{"id":"https://openalex.org/W1975933605","doi":"https://doi.org/10.1109/mm.2014.96","title":"Embedded SRAM and Cortex-M0 Core Using a 60-nm Crystalline Oxide Semiconductor","display_name":"Embedded SRAM and Cortex-M0 Core Using a 60-nm Crystalline Oxide Semiconductor","publication_year":2014,"publication_date":"2014-11-01","ids":{"openalex":"https://openalex.org/W1975933605","doi":"https://doi.org/10.1109/mm.2014.96","mag":"1975933605"},"language":"en","primary_location":{"id":"doi:10.1109/mm.2014.96","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mm.2014.96","pdf_url":null,"source":{"id":"https://openalex.org/S59697426","display_name":"IEEE Micro","issn_l":"0272-1732","issn":["0272-1732","1937-4143"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Micro","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042609226","display_name":"Hikaru Tamura","orcid":"https://orcid.org/0000-0002-6769-5287"},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Hikaru Tamura","raw_affiliation_strings":["Semiconductor Energy Laboratory"],"affiliations":[{"raw_affiliation_string":"Semiconductor Energy Laboratory","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075064776","display_name":"Kiyoshi Kat\u014d","orcid":"https://orcid.org/0000-0002-1272-5629"},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kiyoshi Kato","raw_affiliation_strings":["Semiconductor Energy Laboratory"],"affiliations":[{"raw_affiliation_string":"Semiconductor Energy Laboratory","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101945638","display_name":"Takahiko Ishizu","orcid":"https://orcid.org/0000-0001-6667-126X"},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takahiko Ishizu","raw_affiliation_strings":["Semiconductor Energy Laboratory"],"affiliations":[{"raw_affiliation_string":"Semiconductor Energy Laboratory","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080169821","display_name":"Wataru Uesugi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Wataru Uesugi","raw_affiliation_strings":["Semiconductor Energy Laboratory"],"affiliations":[{"raw_affiliation_string":"Semiconductor Energy Laboratory","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088556457","display_name":"Atsuo Isobe","orcid":null},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Atsuo Isobe","raw_affiliation_strings":["Semiconductor Energy Laboratory"],"affiliations":[{"raw_affiliation_string":"Semiconductor Energy Laboratory","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016362012","display_name":"Naoaki Tsutsui","orcid":null},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Naoaki Tsutsui","raw_affiliation_strings":["Semiconductor Energy Laboratory"],"affiliations":[{"raw_affiliation_string":"Semiconductor Energy Laboratory","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086400005","display_name":"Yasutaka Suzuki","orcid":"https://orcid.org/0000-0001-7275-7123"},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yasutaka Suzuki","raw_affiliation_strings":["Semiconductor Energy Laboratory"],"affiliations":[{"raw_affiliation_string":"Semiconductor Energy Laboratory","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050139254","display_name":"Yutaka Okazaki","orcid":"https://orcid.org/0000-0003-2261-5914"},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yutaka Okazaki","raw_affiliation_strings":["Semiconductor Energy Laboratory"],"affiliations":[{"raw_affiliation_string":"Semiconductor Energy Laboratory","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109061596","display_name":"Yukio Maehashi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yukio Maehashi","raw_affiliation_strings":["Semiconductor Energy Laboratory"],"affiliations":[{"raw_affiliation_string":"Semiconductor Energy Laboratory","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101958237","display_name":"Jun Koyama","orcid":"https://orcid.org/0000-0002-0644-4433"},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Jun Koyama","raw_affiliation_strings":["Semiconductor Energy Laboratory"],"affiliations":[{"raw_affiliation_string":"Semiconductor Energy Laboratory","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103542969","display_name":"Yoshitaka Yamamoto","orcid":null},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshitaka Yamamoto","raw_affiliation_strings":["Semiconductor Energy Laboratory"],"affiliations":[{"raw_affiliation_string":"Semiconductor Energy Laboratory","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077676320","display_name":"Shunpei Yamazaki","orcid":"https://orcid.org/0000-0001-6055-8987"},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shunpei Yamazaki","raw_affiliation_strings":["Semiconductor Energy Laboratory"],"affiliations":[{"raw_affiliation_string":"Semiconductor Energy Laboratory","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027837299","display_name":"Masahiro Fujita","orcid":"https://orcid.org/0000-0002-6516-4175"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masahiro Fujita","raw_affiliation_strings":["University of Tokyo","university of Tokyo;"],"affiliations":[{"raw_affiliation_string":"University of Tokyo","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"university of Tokyo;","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083536121","display_name":"James Myers","orcid":"https://orcid.org/0000-0002-3866-1969"},"institutions":[{"id":"https://openalex.org/I4210156213","display_name":"American Rock Mechanics Association","ror":"https://ror.org/05vfrxy92","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210156213"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James Myers","raw_affiliation_strings":["ARM"],"affiliations":[{"raw_affiliation_string":"ARM","institution_ids":["https://openalex.org/I4210156213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013569973","display_name":"Pekka Korpinen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210106018","display_name":"Nokia (Netherlands)","ror":"https://ror.org/01resg468","country_code":"NL","type":"company","lineage":["https://openalex.org/I2738502077","https://openalex.org/I4210106018"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Pekka Korpinen","raw_affiliation_strings":["Nokia","Nokia,#TAB#"],"affiliations":[{"raw_affiliation_string":"Nokia","institution_ids":["https://openalex.org/I4210106018"]},{"raw_affiliation_string":"Nokia,#TAB#","institution_ids":["https://openalex.org/I4210106018"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":15,"corresponding_author_ids":["https://openalex.org/A5042609226"],"corresponding_institution_ids":["https://openalex.org/I4210125918"],"apc_list":null,"apc_paid":null,"fwci":1.884,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.86896376,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"34","issue":"6","first_page":"42","last_page":"53"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/standby-power","display_name":"Standby power","score":0.7491655349731445},{"id":"https://openalex.org/keywords/power-gating","display_name":"Power gating","score":0.7346675395965576},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6253980994224548},{"id":"https://openalex.org/keywords/backup","display_name":"Backup","score":0.625191867351532},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6210757493972778},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6151492595672607},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5321273803710938},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.4551938772201538},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4240031838417053},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.41839659214019775},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.40546345710754395},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.39904892444610596},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.39028745889663696},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3111134469509125},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2840704917907715},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.13486385345458984},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1096334159374237}],"concepts":[{"id":"https://openalex.org/C7140552","wikidata":"https://www.wikidata.org/wiki/Q1366402","display_name":"Standby power","level":3,"score":0.7491655349731445},{"id":"https://openalex.org/C2780700455","wikidata":"https://www.wikidata.org/wiki/Q7236515","display_name":"Power gating","level":4,"score":0.7346675395965576},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6253980994224548},{"id":"https://openalex.org/C2780945871","wikidata":"https://www.wikidata.org/wiki/Q194274","display_name":"Backup","level":2,"score":0.625191867351532},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6210757493972778},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6151492595672607},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5321273803710938},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.4551938772201538},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4240031838417053},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.41839659214019775},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.40546345710754395},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.39904892444610596},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.39028745889663696},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3111134469509125},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2840704917907715},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.13486385345458984},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1096334159374237},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mm.2014.96","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mm.2014.96","pdf_url":null,"source":{"id":"https://openalex.org/S59697426","display_name":"IEEE Micro","issn_l":"0272-1732","issn":["0272-1732","1937-4143"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Micro","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8600000143051147,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1582019256","https://openalex.org/W2004070853","https://openalex.org/W2012753984","https://openalex.org/W2024335183","https://openalex.org/W2026287159","https://openalex.org/W2051108935","https://openalex.org/W2102570074","https://openalex.org/W2126100502","https://openalex.org/W2154689711","https://openalex.org/W2159540315","https://openalex.org/W2492420504","https://openalex.org/W2824255706","https://openalex.org/W4255460541","https://openalex.org/W4255871134"],"related_works":["https://openalex.org/W2075172982","https://openalex.org/W3013845316","https://openalex.org/W2773448237","https://openalex.org/W2188598220","https://openalex.org/W2783501501","https://openalex.org/W104239181","https://openalex.org/W3092470009","https://openalex.org/W2282162811","https://openalex.org/W2083171629","https://openalex.org/W3140192626"],"abstract_inverted_index":{"Using":[0],"data":[1,49,79,83],"retention":[2,50],"circuits":[3,12,109],"that":[4,35],"include":[5],"crystalline":[6,41,116],"oxide":[7,42,117],"semiconductor":[8,43,118],"transistors":[9,119],"as":[10],"backup":[11,74,80,108],"for":[13],"power":[14,38,94],"gating,":[15],"a":[16,47,61,69],"processor":[17,87],"system":[18,88],"can":[19,45,76,89,97],"reduce":[20],"standby":[21,37,100],"leakage":[22],"current":[23,59],"significantly.":[24],"This":[25],"is":[26,65],"effective":[27],"in":[28],"the":[29,86,107,115],"Internet":[30],"of":[31],"Things":[32],"(IoT)":[33],"applications":[34],"require":[36],"reduction.":[39],"The":[40,73],"transistor":[44,63],"constitute":[46],"nonvolatile":[48],"circuit":[51,75],"easily":[52],"because":[53,114],"it":[54],"exhibits":[55],"significantly":[56],"lower":[57],"off-state":[58],"than":[60],"silicon":[62,123],"and":[64,81,96],"highly":[66],"compatible":[67],"with":[68],"CMOS":[70],"logic":[71],"circuit.":[72],"achieve":[77,98],"2-clock-cycle":[78],"4-clock-cycle":[82],"restore;":[84],"thus,":[85],"efficiently":[90],"perform":[91],"temporally":[92],"fine-grained":[93],"gating":[95],"longer":[99],"times.":[101],"Furthermore,":[102],"area":[103],"overheads":[104],"due":[105],"to":[106],"are":[110,120],"kept":[111],"very":[112],"small":[113],"stacked":[121],"on":[122],"transistors.":[124]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}