{"id":"https://openalex.org/W2008819020","doi":"https://doi.org/10.1109/mixdes.2014.6872236","title":"Efficient implementation for accurate analysis of CED circuits against multiple faults","display_name":"Efficient implementation for accurate analysis of CED circuits against multiple faults","publication_year":2014,"publication_date":"2014-06-01","ids":{"openalex":"https://openalex.org/W2008819020","doi":"https://doi.org/10.1109/mixdes.2014.6872236","mag":"2008819020"},"language":"en","primary_location":{"id":"doi:10.1109/mixdes.2014.6872236","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mixdes.2014.6872236","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074720386","display_name":"Ting An","orcid":null},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I205703379","display_name":"Institut Mines-T\u00e9l\u00e9com","ror":"https://ror.org/025vp2923","country_code":"FR","type":"facility","lineage":["https://openalex.org/I205703379"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Ting An","raw_affiliation_strings":["Telecom ParisTech, Institut Mines-Telecom, Paris, France","Inst. Mines Telecom, Telecom ParisTech, Paris, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Telecom ParisTech, Institut Mines-Telecom, Paris, France","institution_ids":["https://openalex.org/I12356871","https://openalex.org/I205703379"]},{"raw_affiliation_string":"Inst. Mines Telecom, Telecom ParisTech, Paris, France","institution_ids":["https://openalex.org/I12356871"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043505742","display_name":"Kaikai Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I205703379","display_name":"Institut Mines-T\u00e9l\u00e9com","ror":"https://ror.org/025vp2923","country_code":"FR","type":"facility","lineage":["https://openalex.org/I205703379"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Kaikai Liu","raw_affiliation_strings":["Telecom ParisTech, Institut Mines-Telecom, Paris, France","Inst. Mines Telecom, Telecom ParisTech, Paris, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Telecom ParisTech, Institut Mines-Telecom, Paris, France","institution_ids":["https://openalex.org/I12356871","https://openalex.org/I205703379"]},{"raw_affiliation_string":"Inst. Mines Telecom, Telecom ParisTech, Paris, France","institution_ids":["https://openalex.org/I12356871"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079498326","display_name":"Hao Cai","orcid":"https://orcid.org/0000-0001-9794-8049"},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I205703379","display_name":"Institut Mines-T\u00e9l\u00e9com","ror":"https://ror.org/025vp2923","country_code":"FR","type":"facility","lineage":["https://openalex.org/I205703379"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Hao Cai","raw_affiliation_strings":["Telecom ParisTech, Institut Mines-Telecom, Paris, France","Inst. Mines Telecom, Telecom ParisTech, Paris, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Telecom ParisTech, Institut Mines-Telecom, Paris, France","institution_ids":["https://openalex.org/I12356871","https://openalex.org/I205703379"]},{"raw_affiliation_string":"Inst. Mines Telecom, Telecom ParisTech, Paris, France","institution_ids":["https://openalex.org/I12356871"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018022196","display_name":"L\u00edrida Naviner","orcid":"https://orcid.org/0000-0002-6320-4153"},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I205703379","display_name":"Institut Mines-T\u00e9l\u00e9com","ror":"https://ror.org/025vp2923","country_code":"FR","type":"facility","lineage":["https://openalex.org/I205703379"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Lirida Alves de Barros Naviner","raw_affiliation_strings":["Telecom ParisTech, Institut Mines-Telecom, Paris, France","Inst. Mines Telecom, Telecom ParisTech, Paris, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Telecom ParisTech, Institut Mines-Telecom, Paris, France","institution_ids":["https://openalex.org/I12356871","https://openalex.org/I205703379"]},{"raw_affiliation_string":"Inst. Mines Telecom, Telecom ParisTech, Paris, France","institution_ids":["https://openalex.org/I12356871"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4079,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.49988216,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"54","issue":null,"first_page":"436","last_page":"440"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7129199504852295},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6150372624397278},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.6043362021446228},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5741152167320251},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5523583889007568},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.538356602191925},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.528870165348053},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.48384013772010803},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.48256105184555054},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.4596507251262665},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.4277741611003876},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.42565488815307617},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3667890727519989},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3369098901748657},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2755875885486603},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16171324253082275},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.11685764789581299},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11484947800636292},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.089305579662323},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.06986477971076965},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.06561177968978882}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7129199504852295},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6150372624397278},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.6043362021446228},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5741152167320251},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5523583889007568},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.538356602191925},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.528870165348053},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.48384013772010803},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.48256105184555054},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.4596507251262665},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.4277741611003876},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.42565488815307617},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3667890727519989},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3369098901748657},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2755875885486603},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16171324253082275},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.11685764789581299},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11484947800636292},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.089305579662323},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.06986477971076965},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.06561177968978882},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mixdes.2014.6872236","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mixdes.2014.6872236","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320883","display_name":"Agence Nationale de la Recherche","ror":"https://ror.org/00rbzpz17"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1964714420","https://openalex.org/W1990954860","https://openalex.org/W1996411546","https://openalex.org/W1998921161","https://openalex.org/W2070566315","https://openalex.org/W2083341111","https://openalex.org/W2105376593","https://openalex.org/W2122819799","https://openalex.org/W2131483653","https://openalex.org/W2135669462","https://openalex.org/W2143674663","https://openalex.org/W2149110203","https://openalex.org/W2152652532","https://openalex.org/W2153866173","https://openalex.org/W2167135469","https://openalex.org/W3144672859","https://openalex.org/W4254797787"],"related_works":["https://openalex.org/W18035309","https://openalex.org/W2185394135","https://openalex.org/W2742111403","https://openalex.org/W2082366402","https://openalex.org/W2169757786","https://openalex.org/W1600260729","https://openalex.org/W2989822455","https://openalex.org/W2189098950","https://openalex.org/W4285494435","https://openalex.org/W4376607244"],"abstract_inverted_index":{"Reliability":[0],"issues":[1],"became":[2],"an":[3,21,56],"important":[4],"concern":[5],"in":[6,24],"deep":[7],"submicron":[8],"CMOS":[9],"devices.":[10],"Concurrent":[11],"Error":[12],"Detection":[13],"(CED)":[14],"scheme":[15],"has":[16],"been":[17],"proved":[18],"to":[19,32,72],"be":[20,73],"efficient":[22],"technique":[23],"such":[25],"a":[26],"context.":[27],"Different":[28],"efforts":[29],"were":[30],"reported":[31],"quantify":[33],"the":[34,64,96],"efficiency":[35,94],"of":[36,95],"CED":[37,60],"schemes":[38],"but":[39],"generally":[40],"they":[41],"consider":[42],"single":[43],"faults":[44],"or":[45],"suppose":[46],"that":[47],"implemented":[48],"checker":[49,68],"mechanisms":[50],"are":[51],"fault-free.":[52],"This":[53],"paper":[54],"describes":[55],"alternative":[57],"solution":[58,98],"for":[59],"circuits":[61],"analysis,":[62],"where":[63],"whole":[65],"circuit":[66],"(including":[67],"mechanisms)":[69],"is":[70,79,99],"supposed":[71],"fault":[74],"prone.":[75],"The":[76,92],"proposed":[77,97],"approach":[78],"based":[80],"on":[81],"Probabilistic":[82],"Transfer":[83],"Matrices":[84],"and":[85],"then":[86],"can":[87],"deal":[88],"with":[89],"multiple":[90],"faults.":[91],"time":[93],"demonstrated":[100],"through":[101],"arithmetic":[102],"circuits.":[103]},"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}