{"id":"https://openalex.org/W4401361780","doi":"https://doi.org/10.1109/mn60932.2024.10615657","title":"Measurement-Based Signal Integrity Analysis of Coupled Thin-Film Microstrip Lines","display_name":"Measurement-Based Signal Integrity Analysis of Coupled Thin-Film Microstrip Lines","publication_year":2024,"publication_date":"2024-07-02","ids":{"openalex":"https://openalex.org/W4401361780","doi":"https://doi.org/10.1109/mn60932.2024.10615657"},"language":"en","primary_location":{"id":"doi:10.1109/mn60932.2024.10615657","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mn60932.2024.10615657","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Symposium on Measurements & Networking (M&N)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067575879","display_name":"Khitem Lahbacha","orcid":null},"institutions":[{"id":"https://openalex.org/I186995768","display_name":"Universit\u00e0 degli studi di Cassino e del Lazio Meridionale","ror":"https://ror.org/04nxkaq16","country_code":"IT","type":"education","lineage":["https://openalex.org/I186995768"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Khitem Lahbacha","raw_affiliation_strings":["University of Cassino and Southern Lazio,Dept. of Electrical and Information Eng.,Cassino,FR,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Cassino and Southern Lazio,Dept. of Electrical and Information Eng.,Cassino,FR,Italy","institution_ids":["https://openalex.org/I186995768"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032351867","display_name":"Giulia Di Capua","orcid":"https://orcid.org/0000-0002-3786-6751"},"institutions":[{"id":"https://openalex.org/I186995768","display_name":"Universit\u00e0 degli studi di Cassino e del Lazio Meridionale","ror":"https://ror.org/04nxkaq16","country_code":"IT","type":"education","lineage":["https://openalex.org/I186995768"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Giulia Di Capua","raw_affiliation_strings":["University of Cassino and Southern Lazio,Dept. of Electrical and Information Eng.,Cassino,FR,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Cassino and Southern Lazio,Dept. of Electrical and Information Eng.,Cassino,FR,Italy","institution_ids":["https://openalex.org/I186995768"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020852460","display_name":"Gianfranco Miele","orcid":"https://orcid.org/0000-0001-7571-6327"},"institutions":[{"id":"https://openalex.org/I186995768","display_name":"Universit\u00e0 degli studi di Cassino e del Lazio Meridionale","ror":"https://ror.org/04nxkaq16","country_code":"IT","type":"education","lineage":["https://openalex.org/I186995768"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Gianfranco Miele","raw_affiliation_strings":["University of Cassino and Southern Lazio,Dept. of Electrical and Information Eng.,Cassino,FR,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Cassino and Southern Lazio,Dept. of Electrical and Information Eng.,Cassino,FR,Italy","institution_ids":["https://openalex.org/I186995768"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013630291","display_name":"Antonio Maffucci","orcid":"https://orcid.org/0000-0002-4992-9449"},"institutions":[{"id":"https://openalex.org/I186995768","display_name":"Universit\u00e0 degli studi di Cassino e del Lazio Meridionale","ror":"https://ror.org/04nxkaq16","country_code":"IT","type":"education","lineage":["https://openalex.org/I186995768"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Antonio Maffucci","raw_affiliation_strings":["University of Cassino and Southern Lazio,Dept. of Electrical and Information Eng.,Cassino,FR,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Cassino and Southern Lazio,Dept. of Electrical and Information Eng.,Cassino,FR,Italy","institution_ids":["https://openalex.org/I186995768"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061803233","display_name":"Andrea Gaetano Chiariello","orcid":"https://orcid.org/0000-0003-0506-8955"},"institutions":[{"id":"https://openalex.org/I197809005","display_name":"University of Campania \"Luigi Vanvitelli\"","ror":"https://ror.org/02kqnpp86","country_code":"IT","type":"education","lineage":["https://openalex.org/I197809005"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Andrea Gaetano Chiariello","raw_affiliation_strings":["University of Campania “Luigi Vanvitelli”,Department of Engineering,Aversa,CE,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Campania “Luigi Vanvitelli”,Department of Engineering,Aversa,CE,Italy","institution_ids":["https://openalex.org/I197809005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105840454","display_name":"Thi Dao Pham","orcid":"https://orcid.org/0000-0003-2857-7584"},"institutions":[{"id":"https://openalex.org/I4210107682","display_name":"Laboratoire National de M\u00e9trologie et d'Essais","ror":"https://ror.org/01ph39d13","country_code":"FR","type":"other","lineage":["https://openalex.org/I4210107682"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Thi Dao Pham","raw_affiliation_strings":["Laboratoire National de Métrologie et d'Essais,Trappes Cedex,France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratoire National de Métrologie et d'Essais,Trappes Cedex,France","institution_ids":["https://openalex.org/I4210107682"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086867595","display_name":"Djamel Allal","orcid":"https://orcid.org/0000-0001-6907-2414"},"institutions":[{"id":"https://openalex.org/I4210107682","display_name":"Laboratoire National de M\u00e9trologie et d'Essais","ror":"https://ror.org/01ph39d13","country_code":"FR","type":"other","lineage":["https://openalex.org/I4210107682"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Djamel Allal","raw_affiliation_strings":["Laboratoire National de Métrologie et d'Essais,Trappes Cedex,France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratoire National de Métrologie et d'Essais,Trappes Cedex,France","institution_ids":["https://openalex.org/I4210107682"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1856,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.48772873,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.7884935140609741},{"id":"https://openalex.org/keywords/microstrip","display_name":"Microstrip","score":0.7527177929878235},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5453060269355774},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4545932412147522},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.43440553545951843},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3762027621269226},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37155473232269287},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.31596824526786804},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.2685733437538147},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.193782776594162}],"concepts":[{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.7884935140609741},{"id":"https://openalex.org/C123657345","wikidata":"https://www.wikidata.org/wiki/Q639055","display_name":"Microstrip","level":2,"score":0.7527177929878235},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5453060269355774},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4545932412147522},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.43440553545951843},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3762027621269226},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37155473232269287},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.31596824526786804},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.2685733437538147},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.193782776594162},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mn60932.2024.10615657","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mn60932.2024.10615657","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Symposium on Measurements & Networking (M&N)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G6912468912","display_name":null,"funder_award_id":"20IND03","funder_id":"https://openalex.org/F4320320300","funder_display_name":"European Commission"}],"funders":[{"id":"https://openalex.org/F4320320300","display_name":"European Commission","ror":"https://ror.org/00k4n6c32"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W2084292567","https://openalex.org/W2151283819","https://openalex.org/W2163781698","https://openalex.org/W2292768833","https://openalex.org/W2510199870","https://openalex.org/W2904688644","https://openalex.org/W3137582059","https://openalex.org/W4297099592","https://openalex.org/W4322704116","https://openalex.org/W4380302417","https://openalex.org/W4380368076"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2289987414","https://openalex.org/W2386114299","https://openalex.org/W2766876417","https://openalex.org/W2372709865","https://openalex.org/W2017275349","https://openalex.org/W2378013451","https://openalex.org/W4388979933","https://openalex.org/W268271086","https://openalex.org/W2152497386"],"abstract_inverted_index":{"This":[0,52],"paper":[1],"explores":[2],"the":[3,47,61,70,85,105,142,147],"application":[4],"of":[5,49,63,87,122],"Thin-Film":[6],"Micro-Strip":[7],"Lines":[8],"(TFMSLs)":[9],"in":[10,66],"high-frequency":[11],"technologies,":[12],"specifically":[13],"within":[14],"fifth-generation":[15],"communication":[16],"systems":[17],"(5G),":[18],"due":[19],"to":[20,38,83,96,127],"their":[21],"compatibility":[22],"with":[23,32,93],"low-resistivity":[24],"substrates.":[25],"Various":[26],"test":[27],"structures":[28,35,135],"comprising":[29],"coupled":[30],"TFMSLs":[31],"distinct":[33],"geometric":[34],"are":[36,102,136],"examined":[37],"address":[39],"critical":[40],"scenarios":[41],"such":[42,67],"as":[43,109],"matching,":[44],"mismatching,":[45],"and":[46,59],"presence":[48],"neighboring":[50],"traces.":[51],"investigation":[53],"focuses":[54],"on":[55,90],"signal":[56],"integrity":[57],"analysis":[58,80],"evaluates":[60],"effectiveness":[62],"TFMSL":[64,134],"technology":[65],"systems.":[68],"Using":[69],"commercial":[71],"simulator":[72],"Keysight":[73],"Advanced":[74],"Design":[75,130],"System":[76],"(ADS),":[77],"a":[78,119],"frequency":[79],"is":[81],"conducted":[82],"assess":[84],"impact":[86],"these":[88],"geometries":[89],"mixed-mode":[91],"S-parameters,":[92],"comparisons":[94],"drawn":[95],"measurement":[97],"results.":[98],"Subsequently,":[99],"time-domain":[100],"analyses":[101],"performed":[103],"using":[104],"measured":[106],"single-ended":[107],"S-parameters":[108],"input,":[110],"evaluating":[111],"high-speed":[112],"digital":[113],"links":[114],"through":[115],"eye-diagram":[116],"metrics":[117],"across":[118],"wide":[120],"range":[121],"data-rate":[123],"values":[124],"(from":[125],"1":[126],"100":[128],"Gbit/s).":[129],"maps":[131],"for":[132,141],"different":[133],"generated,":[137],"providing":[138],"optimized":[139],"trade-offs":[140],"operating":[143],"conditions":[144],"required":[145],"by":[146],"link":[148],"(driver-line-receiver).":[149]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}