{"id":"https://openalex.org/W2056694488","doi":"https://doi.org/10.1109/mixdes.2014.6872152","title":"Compact modeling of homojunction tunnel FETs","display_name":"Compact modeling of homojunction tunnel FETs","publication_year":2014,"publication_date":"2014-06-01","ids":{"openalex":"https://openalex.org/W2056694488","doi":"https://doi.org/10.1109/mixdes.2014.6872152","mag":"2056694488"},"language":"en","primary_location":{"id":"doi:10.1109/mixdes.2014.6872152","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mixdes.2014.6872152","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://infoscience.epfl.ch/record/200526","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101438580","display_name":"Arnab Biswas","orcid":"https://orcid.org/0000-0003-4818-1288"},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Arnab Biswas","raw_affiliation_strings":["Nanolab EPFL, Lausanne, Switzerland","Nanolab, EPFL,Lausanne,SWITZERLAND"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanolab EPFL, Lausanne, Switzerland","institution_ids":["https://openalex.org/I5124864"]},{"raw_affiliation_string":"Nanolab, EPFL,Lausanne,SWITZERLAND","institution_ids":["https://openalex.org/I5124864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070805466","display_name":"Nilay Da\u01e7tek\u0131n","orcid":null},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Nilay Dagtekin","raw_affiliation_strings":["Nanolab EPFL, Lausanne, Switzerland","Nanolab, EPFL,Lausanne,SWITZERLAND"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanolab EPFL, Lausanne, Switzerland","institution_ids":["https://openalex.org/I5124864"]},{"raw_affiliation_string":"Nanolab, EPFL,Lausanne,SWITZERLAND","institution_ids":["https://openalex.org/I5124864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088183109","display_name":"Cem Alper","orcid":"https://orcid.org/0000-0001-5636-6771"},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Cem Alper","raw_affiliation_strings":["Nanolab EPFL, Lausanne, Switzerland","Nanolab, EPFL,Lausanne,SWITZERLAND"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanolab EPFL, Lausanne, Switzerland","institution_ids":["https://openalex.org/I5124864"]},{"raw_affiliation_string":"Nanolab, EPFL,Lausanne,SWITZERLAND","institution_ids":["https://openalex.org/I5124864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063387608","display_name":"Luca De Michielis","orcid":null},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Luca De Michielis","raw_affiliation_strings":["Nanolab EPFL, Lausanne, Switzerland","Nanolab, EPFL,Lausanne,SWITZERLAND"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanolab EPFL, Lausanne, Switzerland","institution_ids":["https://openalex.org/I5124864"]},{"raw_affiliation_string":"Nanolab, EPFL,Lausanne,SWITZERLAND","institution_ids":["https://openalex.org/I5124864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062560576","display_name":"Antonios Bazigos","orcid":"https://orcid.org/0000-0002-2967-8208"},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Antonios Bazigos","raw_affiliation_strings":["Nanolab EPFL, Lausanne, Switzerland","Nanolab, EPFL,Lausanne,SWITZERLAND"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanolab EPFL, Lausanne, Switzerland","institution_ids":["https://openalex.org/I5124864"]},{"raw_affiliation_string":"Nanolab, EPFL,Lausanne,SWITZERLAND","institution_ids":["https://openalex.org/I5124864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000639997","display_name":"Wladek Grabinski","orcid":"https://orcid.org/0000-0003-3445-9496"},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Wladek Grabinski","raw_affiliation_strings":["Nanolab EPFL, Lausanne, Switzerland","Nanolab, EPFL,Lausanne,SWITZERLAND"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanolab EPFL, Lausanne, Switzerland","institution_ids":["https://openalex.org/I5124864"]},{"raw_affiliation_string":"Nanolab, EPFL,Lausanne,SWITZERLAND","institution_ids":["https://openalex.org/I5124864"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103043764","display_name":"Adrian Ionescu","orcid":"https://orcid.org/0000-0003-0265-5281"},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Adrian Ionescu","raw_affiliation_strings":["Nanolab EPFL, Lausanne, Switzerland","Nanolab, EPFL,Lausanne,SWITZERLAND"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanolab EPFL, Lausanne, Switzerland","institution_ids":["https://openalex.org/I5124864"]},{"raw_affiliation_string":"Nanolab, EPFL,Lausanne,SWITZERLAND","institution_ids":["https://openalex.org/I5124864"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.10434607,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"54","last_page":"57"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/homojunction","display_name":"Homojunction","score":0.9537966251373291},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7952035665512085},{"id":"https://openalex.org/keywords/quantum-tunnelling","display_name":"Quantum tunnelling","score":0.5969277024269104},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5852092504501343},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5255469083786011},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4823133945465088},{"id":"https://openalex.org/keywords/energy-consumption","display_name":"Energy consumption","score":0.4722190201282501},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.4632059335708618},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4545653164386749},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.4421873986721039},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4289410710334778},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4012964069843292},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.39649438858032227},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38789433240890503},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25877851247787476},{"id":"https://openalex.org/keywords/doping","display_name":"Doping","score":0.2050999104976654}],"concepts":[{"id":"https://openalex.org/C167456791","wikidata":"https://www.wikidata.org/wiki/Q4737729","display_name":"Homojunction","level":3,"score":0.9537966251373291},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7952035665512085},{"id":"https://openalex.org/C120398109","wikidata":"https://www.wikidata.org/wiki/Q175751","display_name":"Quantum tunnelling","level":2,"score":0.5969277024269104},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5852092504501343},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5255469083786011},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4823133945465088},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.4722190201282501},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.4632059335708618},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4545653164386749},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.4421873986721039},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4289410710334778},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4012964069843292},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.39649438858032227},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38789433240890503},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25877851247787476},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.2050999104976654},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/mixdes.2014.6872152","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mixdes.2014.6872152","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES)","raw_type":"proceedings-article"},{"id":"pmh:oai:infoscience.epfl.ch:200526","is_oa":true,"landing_page_url":"http://infoscience.epfl.ch/record/200526","pdf_url":null,"source":{"id":"https://openalex.org/S4306400487","display_name":"Infoscience (Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"},{"id":"pmh:oai:infoscience.tind.io:205271","is_oa":true,"landing_page_url":"https://infoscience.epfl.ch/handle/20.500.14299/111206","pdf_url":null,"source":{"id":"https://openalex.org/S4306400487","display_name":"Infoscience (Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"conference proceedings"}],"best_oa_location":{"id":"pmh:oai:infoscience.epfl.ch:200526","is_oa":true,"landing_page_url":"http://infoscience.epfl.ch/record/200526","pdf_url":null,"source":{"id":"https://openalex.org/S4306400487","display_name":"Infoscience (Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"},"sustainable_development_goals":[{"score":0.8999999761581421,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W1965218662","https://openalex.org/W1965739700","https://openalex.org/W1966910105","https://openalex.org/W1982547523","https://openalex.org/W1991353080","https://openalex.org/W1997219567","https://openalex.org/W2005375718","https://openalex.org/W2005489991","https://openalex.org/W2006405770","https://openalex.org/W2009624223","https://openalex.org/W2026250777","https://openalex.org/W2026617335","https://openalex.org/W2031766713","https://openalex.org/W2032197740","https://openalex.org/W2040389404","https://openalex.org/W2045730068","https://openalex.org/W2062509156","https://openalex.org/W2064427920","https://openalex.org/W2069680115","https://openalex.org/W2087922496","https://openalex.org/W2109749481","https://openalex.org/W2121290756","https://openalex.org/W2125663763","https://openalex.org/W2129247137","https://openalex.org/W2144970115","https://openalex.org/W2152165012","https://openalex.org/W2161817284","https://openalex.org/W2171295989","https://openalex.org/W2321880143","https://openalex.org/W2496261154","https://openalex.org/W3021238137","https://openalex.org/W3147289055","https://openalex.org/W6641327116","https://openalex.org/W6723458439"],"related_works":["https://openalex.org/W3110115192","https://openalex.org/W4316362756","https://openalex.org/W3011458897","https://openalex.org/W4286742098","https://openalex.org/W4322738664","https://openalex.org/W2794638453","https://openalex.org/W3131848594","https://openalex.org/W2061216727","https://openalex.org/W4286750185","https://openalex.org/W3217721420"],"abstract_inverted_index":{"Aggressive":[0],"scaling":[1],"of":[2,12,34,77,87,115,127],"the":[3,7,32,41,48,52,59,65,82,93,112],"supply":[4,37],"voltage":[5,38,79],"reduces":[6],"energy":[8],"needed":[9],"for":[10,95],"switching":[11,49,101],"standard":[13],"CMOS":[14,18,66],"devices.":[15,130],"However,":[16],"advanced":[17],"technologies":[19],"are":[20,105],"facing":[21],"two":[22],"main":[23],"problems":[24],"that":[25,45],"consequently":[26],"lead":[27],"to":[28,80,109,111],"higher":[29],"power":[30],"consumption:":[31],"complexity":[33],"a":[35],"further":[36],"reduction,":[39],"and":[40,54],"rising":[42],"leakage":[43],"currents":[44],"directly":[46],"affect":[47],"ratio":[50],"between":[51],"ON":[53],"OFF":[55],"states.":[56],"At":[57],"present,":[58],"available":[60],"field-effect":[61],"transistors":[62],"(FETs)":[63],"in":[64],"integrated":[67],"circuits":[68],"require":[69],"at":[70,73],"room":[71],"temperature":[72],"least":[74],"60":[75],"mV":[76],"gate":[78],"increase":[81],"current":[83],"by":[84],"one":[85],"order":[86],"magnitude.":[88],"Recent":[89],"publications":[90],"have":[91],"highlighted":[92],"need":[94],"alternative":[96],"devices":[97,108],"providing":[98],"better":[99],"ON-OFF":[100],"performance.":[102],"Tunneling":[103],"FETs":[104],"very":[106],"promising":[107],"respond":[110],"demanding":[113],"requirements":[114],"future":[116],"scaled":[117],"silicon":[118],"technology":[119],"nodes.":[120],"The":[121],"paper":[122],"reviews":[123],"recent":[124],"compact":[125],"modeling":[126],"homojunction":[128],"TFET":[129]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}