{"id":"https://openalex.org/W3199544972","doi":"https://doi.org/10.1109/mlcad52597.2021.9531156","title":"A Circuit Attention Network-Based Actor-Critic Learning Approach to Robust Analog Transistor Sizing","display_name":"A Circuit Attention Network-Based Actor-Critic Learning Approach to Robust Analog Transistor Sizing","publication_year":2021,"publication_date":"2021-08-30","ids":{"openalex":"https://openalex.org/W3199544972","doi":"https://doi.org/10.1109/mlcad52597.2021.9531156","mag":"3199544972"},"language":"en","primary_location":{"id":"doi:10.1109/mlcad52597.2021.9531156","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mlcad52597.2021.9531156","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 ACM/IEEE 3rd Workshop on Machine Learning for CAD (MLCAD)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101587350","display_name":"Yaguang Li","orcid":"https://orcid.org/0000-0001-9425-034X"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Yaguang Li","raw_affiliation_strings":["Texas A&M University,Dept. of Electrical and Computer Engineering"],"affiliations":[{"raw_affiliation_string":"Texas A&M University,Dept. of Electrical and Computer Engineering","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018086253","display_name":"Yishuang Lin","orcid":"https://orcid.org/0000-0003-1555-4623"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yishuang Lin","raw_affiliation_strings":["Texas A&M University,Dept. of Computer Science and Engineering"],"affiliations":[{"raw_affiliation_string":"Texas A&M University,Dept. of Computer Science and Engineering","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063857392","display_name":"Meghna Madhusudan","orcid":"https://orcid.org/0000-0001-5101-2421"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Meghna Madhusudan","raw_affiliation_strings":["University of Minnesota,Dept. of Electrical and Computer Engineering"],"affiliations":[{"raw_affiliation_string":"University of Minnesota,Dept. of Electrical and Computer Engineering","institution_ids":["https://openalex.org/I130238516"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100732195","display_name":"Arvind Sharma","orcid":"https://orcid.org/0000-0003-1188-4924"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arvind Sharma","raw_affiliation_strings":["University of Minnesota,Dept. of Electrical and Computer Engineering"],"affiliations":[{"raw_affiliation_string":"University of Minnesota,Dept. of Electrical and Computer Engineering","institution_ids":["https://openalex.org/I130238516"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068714995","display_name":"Sachin S. Sapatnekar","orcid":"https://orcid.org/0000-0002-5353-2364"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sachin Sapatnekar","raw_affiliation_strings":["University of Minnesota,Dept. of Electrical and Computer Engineering"],"affiliations":[{"raw_affiliation_string":"University of Minnesota,Dept. of Electrical and Computer Engineering","institution_ids":["https://openalex.org/I130238516"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059037025","display_name":"Ramesh Harjani","orcid":"https://orcid.org/0000-0001-7691-566X"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ramesh Harjani","raw_affiliation_strings":["University of Minnesota,Dept. of Electrical and Computer Engineering"],"affiliations":[{"raw_affiliation_string":"University of Minnesota,Dept. of Electrical and Computer Engineering","institution_ids":["https://openalex.org/I130238516"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103246390","display_name":"Jiang Hu","orcid":"https://orcid.org/0000-0003-1157-7799"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jiang Hu","raw_affiliation_strings":["Texas A&M University,Dept. of Electrical and Computer Engineering"],"affiliations":[{"raw_affiliation_string":"Texas A&M University,Dept. of Electrical and Computer Engineering","institution_ids":["https://openalex.org/I91045830"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5101587350"],"corresponding_institution_ids":["https://openalex.org/I91045830"],"apc_list":null,"apc_paid":null,"fwci":1.4038,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.81298744,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7346656322479248},{"id":"https://openalex.org/keywords/sizing","display_name":"Sizing","score":0.638950765132904},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6156618595123291},{"id":"https://openalex.org/keywords/reinforcement-learning","display_name":"Reinforcement learning","score":0.61126708984375},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4489917457103729},{"id":"https://openalex.org/keywords/graph","display_name":"Graph","score":0.4137260317802429},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.37689632177352905},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3492218852043152},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.34507855772972107},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3422011137008667},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.16817039251327515},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15706953406333923},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.13455840945243835},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1334816813468933}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7346656322479248},{"id":"https://openalex.org/C2777767291","wikidata":"https://www.wikidata.org/wiki/Q1080291","display_name":"Sizing","level":2,"score":0.638950765132904},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6156618595123291},{"id":"https://openalex.org/C97541855","wikidata":"https://www.wikidata.org/wiki/Q830687","display_name":"Reinforcement learning","level":2,"score":0.61126708984375},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4489917457103729},{"id":"https://openalex.org/C132525143","wikidata":"https://www.wikidata.org/wiki/Q141488","display_name":"Graph","level":2,"score":0.4137260317802429},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.37689632177352905},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3492218852043152},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.34507855772972107},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3422011137008667},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.16817039251327515},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15706953406333923},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.13455840945243835},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1334816813468933},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mlcad52597.2021.9531156","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mlcad52597.2021.9531156","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 ACM/IEEE 3rd Workshop on Machine Learning for CAD (MLCAD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1964239621","https://openalex.org/W2007278173","https://openalex.org/W2100882222","https://openalex.org/W2116235542","https://openalex.org/W2161359911","https://openalex.org/W2166359146","https://openalex.org/W2173248099","https://openalex.org/W2519887557","https://openalex.org/W2769791151","https://openalex.org/W2811124557","https://openalex.org/W2951659295","https://openalex.org/W2963858333","https://openalex.org/W2963864421","https://openalex.org/W2964015378","https://openalex.org/W3036532492","https://openalex.org/W3089997764","https://openalex.org/W3091933103","https://openalex.org/W3092098889","https://openalex.org/W3092618035","https://openalex.org/W3113090643","https://openalex.org/W4236195134","https://openalex.org/W4238577093","https://openalex.org/W4244194021","https://openalex.org/W4297733535","https://openalex.org/W6684921986","https://openalex.org/W6726873649","https://openalex.org/W6746261282","https://openalex.org/W6753331806","https://openalex.org/W6783745106","https://openalex.org/W6787026827"],"related_works":["https://openalex.org/W3074294383","https://openalex.org/W3097136472","https://openalex.org/W4206669594","https://openalex.org/W2961085424","https://openalex.org/W2959276766","https://openalex.org/W4295941380","https://openalex.org/W260766989","https://openalex.org/W3139193008","https://openalex.org/W4306674287","https://openalex.org/W4319083788"],"abstract_inverted_index":{"Analog":[0],"integrated":[1],"circuit":[2,30,33,47],"design":[3],"is":[4,10,37,132],"highly":[5],"complex":[6],"and":[7,75,100],"its":[8],"automation":[9],"a":[11,16,24,58,120],"long-standing":[12],"challenge.":[13],"We":[14],"present":[15],"reinforcement":[17,79],"learning":[18,52,80],"approach":[19,55,87,131],"to":[20,39,71,109,114],"automatic":[21],"transistor":[22,44],"sizing,":[23],"key":[25],"step":[26],"in":[27,49,129,137],"determining":[28],"analog":[29],"performance.":[31,69,98],"A":[32],"attention":[34],"network":[35],"technique":[36,60,108],"developed":[38],"capture":[40],"the":[41,85,126],"impact":[42],"of":[43],"sizing":[45],"on":[46],"performance":[48],"an":[50],"actor-critic":[51],"framework.":[53],"Our":[54],"also":[56],"includes":[57],"stochastic":[59,107],"for":[61],"addressing":[62],"layout":[63,92],"effect,":[64],"another":[65],"important":[66],"factor":[67],"affecting":[68],"Compared":[70],"Bayesian":[72],"optimization":[73],"(BO)":[74],"Graph":[76],"Convolutional":[77],"Network-based":[78],"(GCN-RL),":[81],"two":[82],"state-of-the-art":[83],"methods,":[84],"proposed":[86],"significantly":[88],"improves":[89],"robustness":[90],"against":[91],"uncertainty":[93],"while":[94],"achieving":[95],"better":[96],"post-layout":[97],"BO":[99],"GCN-RL":[101],"can":[102],"be":[103],"enhanced":[104],"with":[105],"our":[106,130],"reach":[110],"solution":[111],"quality":[112],"similar":[113],"ours,":[115],"but":[116],"still":[117],"suffer":[118],"from":[119],"much":[121],"slower":[122],"convergence":[123],"rate.":[124],"Moreover,":[125],"knowledge":[127],"transfer":[128],"more":[133],"effective":[134],"than":[135],"that":[136],"GCN-RL.":[138]},"counts_by_year":[{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}