{"id":"https://openalex.org/W1601257689","doi":"https://doi.org/10.1109/mixdes.2015.7208587","title":"Simulation and characterization of ion irradiated 4H-SiC JBS diode","display_name":"Simulation and characterization of ion irradiated 4H-SiC JBS diode","publication_year":2015,"publication_date":"2015-06-01","ids":{"openalex":"https://openalex.org/W1601257689","doi":"https://doi.org/10.1109/mixdes.2015.7208587","mag":"1601257689"},"language":"en","primary_location":{"id":"doi:10.1109/mixdes.2015.7208587","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mixdes.2015.7208587","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 22nd International Conference Mixed Design of Integrated Circuits &amp; Systems (MIXDES)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059703815","display_name":"Rupendra Kumar Sharma","orcid":"https://orcid.org/0000-0002-1058-7592"},"institutions":[{"id":"https://openalex.org/I44504214","display_name":"Czech Technical University in Prague","ror":"https://ror.org/03kqpb082","country_code":"CZ","type":"education","lineage":["https://openalex.org/I44504214"]}],"countries":["CZ"],"is_corresponding":true,"raw_author_name":"Rupendra Kumar Sharma","raw_affiliation_strings":["Department of Microelectronics, Czech Technical University in Prague, Prague, Czech Republic","Department of Microelectronics, Czech Technical University in Prague, Prague - 16627, Czech Republic"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Czech Technical University in Prague, Prague, Czech Republic","institution_ids":["https://openalex.org/I44504214"]},{"raw_affiliation_string":"Department of Microelectronics, Czech Technical University in Prague, Prague - 16627, Czech Republic","institution_ids":["https://openalex.org/I44504214"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078560084","display_name":"P. Hazdra","orcid":"https://orcid.org/0000-0002-6265-3408"},"institutions":[{"id":"https://openalex.org/I44504214","display_name":"Czech Technical University in Prague","ror":"https://ror.org/03kqpb082","country_code":"CZ","type":"education","lineage":["https://openalex.org/I44504214"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Pavel Hazdra","raw_affiliation_strings":["Department of Microelectronics, Czech Technical University in Prague, Prague, Czech Republic","Department of Microelectronics, Czech Technical University in Prague, Prague - 16627, Czech Republic"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Czech Technical University in Prague, Prague, Czech Republic","institution_ids":["https://openalex.org/I44504214"]},{"raw_affiliation_string":"Department of Microelectronics, Czech Technical University in Prague, Prague - 16627, Czech Republic","institution_ids":["https://openalex.org/I44504214"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060427016","display_name":"Stanislav Popelka","orcid":"https://orcid.org/0000-0001-6889-3317"},"institutions":[{"id":"https://openalex.org/I44504214","display_name":"Czech Technical University in Prague","ror":"https://ror.org/03kqpb082","country_code":"CZ","type":"education","lineage":["https://openalex.org/I44504214"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Stanislav Popelka","raw_affiliation_strings":["Department of Microelectronics, Czech Technical University in Prague, Prague, Czech Republic","Department of Microelectronics, Czech Technical University in Prague, Prague - 16627, Czech Republic"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Czech Technical University in Prague, Prague, Czech Republic","institution_ids":["https://openalex.org/I44504214"]},{"raw_affiliation_string":"Department of Microelectronics, Czech Technical University in Prague, Prague - 16627, Czech Republic","institution_ids":["https://openalex.org/I44504214"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5059703815"],"corresponding_institution_ids":["https://openalex.org/I44504214"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.03414564,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"567","last_page":"570"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7626045942306519},{"id":"https://openalex.org/keywords/schottky-diode","display_name":"Schottky diode","score":0.7615562677383423},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.7382457852363586},{"id":"https://openalex.org/keywords/irradiation","display_name":"Irradiation","score":0.6994385123252869},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6453768014907837},{"id":"https://openalex.org/keywords/ion","display_name":"Ion","score":0.5529605150222778},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.48411428928375244},{"id":"https://openalex.org/keywords/wide-bandgap-semiconductor","display_name":"Wide-bandgap semiconductor","score":0.47740617394447327},{"id":"https://openalex.org/keywords/schottky-barrier","display_name":"Schottky barrier","score":0.4744637608528137},{"id":"https://openalex.org/keywords/proton","display_name":"Proton","score":0.46299582719802856},{"id":"https://openalex.org/keywords/silicon-carbide","display_name":"Silicon carbide","score":0.4593212604522705},{"id":"https://openalex.org/keywords/band-gap","display_name":"Band gap","score":0.43039563298225403},{"id":"https://openalex.org/keywords/carbon-fibers","display_name":"Carbon fibers","score":0.4148368239402771},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.14120623469352722},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.10209962725639343},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08005735278129578},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.058314234018325806},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.05676144361495972}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7626045942306519},{"id":"https://openalex.org/C205200001","wikidata":"https://www.wikidata.org/wiki/Q176066","display_name":"Schottky diode","level":3,"score":0.7615562677383423},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.7382457852363586},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.6994385123252869},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6453768014907837},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.5529605150222778},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.48411428928375244},{"id":"https://openalex.org/C189278905","wikidata":"https://www.wikidata.org/wiki/Q2157708","display_name":"Wide-bandgap semiconductor","level":2,"score":0.47740617394447327},{"id":"https://openalex.org/C16115445","wikidata":"https://www.wikidata.org/wiki/Q2391942","display_name":"Schottky barrier","level":3,"score":0.4744637608528137},{"id":"https://openalex.org/C54516573","wikidata":"https://www.wikidata.org/wiki/Q2294","display_name":"Proton","level":2,"score":0.46299582719802856},{"id":"https://openalex.org/C2780722187","wikidata":"https://www.wikidata.org/wiki/Q412356","display_name":"Silicon carbide","level":2,"score":0.4593212604522705},{"id":"https://openalex.org/C181966813","wikidata":"https://www.wikidata.org/wiki/Q806352","display_name":"Band gap","level":2,"score":0.43039563298225403},{"id":"https://openalex.org/C140205800","wikidata":"https://www.wikidata.org/wiki/Q5860","display_name":"Carbon fibers","level":3,"score":0.4148368239402771},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.14120623469352722},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.10209962725639343},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08005735278129578},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.058314234018325806},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.05676144361495972},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104779481","wikidata":"https://www.wikidata.org/wiki/Q50707","display_name":"Composite number","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mixdes.2015.7208587","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mixdes.2015.7208587","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 22nd International Conference Mixed Design of Integrated Circuits &amp; Systems (MIXDES)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320309972","display_name":"\u010cesk\u00e9 Vysok\u00e9 U\u010den\u00ed Technick\u00e9 v Praze","ror":"https://ror.org/03kqpb082"},{"id":"https://openalex.org/F4320321006","display_name":"Grantov\u00e1 Agentura \u010cesk\u00e9 Republiky","ror":"https://ror.org/01pv73b02"},{"id":"https://openalex.org/F4320338080","display_name":"European Social Fund","ror":"https://ror.org/00k4n6c32"},{"id":"https://openalex.org/F4320338367","display_name":"FP7 Nanosciences, Nanotechnologies, Materials and new Production Technologies","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1974422307","https://openalex.org/W1981342288","https://openalex.org/W1985235949","https://openalex.org/W2001605737","https://openalex.org/W2039070639","https://openalex.org/W2137374832","https://openalex.org/W2160286674","https://openalex.org/W2160667190","https://openalex.org/W2170700735","https://openalex.org/W2245440194","https://openalex.org/W2252480901"],"related_works":["https://openalex.org/W2147656057","https://openalex.org/W1540585561","https://openalex.org/W2133687845","https://openalex.org/W1981646027","https://openalex.org/W2917180890","https://openalex.org/W2614156624","https://openalex.org/W1986017419","https://openalex.org/W2904257419","https://openalex.org/W2911343812","https://openalex.org/W2124971553"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"the":[3,32,40,43,76,83,90],"development":[4],"of":[5,78,92],"simulation":[6,63,91],"models":[7],"for":[8,52,75,89],"proton":[9],"and":[10,35,70],"carbon":[11,23],"irradiated":[12,53],"4H-SiC":[13],"junction":[14],"barrier":[15],"Schottky":[16],"(JBS)":[17],"diodes.":[18],"Compared":[19],"to":[20],"protons,":[21],"heavier":[22],"ions":[24],"introduce":[25],"more":[26,36],"defects":[27],"with":[28,59,67],"deeper":[29],"levels":[30],"in":[31,97],"SiC":[33,79],"bandgap":[34],"stable":[37],"damage.":[38],"For":[39],"first":[41],"time,":[42],"free":[44],"carrier":[45,93],"concentration":[46],"profile":[47],"extracted":[48],"from":[49],"CV":[50],"simulations":[51],"JBS":[54],"diode":[55],"has":[56],"been":[57],"compared":[58],"experimental":[60,68],"data.":[61],"The":[62],"exhibit":[64],"excellent":[65],"matching":[66],"data":[69],"can":[71,86],"be":[72,87],"very":[73],"useful":[74],"optimization":[77],"power":[80],"devices.":[81],"Furthermore,":[82],"developed":[84],"model":[85],"used":[88],"life":[94],"time":[95],"control":[96],"PiN":[98],"diode.":[99]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
