{"id":"https://openalex.org/W2526227069","doi":"https://doi.org/10.1109/mmar.2016.7575323","title":"Computer vision system for defects detection in PET preform","display_name":"Computer vision system for defects detection in PET preform","publication_year":2016,"publication_date":"2016-08-01","ids":{"openalex":"https://openalex.org/W2526227069","doi":"https://doi.org/10.1109/mmar.2016.7575323","mag":"2526227069"},"language":"en","primary_location":{"id":"doi:10.1109/mmar.2016.7575323","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mmar.2016.7575323","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 21st International Conference on Methods and Models in Automation and Robotics (MMAR)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023684675","display_name":"Andrius Laucka","orcid":null},"institutions":[{"id":"https://openalex.org/I172574986","display_name":"Kaunas University of Technology","ror":"https://ror.org/01me6gb93","country_code":"LT","type":"education","lineage":["https://openalex.org/I172574986"]}],"countries":["LT"],"is_corresponding":true,"raw_author_name":"Andrius Laucka","raw_affiliation_strings":["Department of Electronics Engineering, Kaunas University of Technology, Lithuania"],"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, Kaunas University of Technology, Lithuania","institution_ids":["https://openalex.org/I172574986"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067794024","display_name":"Darius Andriukaitis","orcid":"https://orcid.org/0000-0002-9862-8917"},"institutions":[{"id":"https://openalex.org/I172574986","display_name":"Kaunas University of Technology","ror":"https://ror.org/01me6gb93","country_code":"LT","type":"education","lineage":["https://openalex.org/I172574986"]}],"countries":["LT"],"is_corresponding":false,"raw_author_name":"Darius Andriukaitis","raw_affiliation_strings":["Department of Electronics Engineering, Kaunas University of Technology, Lithuania"],"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, Kaunas University of Technology, Lithuania","institution_ids":["https://openalex.org/I172574986"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030754031","display_name":"Algimantas Valinevi\u010dius","orcid":"https://orcid.org/0000-0002-8604-9678"},"institutions":[{"id":"https://openalex.org/I172574986","display_name":"Kaunas University of Technology","ror":"https://ror.org/01me6gb93","country_code":"LT","type":"education","lineage":["https://openalex.org/I172574986"]}],"countries":["LT"],"is_corresponding":false,"raw_author_name":"Algimantas Valinevicius","raw_affiliation_strings":["Department of Electronics Engineering, Kaunas University of Technology, Lithuania"],"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, Kaunas University of Technology, Lithuania","institution_ids":["https://openalex.org/I172574986"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043284084","display_name":"Dangirutis Navikas","orcid":"https://orcid.org/0000-0001-7071-7566"},"institutions":[{"id":"https://openalex.org/I172574986","display_name":"Kaunas University of Technology","ror":"https://ror.org/01me6gb93","country_code":"LT","type":"education","lineage":["https://openalex.org/I172574986"]}],"countries":["LT"],"is_corresponding":false,"raw_author_name":"Dangirutis Navikas","raw_affiliation_strings":["Department of Electronics Engineering, Kaunas University of Technology, Lithuania"],"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, Kaunas University of Technology, Lithuania","institution_ids":["https://openalex.org/I172574986"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5023684675"],"corresponding_institution_ids":["https://openalex.org/I172574986"],"apc_list":null,"apc_paid":null,"fwci":0.8493,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.79367172,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1280","last_page":"1285"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9876999855041504,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.98089998960495,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.6054860949516296},{"id":"https://openalex.org/keywords/productivity","display_name":"Productivity","score":0.6043804287910461},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.5858566164970398},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5505740642547607},{"id":"https://openalex.org/keywords/machine-vision","display_name":"Machine vision","score":0.5426751375198364},{"id":"https://openalex.org/keywords/throughput","display_name":"Throughput","score":0.5240590572357178},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.5195930004119873},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.49863624572753906},{"id":"https://openalex.org/keywords/automated-x-ray-inspection","display_name":"Automated X-ray inspection","score":0.4148516058921814},{"id":"https://openalex.org/keywords/population","display_name":"Population","score":0.41338974237442017},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.35807377099990845},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.3445427417755127},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.32214081287384033},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30769941210746765},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.21558448672294617},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11506488919258118}],"concepts":[{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.6054860949516296},{"id":"https://openalex.org/C204983608","wikidata":"https://www.wikidata.org/wiki/Q2111958","display_name":"Productivity","level":2,"score":0.6043804287910461},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.5858566164970398},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5505740642547607},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.5426751375198364},{"id":"https://openalex.org/C157764524","wikidata":"https://www.wikidata.org/wiki/Q1383412","display_name":"Throughput","level":3,"score":0.5240590572357178},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.5195930004119873},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.49863624572753906},{"id":"https://openalex.org/C146920229","wikidata":"https://www.wikidata.org/wiki/Q2278114","display_name":"Automated X-ray inspection","level":4,"score":0.4148516058921814},{"id":"https://openalex.org/C2908647359","wikidata":"https://www.wikidata.org/wiki/Q2625603","display_name":"Population","level":2,"score":0.41338974237442017},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.35807377099990845},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.3445427417755127},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.32214081287384033},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30769941210746765},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.21558448672294617},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11506488919258118},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C149923435","wikidata":"https://www.wikidata.org/wiki/Q37732","display_name":"Demography","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C144024400","wikidata":"https://www.wikidata.org/wiki/Q21201","display_name":"Sociology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mmar.2016.7575323","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mmar.2016.7575323","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 21st International Conference on Methods and Models in Automation and Robotics (MMAR)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1997070645","https://openalex.org/W2049886234","https://openalex.org/W2142457676","https://openalex.org/W2142558395","https://openalex.org/W2157447450","https://openalex.org/W2334526157","https://openalex.org/W2336877181","https://openalex.org/W2470279466","https://openalex.org/W2527159233","https://openalex.org/W4285719527","https://openalex.org/W6720266240","https://openalex.org/W6727951529"],"related_works":["https://openalex.org/W2387803438","https://openalex.org/W3150879280","https://openalex.org/W2091038213","https://openalex.org/W1987385378","https://openalex.org/W2566979001","https://openalex.org/W2132335896","https://openalex.org/W3127880688","https://openalex.org/W2908806637","https://openalex.org/W2794901953","https://openalex.org/W1981824758"],"abstract_inverted_index":{"The":[0,27,50,100,111,128],"computer":[1,88],"vision":[2,89],"systems":[3,46],"are":[4,71],"mainly":[5],"devoted":[6],"for":[7,40,47,68,93,114],"production":[8],"monitoring":[9],"in":[10,73,108],"quality":[11,80],"inspection":[12,81],"systems.":[13],"It":[14],"is":[15,53,130,139],"the":[16,41,56,94,103,120,126],"fastest":[17],"growing":[18],"and":[19,33,77,122],"most":[20],"popular":[21],"non-invasive":[22],"product":[23],"defects":[24],"detection":[25],"method.":[26],"productivity":[28],"of":[29,43,55,96,102,125],"electronic":[30],"components":[31],"growth":[32],"their":[34],"prices":[35],"decline":[36],"creates":[37],"favorable":[38],"conditions":[39],"development":[42],"image":[44,115],"processing":[45,116],"industrial":[48],"production.":[49],"food":[51,69],"industry":[52,70],"one":[54],"main":[57],"industries.":[58],"Production":[59],"volumes":[60],"grow":[61],"along":[62],"with":[63],"human":[64],"population":[65],"growth.":[66],"Containers":[67],"made":[72],"very":[74],"large":[75],"quantities":[76],"demand":[78],"on":[79],"system":[82,90,105,112,129],"plays":[83],"important":[84],"role.":[85],"An":[86],"automated":[87],"was":[91,106],"developed":[92],"control":[95],"PET":[97],"preparation":[98],"quality.":[99],"implementation":[101],"designed":[104,131],"presented":[107],"this":[109],"article.":[110],"used":[113],"algorithms":[117],"to":[118,133],"inspect":[119],"lateral":[121],"upper":[123],"parts":[124],"workpiece.":[127],"according":[132],"its":[134],"operating":[135],"parameters.":[136],"Reached":[137],"throughput":[138],"10,000":[140],"workpieces":[141],"per":[142],"hour.":[143]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}