{"id":"https://openalex.org/W2081058423","doi":"https://doi.org/10.1109/mixdes.2014.6872223","title":"COTS FPGA/SRAM irradiations using a dedicated testing infrastructure for characterization of large component batches","display_name":"COTS FPGA/SRAM irradiations using a dedicated testing infrastructure for characterization of large component batches","publication_year":2014,"publication_date":"2014-06-01","ids":{"openalex":"https://openalex.org/W2081058423","doi":"https://doi.org/10.1109/mixdes.2014.6872223","mag":"2081058423"},"language":"en","primary_location":{"id":"doi:10.1109/mixdes.2014.6872223","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mixdes.2014.6872223","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://cds.cern.ch/record/1979601","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089146132","display_name":"S\u0142awosz Uzna\u0144ski","orcid":null},"institutions":[{"id":"https://openalex.org/I67311998","display_name":"European Organization for Nuclear Research","ror":"https://ror.org/01ggx4157","country_code":"CH","type":"facility","lineage":["https://openalex.org/I67311998"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Slawosz Uznanski","raw_affiliation_strings":["Technology Department, European Organization for Nuclear Research (CERN), Meyrin, Switzerland","Technol. Dept., Eur. Organ. for Nucl. Res. (CERN), Meyrin, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technology Department, European Organization for Nuclear Research (CERN), Meyrin, Switzerland","institution_ids":["https://openalex.org/I67311998"]},{"raw_affiliation_string":"Technol. Dept., Eur. Organ. for Nucl. Res. (CERN), Meyrin, Switzerland","institution_ids":["https://openalex.org/I67311998"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035330691","display_name":"Benjamin Todd","orcid":null},"institutions":[{"id":"https://openalex.org/I67311998","display_name":"European Organization for Nuclear Research","ror":"https://ror.org/01ggx4157","country_code":"CH","type":"facility","lineage":["https://openalex.org/I67311998"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Benjamin Todd","raw_affiliation_strings":["Technology Department, European Organization for Nuclear Research (CERN), Meyrin, Switzerland","Technol. Dept., Eur. Organ. for Nucl. Res. (CERN), Meyrin, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technology Department, European Organization for Nuclear Research (CERN), Meyrin, Switzerland","institution_ids":["https://openalex.org/I67311998"]},{"raw_affiliation_string":"Technol. Dept., Eur. Organ. for Nucl. Res. (CERN), Meyrin, Switzerland","institution_ids":["https://openalex.org/I67311998"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075408807","display_name":"Johannes Walter","orcid":"https://orcid.org/0000-0002-5457-4232"},"institutions":[{"id":"https://openalex.org/I67311998","display_name":"European Organization for Nuclear Research","ror":"https://ror.org/01ggx4157","country_code":"CH","type":"facility","lineage":["https://openalex.org/I67311998"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Johannes Walter","raw_affiliation_strings":["Technology Department, European Organization for Nuclear Research (CERN), Meyrin, Switzerland","Technol. Dept., Eur. Organ. for Nucl. Res. (CERN), Meyrin, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technology Department, European Organization for Nuclear Research (CERN), Meyrin, Switzerland","institution_ids":["https://openalex.org/I67311998"]},{"raw_affiliation_string":"Technol. Dept., Eur. Organ. for Nucl. Res. (CERN), Meyrin, Switzerland","institution_ids":["https://openalex.org/I67311998"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015390420","display_name":"Andrea Vilar-Villanueva","orcid":null},"institutions":[{"id":"https://openalex.org/I67311998","display_name":"European Organization for Nuclear Research","ror":"https://ror.org/01ggx4157","country_code":"CH","type":"facility","lineage":["https://openalex.org/I67311998"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Andrea Vilar-Villanueva","raw_affiliation_strings":["Technology Department, European Organization for Nuclear Research (CERN), Meyrin, Switzerland","Technol. Dept., Eur. Organ. for Nucl. Res. (CERN), Meyrin, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technology Department, European Organization for Nuclear Research (CERN), Meyrin, Switzerland","institution_ids":["https://openalex.org/I67311998"]},{"raw_affiliation_string":"Technol. Dept., Eur. Organ. for Nucl. Res. (CERN), Meyrin, Switzerland","institution_ids":["https://openalex.org/I67311998"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I67311998"],"apc_list":null,"apc_paid":null,"fwci":1.2167,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.77025662,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"381","last_page":"384"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7973088026046753},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7845484018325806},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.7616754770278931},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6503913402557373},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5794524550437927},{"id":"https://openalex.org/keywords/unit-testing","display_name":"Unit testing","score":0.47883060574531555},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.353473961353302},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3086701035499573},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27755463123321533},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.24046757817268372},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.1504163146018982}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7973088026046753},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7845484018325806},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.7616754770278931},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6503913402557373},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5794524550437927},{"id":"https://openalex.org/C148027188","wikidata":"https://www.wikidata.org/wiki/Q907375","display_name":"Unit testing","level":3,"score":0.47883060574531555},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.353473961353302},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3086701035499573},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27755463123321533},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.24046757817268372},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.1504163146018982},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/mixdes.2014.6872223","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mixdes.2014.6872223","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES)","raw_type":"proceedings-article"},{"id":"pmh:oai:cds.cern.ch:1979601","is_oa":true,"landing_page_url":"http://cds.cern.ch/record/1979601","pdf_url":null,"source":{"id":"https://openalex.org/S4306402195","display_name":"CERN Document Server (European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":null}],"best_oa_location":{"id":"pmh:oai:cds.cern.ch:1979601","is_oa":true,"landing_page_url":"http://cds.cern.ch/record/1979601","pdf_url":null,"source":{"id":"https://openalex.org/S4306402195","display_name":"CERN Document Server (European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":null},"sustainable_development_goals":[{"score":0.6299999952316284,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1966689897","https://openalex.org/W2097886815","https://openalex.org/W2113848520","https://openalex.org/W2141763893","https://openalex.org/W2171598863","https://openalex.org/W2324524479","https://openalex.org/W6701062879"],"related_works":["https://openalex.org/W4392590355","https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W1976168335","https://openalex.org/W2109451123","https://openalex.org/W4378977321","https://openalex.org/W3211992815","https://openalex.org/W4231757677"],"abstract_inverted_index":{"This":[0],"paper":[1],"introduces":[2],"a":[3],"new":[4],"testing":[5,42],"platform":[6,43],"for":[7,46],"irradiation":[8],"of":[9,12,22,28,54],"large":[10],"batches":[11],"COTS":[13],"FPGA":[14,58],"and":[15,26,37,51],"SRAMs.":[16],"The":[17,34],"main":[18],"objective":[19],"is":[20],"measurement":[21],"component":[23],"radiation":[24],"response":[25],"assessment":[27],"component-to-component":[29],"variability":[30],"within":[31],"one":[32],"batch.":[33],"first":[35],"validation":[36],"test":[38],"results":[39],"using":[40],"the":[41,55],"are":[44],"presented":[45],"150nm":[47],"TFT":[48],"SRAM":[49],"(Renesas)":[50],"different":[52],"sizes":[53],"130nm":[56],"ProASIC3":[57],"(Microsemi).":[59]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-08-27T14:10:00.468798","created_date":"2025-10-10T00:00:00"}