{"id":"https://openalex.org/W2763781266","doi":"https://doi.org/10.1109/mm.2017.3711648","title":"NanoBridge-Based FPGA in High-Temperature Environments","display_name":"NanoBridge-Based FPGA in High-Temperature Environments","publication_year":2017,"publication_date":"2017-09-01","ids":{"openalex":"https://openalex.org/W2763781266","doi":"https://doi.org/10.1109/mm.2017.3711648","mag":"2763781266"},"language":"en","primary_location":{"id":"doi:10.1109/mm.2017.3711648","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mm.2017.3711648","pdf_url":null,"source":{"id":"https://openalex.org/S59697426","display_name":"IEEE Micro","issn_l":"0272-1732","issn":["0272-1732","1937-4143"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Micro","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112239308","display_name":"Makoto Miyamura","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Makoto Miyamura","raw_affiliation_strings":["NEC"],"affiliations":[{"raw_affiliation_string":"NEC","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109333465","display_name":"Toshitsugu Sakamoto","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Toshitsugu Sakamoto","raw_affiliation_strings":["NEC"],"affiliations":[{"raw_affiliation_string":"NEC","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005131373","display_name":"Xu Bai","orcid":"https://orcid.org/0000-0002-7478-8705"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Xu Bai","raw_affiliation_strings":["NEC"],"affiliations":[{"raw_affiliation_string":"NEC","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005055352","display_name":"Y. Tsuji","orcid":"https://orcid.org/0000-0003-4814-2887"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yukihide Tsuji","raw_affiliation_strings":["NEC"],"affiliations":[{"raw_affiliation_string":"NEC","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108467315","display_name":"A. Morioka","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ayuka Morioka","raw_affiliation_strings":["NEC"],"affiliations":[{"raw_affiliation_string":"NEC","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075000622","display_name":"Ryusuke Nebashi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ryusuke Nebashi","raw_affiliation_strings":["NEC"],"affiliations":[{"raw_affiliation_string":"NEC","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066870244","display_name":"Munehiro Tada","orcid":"https://orcid.org/0000-0002-1015-2222"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Munehiro Tada","raw_affiliation_strings":["NEC"],"affiliations":[{"raw_affiliation_string":"NEC","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061572817","display_name":"Naoki Banno","orcid":"https://orcid.org/0000-0003-0052-2434"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Naoki Banno","raw_affiliation_strings":["NEC"],"affiliations":[{"raw_affiliation_string":"NEC","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100846459","display_name":"Koichiro Okamoto","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Koichiro Okamoto","raw_affiliation_strings":["NEC"],"affiliations":[{"raw_affiliation_string":"NEC","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112420175","display_name":"Noriyuki Iguchi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Noriyuki Iguchi","raw_affiliation_strings":["NEC"],"affiliations":[{"raw_affiliation_string":"NEC","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045709379","display_name":"H. Hada","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hiromitsu Hada","raw_affiliation_strings":["NEC"],"affiliations":[{"raw_affiliation_string":"NEC","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111921651","display_name":"Tadahiko Sugibayashi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tadahiko Sugibayashi","raw_affiliation_strings":["NEC"],"affiliations":[{"raw_affiliation_string":"NEC","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007811697","display_name":"Yuya Nagamatsu","orcid":"https://orcid.org/0000-0003-3359-4397"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuya Nagamatsu","raw_affiliation_strings":["University of Tokyo"],"affiliations":[{"raw_affiliation_string":"University of Tokyo","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008014604","display_name":"Soichi Ookubo","orcid":null},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Soichi Ookubo","raw_affiliation_strings":["University of Tokyo"],"affiliations":[{"raw_affiliation_string":"University of Tokyo","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100919783","display_name":"Takuma Shirai","orcid":null},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takuma Shirai","raw_affiliation_strings":["University of Tokyo"],"affiliations":[{"raw_affiliation_string":"University of Tokyo","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091784384","display_name":"Fumihito Sugai","orcid":null},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Fumihito Sugai","raw_affiliation_strings":["University of Tokyo"],"affiliations":[{"raw_affiliation_string":"University of Tokyo","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5047218430","display_name":"Masayuki Inaba","orcid":"https://orcid.org/0000-0003-1273-1567"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masayuki Inaba","raw_affiliation_strings":["University of Tokyo"],"affiliations":[{"raw_affiliation_string":"University of Tokyo","institution_ids":["https://openalex.org/I74801974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":17,"corresponding_author_ids":["https://openalex.org/A5112239308"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.43,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.65828208,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"37","issue":"5","first_page":"32","last_page":"42"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.8958269953727722},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6766853928565979},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5254220962524414},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5021839141845703},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.47250640392303467},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3906644880771637},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.35995984077453613},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3119555711746216},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.20240622758865356},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1646498143672943}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.8958269953727722},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6766853928565979},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5254220962524414},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5021839141845703},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.47250640392303467},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3906644880771637},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.35995984077453613},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3119555711746216},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.20240622758865356},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1646498143672943}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mm.2017.3711648","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mm.2017.3711648","pdf_url":null,"source":{"id":"https://openalex.org/S59697426","display_name":"IEEE Micro","issn_l":"0272-1732","issn":["0272-1732","1937-4143"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Micro","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8299999833106995}],"awards":[],"funders":[{"id":"https://openalex.org/F4320311508","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1523051745","https://openalex.org/W1526699078","https://openalex.org/W1548006532","https://openalex.org/W1964774207","https://openalex.org/W1970809418","https://openalex.org/W1977773606","https://openalex.org/W2029043133","https://openalex.org/W2040786740","https://openalex.org/W2041333130","https://openalex.org/W2047294577","https://openalex.org/W2055780959","https://openalex.org/W2076613578","https://openalex.org/W2085673779","https://openalex.org/W2086798670","https://openalex.org/W2118430498","https://openalex.org/W2138815251","https://openalex.org/W2154431495","https://openalex.org/W2343180950","https://openalex.org/W2414490626","https://openalex.org/W2525933112","https://openalex.org/W3143894789","https://openalex.org/W6631403632","https://openalex.org/W6683192216"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2102690581","https://openalex.org/W2164363068","https://openalex.org/W2776397918","https://openalex.org/W2347731430","https://openalex.org/W4232863881","https://openalex.org/W1630150145","https://openalex.org/W2047797144","https://openalex.org/W2354337233","https://openalex.org/W1491404489"],"abstract_inverted_index":{"The":[0],"authors":[1,71],"demonstrate":[2],"a":[3,11,27,44,54,61,87,110],"field-programmable":[4],"gate":[5],"array":[6],"(FPGA)":[7],"based":[8],"on":[9],"NanoBridge,":[10,15],"novel":[12],"resistive-change":[13],"switch.":[14],"which":[16],"is":[17,58],"integrated":[18],"in":[19,64,79,86,107,126],"the":[20,65,70,73,97,127],"back":[21],"end":[22],"of":[23,35,49,96,113],"line":[24],"(BEOL),":[25],"features":[26],"high":[28,122],"on/off":[29],"conductance":[30],"ratio,":[31],"weak":[32],"temperature":[33],"dependence":[34],"its":[36,92],"resistance,":[37],"nonvolatility,":[38],"endurance":[39],"against":[40],"soft":[41],"errors,":[42],"and":[43,53,90,120],"small":[45,105],"footprint.":[46],"In":[47,67],"place":[48],"static":[50],"RAM":[51],"(SRAM)":[52],"pass":[55],"transistor,":[56],"NanoBridge":[57],"utilized":[59],"as":[60],"configuration":[62],"switch":[63],"FPGA.":[66,99],"this":[68],"article,":[69],"evaluate":[72],"NanoBridge-based":[74],"FPGA":[75],"(NB-FPGA)":[76],"for":[77,124],"applications":[78],"harsh":[80],"environments.":[81],"Specifically,":[82],"they":[83],"implemented":[84],"NB-FPGA":[85,103],"humanoid":[88],"robot":[89],"compared":[91],"performance":[93,108],"with":[94],"that":[95,102],"conventional":[98],"Results":[100],"showed":[101],"exhibits":[104],"variation":[106],"over":[109],"wide":[111],"range":[112],"temperature,":[114],"from":[115],"-55":[116],"to":[117],"150":[118],"\u00b0C,":[119],"has":[121],"immunity":[123],"fluctuations":[125],"power":[128],"supply":[129],"voltage.":[130]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}