{"id":"https://openalex.org/W2500213677","doi":"https://doi.org/10.1109/mipro.2016.7522113","title":"Infrared protection system for high-voltage testing of SiC and GaN FETs used in DC-DC converters","display_name":"Infrared protection system for high-voltage testing of SiC and GaN FETs used in DC-DC converters","publication_year":2016,"publication_date":"2016-05-01","ids":{"openalex":"https://openalex.org/W2500213677","doi":"https://doi.org/10.1109/mipro.2016.7522113","mag":"2500213677"},"language":"en","primary_location":{"id":"doi:10.1109/mipro.2016.7522113","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mipro.2016.7522113","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 39th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077934020","display_name":"Filip Hormot","orcid":null},"institutions":[{"id":"https://openalex.org/I181343428","display_name":"University of Zagreb","ror":"https://ror.org/00mv6sv71","country_code":"HR","type":"education","lineage":["https://openalex.org/I181343428"]}],"countries":["HR"],"is_corresponding":true,"raw_author_name":"Filip Hormot","raw_affiliation_strings":["Faculty of Electrical Engineering and Computing, University of Zagreb, Zagreb, Croatia"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Engineering and Computing, University of Zagreb, Zagreb, Croatia","institution_ids":["https://openalex.org/I181343428"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061020891","display_name":"Josip Ba\u010dmaga","orcid":"https://orcid.org/0000-0002-6325-8725"},"institutions":[{"id":"https://openalex.org/I181343428","display_name":"University of Zagreb","ror":"https://ror.org/00mv6sv71","country_code":"HR","type":"education","lineage":["https://openalex.org/I181343428"]}],"countries":["HR"],"is_corresponding":false,"raw_author_name":"Josip Bacmaga","raw_affiliation_strings":["Faculty of Electrical Engineering and Computing, University of Zagreb, Zagreb, Croatia"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Engineering and Computing, University of Zagreb, Zagreb, Croatia","institution_ids":["https://openalex.org/I181343428"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021811907","display_name":"Adrijan Bari\u0107","orcid":"https://orcid.org/0000-0001-5642-3086"},"institutions":[{"id":"https://openalex.org/I181343428","display_name":"University of Zagreb","ror":"https://ror.org/00mv6sv71","country_code":"HR","type":"education","lineage":["https://openalex.org/I181343428"]}],"countries":["HR"],"is_corresponding":false,"raw_author_name":"Adrijan Baric","raw_affiliation_strings":["Faculty of Electrical Engineering and Computing, University of Zagreb, Zagreb, Croatia"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Engineering and Computing, University of Zagreb, Zagreb, Croatia","institution_ids":["https://openalex.org/I181343428"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5077934020"],"corresponding_institution_ids":["https://openalex.org/I181343428"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.0633154,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"72","last_page":"75"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.7817549705505371},{"id":"https://openalex.org/keywords/high-voltage","display_name":"High voltage","score":0.6883301734924316},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6435126066207886},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5723465085029602},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5556259751319885},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5127576589584351},{"id":"https://openalex.org/keywords/wide-bandgap-semiconductor","display_name":"Wide-bandgap semiconductor","score":0.49286484718322754},{"id":"https://openalex.org/keywords/silicon-carbide","display_name":"Silicon carbide","score":0.42455971240997314},{"id":"https://openalex.org/keywords/gallium-nitride","display_name":"Gallium nitride","score":0.41971927881240845},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.41316959261894226},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.35650092363357544},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23605984449386597},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.14053356647491455},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.08329212665557861}],"concepts":[{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.7817549705505371},{"id":"https://openalex.org/C88182573","wikidata":"https://www.wikidata.org/wiki/Q1139740","display_name":"High voltage","level":3,"score":0.6883301734924316},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6435126066207886},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5723465085029602},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5556259751319885},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5127576589584351},{"id":"https://openalex.org/C189278905","wikidata":"https://www.wikidata.org/wiki/Q2157708","display_name":"Wide-bandgap semiconductor","level":2,"score":0.49286484718322754},{"id":"https://openalex.org/C2780722187","wikidata":"https://www.wikidata.org/wiki/Q412356","display_name":"Silicon carbide","level":2,"score":0.42455971240997314},{"id":"https://openalex.org/C2778871202","wikidata":"https://www.wikidata.org/wiki/Q411713","display_name":"Gallium nitride","level":3,"score":0.41971927881240845},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.41316959261894226},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.35650092363357544},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23605984449386597},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14053356647491455},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.08329212665557861},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mipro.2016.7522113","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mipro.2016.7522113","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 39th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7699999809265137,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W267840210","https://openalex.org/W1869851185","https://openalex.org/W2057299459","https://openalex.org/W2065088108","https://openalex.org/W2143573432","https://openalex.org/W2171886847"],"related_works":["https://openalex.org/W2899383815","https://openalex.org/W2654716541","https://openalex.org/W2109359929","https://openalex.org/W2000487630","https://openalex.org/W1988167421","https://openalex.org/W2129261410","https://openalex.org/W1542396018","https://openalex.org/W1598582149","https://openalex.org/W2037936622","https://openalex.org/W2551593789"],"abstract_inverted_index":{"This":[0],"technical":[1],"paper":[2],"presents":[3],"the":[4,9,51,77],"design":[5],"and":[6,17,21,44,65,82],"testing":[7,31],"of":[8,14,40,68,76],"protection":[10],"system":[11,79],"for":[12],"evaluation":[13],"high-voltage":[15,25,30,56],"devices":[16,23],"circuits,":[18],"e.g.":[19],"SiC":[20],"GaN":[22],"or":[24],"switching":[26],"DC-DC":[27],"converters.":[28],"The":[29,74],"area":[32],"is":[33,59,80],"protected":[34,53],"from":[35,61],"invading":[36],"by":[37],"an":[38,47],"array":[39],"infrared":[41],"(IR)":[42],"emitters":[43],"detectors.":[45],"Whenever":[46],"object":[48],"passes":[49],"through":[50],"IR":[52],"space,":[54],"a":[55],"DC":[57,70],"source":[58],"disconnected":[60],"its":[62,83],"power":[63],"supply":[64],"harmful":[66],"effects":[67],"high":[69],"voltage":[71],"are":[72,87],"avoided.":[73],"functionality":[75],"developed":[78],"tested":[81],"characteristic":[84],"response":[85],"timings":[86],"measured.":[88]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}