{"id":"https://openalex.org/W2485932851","doi":"https://doi.org/10.1109/mixdes.2016.7529702","title":"FOSS as an efficient tool for extraction of MOSFET compact model parameters","display_name":"FOSS as an efficient tool for extraction of MOSFET compact model parameters","publication_year":2016,"publication_date":"2016-06-01","ids":{"openalex":"https://openalex.org/W2485932851","doi":"https://doi.org/10.1109/mixdes.2016.7529702","mag":"2485932851"},"language":"en","primary_location":{"id":"doi:10.1109/mixdes.2016.7529702","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mixdes.2016.7529702","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 MIXDES - 23rd International Conference Mixed Design of Integrated Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088307829","display_name":"Daniel Tomaszewski","orcid":"https://orcid.org/0000-0001-5158-2520"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Daniel Tomaszewski","raw_affiliation_strings":["Division of Silicon Microsystem and Nanostructure Technology, Instytut Technologii Elektronowej, Warsaw, Poland"],"affiliations":[{"raw_affiliation_string":"Division of Silicon Microsystem and Nanostructure Technology, Instytut Technologii Elektronowej, Warsaw, Poland","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056828147","display_name":"Grzegorz G\u0142uszko","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Grzegorz Gluszko","raw_affiliation_strings":["Division of Silicon Microsystem and Nanostructure Technology, Instytut Technologii Elektronowej, Warsaw, Poland"],"affiliations":[{"raw_affiliation_string":"Division of Silicon Microsystem and Nanostructure Technology, Instytut Technologii Elektronowej, Warsaw, Poland","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004419729","display_name":"Mike Brinson","orcid":null},"institutions":[{"id":"https://openalex.org/I177537411","display_name":"Bauman Moscow State Technical University","ror":"https://ror.org/00pb8h375","country_code":"RU","type":"education","lineage":["https://openalex.org/I177537411"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Mike Brinson","raw_affiliation_strings":["Department of Electronic Engineering, Bauman Moscow State Technical University, Russia"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Bauman Moscow State Technical University, Russia","institution_ids":["https://openalex.org/I177537411"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028332207","display_name":"Vadim Kuznetsov","orcid":"https://orcid.org/0000-0002-5738-555X"},"institutions":[{"id":"https://openalex.org/I126193024","display_name":"London Metropolitan University","ror":"https://ror.org/00ae33288","country_code":"GB","type":"education","lineage":["https://openalex.org/I126193024"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Vadim Kuznetsov","raw_affiliation_strings":["Centre for Communications Technology, London Metropolitan University, UK"],"affiliations":[{"raw_affiliation_string":"Centre for Communications Technology, London Metropolitan University, UK","institution_ids":["https://openalex.org/I126193024"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000639997","display_name":"Wladek Grabinski","orcid":"https://orcid.org/0000-0003-3445-9496"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Wladek Grabinski","raw_affiliation_strings":["GMC Research, Switzerland"],"affiliations":[{"raw_affiliation_string":"GMC Research, Switzerland","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5088307829"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.05852161,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"5","issue":null,"first_page":"68","last_page":"73"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/experimental-data","display_name":"Experimental data","score":0.5592811107635498},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.557520866394043},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.5429491996765137},{"id":"https://openalex.org/keywords/extraction","display_name":"Extraction (chemistry)","score":0.5068088173866272},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5052781701087952},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.37185388803482056},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.31546199321746826},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19021934270858765},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.16854262351989746},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15558373928070068},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.147197425365448},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10781720280647278},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08785304427146912}],"concepts":[{"id":"https://openalex.org/C55037315","wikidata":"https://www.wikidata.org/wiki/Q5421151","display_name":"Experimental data","level":2,"score":0.5592811107635498},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.557520866394043},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5429491996765137},{"id":"https://openalex.org/C4725764","wikidata":"https://www.wikidata.org/wiki/Q844704","display_name":"Extraction (chemistry)","level":2,"score":0.5068088173866272},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5052781701087952},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.37185388803482056},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.31546199321746826},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19021934270858765},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16854262351989746},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15558373928070068},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.147197425365448},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10781720280647278},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08785304427146912},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/mixdes.2016.7529702","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mixdes.2016.7529702","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 MIXDES - 23rd International Conference Mixed Design of Integrated Circuits and Systems","raw_type":"proceedings-article"},{"id":"pmh:oai:repository.londonmet.ac.uk:3930","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4306400140","display_name":"London Met Repository (London Metropolitan University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I126193024","host_organization_name":"London Metropolitan University","host_organization_lineage":["https://openalex.org/I126193024"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W49379994","https://openalex.org/W1159819035","https://openalex.org/W1528549966","https://openalex.org/W1587386427","https://openalex.org/W1876480814","https://openalex.org/W2034276882","https://openalex.org/W2079826846","https://openalex.org/W2101538208","https://openalex.org/W2106941563","https://openalex.org/W2120013788","https://openalex.org/W2122056942","https://openalex.org/W2129149437","https://openalex.org/W2131947274","https://openalex.org/W2135650105","https://openalex.org/W2138007544","https://openalex.org/W2155184842","https://openalex.org/W2157385897","https://openalex.org/W2166999360","https://openalex.org/W2336576266","https://openalex.org/W6602032958","https://openalex.org/W6678278617"],"related_works":["https://openalex.org/W2965295431","https://openalex.org/W2254931227","https://openalex.org/W4319440797","https://openalex.org/W2225406648","https://openalex.org/W2378757965","https://openalex.org/W2386785728","https://openalex.org/W2078152308","https://openalex.org/W4224903346","https://openalex.org/W1928888444","https://openalex.org/W1526208995"],"abstract_inverted_index":{"A":[0],"GNU":[1],"Octave":[2],"-":[3],"based":[4],"application":[5,94],"for":[6,31],"device-level":[7],"compact":[8],"model":[9,49],"evaluation":[10],"and":[11,51,58,63,84,97],"parameter":[12,56],"extraction":[13],"has":[14],"been":[15],"developed.":[16],"The":[17],"applications":[18],"main":[19],"features":[20],"are":[21,74,95],"as":[22],"follows:":[23],"experimental":[24,62],"I-V":[25,42,67],"data":[26,30,68],"importing,":[27],"generating":[28],"input":[29],"different":[32,71],"circuit":[33],"simulation":[34,38],"programs,":[35],"running":[36],"the":[37,45,59,93],"program":[39],"to":[40,54],"calculate":[41],"characteristics":[43],"of":[44,61,92],"specified":[46],"models,":[47],"calculating":[48],"misfit":[50],"its":[52],"sensitivity":[53],"selected":[55],"variation,":[57],"comparison":[60],"simulated":[64],"characteristics.":[65],"Measured":[66],"stored":[69],"by":[70],"measurement":[72],"systems":[73],"accepted.":[75],"Circuit":[76],"simulations":[77],"may":[78],"be":[79],"done":[80],"with":[81],"Ngspice,":[82],"Qucs":[83],"LTSpiceIV":[85],"<sup":[86],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[87],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">\u00a9</sup>":[88],".":[89],"Selected":[90],"aspects":[91],"presented":[96],"discussed.":[98]},"counts_by_year":[],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}