{"id":"https://openalex.org/W4312915250","doi":"https://doi.org/10.1109/mis.2022.3215779","title":"Convolutional Neural Network-Assisted Adaptive Sampling for Sparse Feature Detection in Image and Video Data","display_name":"Convolutional Neural Network-Assisted Adaptive Sampling for Sparse Feature Detection in Image and Video Data","publication_year":2022,"publication_date":"2022-11-03","ids":{"openalex":"https://openalex.org/W4312915250","doi":"https://doi.org/10.1109/mis.2022.3215779"},"language":"en","primary_location":{"id":"doi:10.1109/mis.2022.3215779","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mis.2022.3215779","pdf_url":null,"source":{"id":"https://openalex.org/S114241109","display_name":"IEEE Intelligent Systems","issn_l":"1541-1672","issn":["1541-1672","1941-1294"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Intelligent Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000999673","display_name":"Geet Lahoti","orcid":"https://orcid.org/0000-0001-8876-4758"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Geet Lahoti","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":"https://orcid.org/0000-0001-8876-4758","affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089258727","display_name":"Chitta Ranjan","orcid":"https://orcid.org/0000-0003-1146-9325"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Chitta Ranjan","raw_affiliation_strings":["ProcessMiner, Atlanta, GA, USA"],"raw_orcid":"https://orcid.org/0000-0003-1146-9325","affiliations":[{"raw_affiliation_string":"ProcessMiner, Atlanta, GA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075576624","display_name":"Jialei Chen","orcid":"https://orcid.org/0000-0002-6053-9302"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jialei Chen","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":"https://orcid.org/0000-0002-6053-9302","affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100652901","display_name":"Hao Yan","orcid":"https://orcid.org/0000-0002-4322-7323"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hao Yan","raw_affiliation_strings":["Arizona State University, Tempe, AZ, USA"],"raw_orcid":"https://orcid.org/0000-0002-4322-7323","affiliations":[{"raw_affiliation_string":"Arizona State University, Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067712887","display_name":"Chuck Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chuck Zhang","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":"https://orcid.org/0000-0001-7681-5538","affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5000999673"],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":1.3554,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.83628535,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"38","issue":"1","first_page":"45","last_page":"57"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9866999983787537,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8628730177879333},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.7049938440322876},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7015841007232666},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.6374088525772095},{"id":"https://openalex.org/keywords/adaptive-sampling","display_name":"Adaptive sampling","score":0.6160621047019958},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.6043663024902344},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5859723091125488},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5548930764198303},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.4624080955982208},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.43928009271621704},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.41558384895324707},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3577412962913513},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.349029004573822}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8628730177879333},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.7049938440322876},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7015841007232666},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.6374088525772095},{"id":"https://openalex.org/C2781395549","wikidata":"https://www.wikidata.org/wiki/Q4680762","display_name":"Adaptive sampling","level":3,"score":0.6160621047019958},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.6043663024902344},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5859723091125488},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5548930764198303},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.4624080955982208},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.43928009271621704},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.41558384895324707},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3577412962913513},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.349029004573822},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mis.2022.3215779","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mis.2022.3215779","pdf_url":null,"source":{"id":"https://openalex.org/S114241109","display_name":"IEEE Intelligent Systems","issn_l":"1541-1672","issn":["1541-1672","1941-1294"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Intelligent Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1983443623","https://openalex.org/W1992189566","https://openalex.org/W2026156619","https://openalex.org/W2041616772","https://openalex.org/W2043653481","https://openalex.org/W2053934160","https://openalex.org/W2090766112","https://openalex.org/W2097946161","https://openalex.org/W2113101204","https://openalex.org/W2132428767","https://openalex.org/W2280746192","https://openalex.org/W2547722547","https://openalex.org/W2749525589","https://openalex.org/W2756004689","https://openalex.org/W2769012417","https://openalex.org/W2800240267","https://openalex.org/W2912729634","https://openalex.org/W2923486253","https://openalex.org/W2963692882","https://openalex.org/W2981608870","https://openalex.org/W3104156061","https://openalex.org/W4297736515","https://openalex.org/W4393805319","https://openalex.org/W6745588108","https://openalex.org/W6863786681"],"related_works":["https://openalex.org/W2038693912","https://openalex.org/W1991602789","https://openalex.org/W1582396021","https://openalex.org/W1988359706","https://openalex.org/W312558119","https://openalex.org/W4210985407","https://openalex.org/W138014004","https://openalex.org/W2075598034","https://openalex.org/W1829869244","https://openalex.org/W2335441444"],"abstract_inverted_index":{"In":[0],"this":[1],"article,":[2],"we":[3],"propose":[4],"a":[5,17,82,94],"feature":[6],"detection":[7],"approach":[8,73,103],"that":[9],"employs":[10],"an":[11],"adaptive":[12],"sampling":[13,34,67],"technique":[14],"coupled":[15],"with":[16],"convolutional":[18],"neural":[19],"network":[20],"(CNN)":[21],"model,":[22],"to":[23,113],"detect":[24],"sparse":[25,122],"features":[26],"of":[27,45,53,56,65,71,110],"interest":[28],"in":[29,81,93],"high-dimensional":[30,39],"input":[31,40,111],"data.":[32],"Adaptive":[33],"criterion":[35],"smartly":[36],"explores":[37],"the":[38,43,51,54,57,62,66,72],"and":[41,91,107,116],"exploits":[42],"regions":[44],"interest.":[46],"The":[47,69,102],"CNN":[48],"model":[49],"determines":[50],"likelihood":[52],"presence":[55],"desired":[58,121],"features,":[59],"which":[60],"guides":[61],"exploitation":[63],"component":[64],"strategy.":[68],"effectiveness":[70],"is":[74],"illustrated":[75],"using":[76],"case":[77],"studies,":[78],"where":[79],"emotions":[80],"candidate\u2019s":[83],"interview":[84],"video":[85],"are":[86,97],"detected":[87],"for":[88,99],"evaluation":[89,105],"purpose":[90],"anomalies":[92],"product\u2019s":[95],"image":[96],"extracted":[98],"quality":[100],"control.":[101],"reduces":[104],"time":[106],"minimizes":[108],"amount":[109],"data":[112],"be":[114],"accessed":[115],"processed":[117],"while":[118],"effectively":[119],"identifying":[120],"features.":[123]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":7}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}