{"id":"https://openalex.org/W2007364715","doi":"https://doi.org/10.1109/mm.2002.1044301","title":"A hierarchical test methodology for systems on chip","display_name":"A hierarchical test methodology for systems on chip","publication_year":2002,"publication_date":"2002-09-01","ids":{"openalex":"https://openalex.org/W2007364715","doi":"https://doi.org/10.1109/mm.2002.1044301","mag":"2007364715"},"language":"en","primary_location":{"id":"doi:10.1109/mm.2002.1044301","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mm.2002.1044301","pdf_url":null,"source":{"id":"https://openalex.org/S59697426","display_name":"IEEE Micro","issn_l":"0272-1732","issn":["0272-1732","1937-4143"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Micro","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5106787159","display_name":"Jin-Fu Li","orcid":null},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Jin-Fu Li","raw_affiliation_strings":["National Central University, Taiwan"],"affiliations":[{"raw_affiliation_string":"National Central University, Taiwan","institution_ids":["https://openalex.org/I22265921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014702810","display_name":"Hsin-Jung Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Hsin-Jung Huang","raw_affiliation_strings":["National Tsing Hua University, Taiwan"],"affiliations":[{"raw_affiliation_string":"National Tsing Hua University, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044460361","display_name":"Jeng-Bin Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jeng-Bin Chen","raw_affiliation_strings":["National Tsing Hua University, Taiwan"],"affiliations":[{"raw_affiliation_string":"National Tsing Hua University, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111923580","display_name":"Chih-Pin Su","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chih-Pin Su","raw_affiliation_strings":["National Tsing Hua University, Taiwan"],"affiliations":[{"raw_affiliation_string":"National Tsing Hua University, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075548524","display_name":"Cheng\u2010Wen Wu","orcid":"https://orcid.org/0000-0001-8614-7908"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Cheng-Wen Wu","raw_affiliation_strings":["National Tsing Hua University, Taiwan"],"affiliations":[{"raw_affiliation_string":"National Tsing Hua University, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101454635","display_name":"Chuang Cheng","orcid":"https://orcid.org/0009-0004-3793-420X"},"institutions":[{"id":"https://openalex.org/I4210139108","display_name":"Faraday Technology (United States)","ror":"https://ror.org/03a654521","country_code":"US","type":"company","lineage":["https://openalex.org/I4210112000","https://openalex.org/I4210139108"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chuang Cheng","raw_affiliation_strings":["Faraday Technology Corporation, USA"],"affiliations":[{"raw_affiliation_string":"Faraday Technology Corporation, USA","institution_ids":["https://openalex.org/I4210139108"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002358125","display_name":"Shao-I Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210139108","display_name":"Faraday Technology (United States)","ror":"https://ror.org/03a654521","country_code":"US","type":"company","lineage":["https://openalex.org/I4210112000","https://openalex.org/I4210139108"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shao-I Chen","raw_affiliation_strings":["Faraday Technology Corporation, USA"],"affiliations":[{"raw_affiliation_string":"Faraday Technology Corporation, USA","institution_ids":["https://openalex.org/I4210139108"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111972639","display_name":"Chi-Yi Hwang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210139108","display_name":"Faraday Technology (United States)","ror":"https://ror.org/03a654521","country_code":"US","type":"company","lineage":["https://openalex.org/I4210112000","https://openalex.org/I4210139108"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chi-Yi Hwang","raw_affiliation_strings":["Faraday Technology Corporation, USA"],"affiliations":[{"raw_affiliation_string":"Faraday Technology Corporation, USA","institution_ids":["https://openalex.org/I4210139108"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5107920933","display_name":"Hsiao-Ping Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I4210139108","display_name":"Faraday Technology (United States)","ror":"https://ror.org/03a654521","country_code":"US","type":"company","lineage":["https://openalex.org/I4210112000","https://openalex.org/I4210139108"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hsiao-Ping Lin","raw_affiliation_strings":["Faraday Technology Corporation, USA"],"affiliations":[{"raw_affiliation_string":"Faraday Technology Corporation, USA","institution_ids":["https://openalex.org/I4210139108"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5106787159"],"corresponding_institution_ids":["https://openalex.org/I22265921"],"apc_list":null,"apc_paid":null,"fwci":0.2065,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.4383609,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"22","issue":"5","first_page":"69","last_page":"81"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9934999942779541,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8049997091293335},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.6882413625717163},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6703585982322693},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6530407071113586},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.6024097204208374},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.536037802696228},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.5236289501190186},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.4838027358055115},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4689972400665283},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.42094871401786804},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.36787259578704834},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.324236661195755},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1786249876022339}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8049997091293335},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.6882413625717163},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6703585982322693},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6530407071113586},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.6024097204208374},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.536037802696228},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.5236289501190186},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.4838027358055115},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4689972400665283},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.42094871401786804},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.36787259578704834},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.324236661195755},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1786249876022339},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mm.2002.1044301","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mm.2002.1044301","pdf_url":null,"source":{"id":"https://openalex.org/S59697426","display_name":"IEEE Micro","issn_l":"0272-1732","issn":["0272-1732","1937-4143"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Micro","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4099999964237213,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1509465067","https://openalex.org/W1614172680","https://openalex.org/W1904830904","https://openalex.org/W2104548962","https://openalex.org/W2127085582","https://openalex.org/W2155288938","https://openalex.org/W2161365607","https://openalex.org/W2169584262","https://openalex.org/W4239296208"],"related_works":["https://openalex.org/W51919102","https://openalex.org/W2502691491","https://openalex.org/W1527836777","https://openalex.org/W2099176192","https://openalex.org/W2115579119","https://openalex.org/W2108140302","https://openalex.org/W2017236304","https://openalex.org/W3142211975","https://openalex.org/W2000140246","https://openalex.org/W1879443270"],"abstract_inverted_index":{"We":[0,21],"present":[1],"a":[2,8,38],"hierarchical":[3,25],"test":[4,26,32],"methodology":[5],"for":[6,49],"testing":[7],"SOC":[9],"with":[10],"heterogeneous":[11],"cores,":[12],"including":[13],"the":[14],"1149.1-wrapped,":[15],"P1500-wrapped,":[16],"and":[17,45,57,60],"BIST":[18,40,50],"memory":[19,39],"cores.":[20],"propose":[22],"an":[23],"1149.1-based":[24],"manager":[27],"that":[28],"also":[29],"provides":[30],"P1500":[31],"control":[33],"signals.":[34],"This":[35],"scheme":[36],"includes":[37],"interface,":[41],"providing":[42],"both":[43],"serial":[44],"parallel":[46],"access":[47],"ports":[48],"circuits.":[51],"Our":[52],"approach":[53],"offers":[54],"low":[55],"area":[56],"pin":[58],"overhead,":[59],"high":[61],"flexibility.":[62]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}