3,"score":0.5170955657958984},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4365948438644409},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.40628260374069214},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.39681434631347656},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36830365657806396},{"id":"https://openalex.org/C136229726","wikidata":"https://www.wikidata.org/wiki/Q327092","display_name":"Biomedical engineering","level":1,"score":0.3335452079772949},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.32775846123695374},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30351585149765015},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.261430561542511},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21054542064666748},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.15657645463943481},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mocast.2017.7937666","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mocast.2017.7937666","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 6th International Conference on Modern Circuits and Systems Technologies (MOCAST)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6000000238418579,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2115201359","https://openalex.org/W2138248326","https://openalex.org/W2308864781","https://openalex.org/W3143167226","https://openalex.org/W6698179669"],"related_works":["https://openalex.org/W2359871536","https://openalex.org/W1992681652","https://openalex.org/W2991320615","https://openalex.org/W4239884404","https://openalex.org/W4253199194","https://openalex.org/W2215273690","https://openalex.org/W2553917976","https://openalex.org/W2526896022","https://openalex.org/W2375739220","https://openalex.org/W759704566"],"abstract_inverted_index":{"The":[0,21],"design":[1],"and":[2,24,33],"implementation":[3],"of":[4],"an":[5],"Electrical":[6],"Impedance":[7],"Tomography":[8],"system":[9],"with":[10],"64":[11],"electrodes":[12],"placed":[13],"on":[14],"a":[15],"2-D":[16],"circular":[17],"pattern":[18],"is":[19],"presented.":[20],"system's":[22],"architecture":[23],"the":[25,29,35,45],"algorithm":[26],"for":[27],"solving":[28],"reverse":[30],"E/M":[31],"problem":[32],"deriving":[34],"conductivity":[36],"distribution":[37],"are":[38,42],"discussed.":[39],"Experimental":[40],"measurements":[41],"presented":[43],"confirming":[44],"proper":[46],"operation.":[47]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}