{"id":"https://openalex.org/W2169570141","doi":"https://doi.org/10.1109/mipro.2014.6859527","title":"Impact of microstrip width and annealing time on the characteristics of micro-scale graphene FETs","display_name":"Impact of microstrip width and annealing time on the characteristics of micro-scale graphene FETs","publication_year":2014,"publication_date":"2014-05-01","ids":{"openalex":"https://openalex.org/W2169570141","doi":"https://doi.org/10.1109/mipro.2014.6859527","mag":"2169570141"},"language":"en","primary_location":{"id":"doi:10.1109/mipro.2014.6859527","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mipro.2014.6859527","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 37th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003032308","display_name":"Mirko Poljak","orcid":"https://orcid.org/0000-0001-7075-6688"},"institutions":[{"id":"https://openalex.org/I181343428","display_name":"University of Zagreb","ror":"https://ror.org/00mv6sv71","country_code":"HR","type":"education","lineage":["https://openalex.org/I181343428"]}],"countries":["HR"],"is_corresponding":true,"raw_author_name":"M. Poljak","raw_affiliation_strings":["Faculty of Electrical Engineering and Computing, University of Zagreb, Croatia"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Engineering and Computing, University of Zagreb, Croatia","institution_ids":["https://openalex.org/I181343428"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111712197","display_name":"M. Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Wang","raw_affiliation_strings":["Intel Corporation, Boise, ID, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Boise, ID, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029482960","display_name":"S. Zonja","orcid":null},"institutions":[{"id":"https://openalex.org/I181343428","display_name":"University of Zagreb","ror":"https://ror.org/00mv6sv71","country_code":"HR","type":"education","lineage":["https://openalex.org/I181343428"]}],"countries":["HR"],"is_corresponding":false,"raw_author_name":"S. Zonja","raw_affiliation_strings":["Faculty of Electrical Engineering and Computing, University of Zagreb, Croatia"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Engineering and Computing, University of Zagreb, Croatia","institution_ids":["https://openalex.org/I181343428"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033444908","display_name":"Vedran \u0110erek","orcid":"https://orcid.org/0000-0001-9507-6865"},"institutions":[{"id":"https://openalex.org/I4210123216","display_name":"Rudjer Boskovic Institute","ror":"https://ror.org/02mw21745","country_code":"HR","type":"facility","lineage":["https://openalex.org/I4210123216"]}],"countries":["HR"],"is_corresponding":false,"raw_author_name":"V. Derek","raw_affiliation_strings":["Laboratory for Molecular Physics, Rudjer Boskovic Institute, Zagreb, Croatia"],"affiliations":[{"raw_affiliation_string":"Laboratory for Molecular Physics, Rudjer Boskovic Institute, Zagreb, Croatia","institution_ids":["https://openalex.org/I4210123216"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067177607","display_name":"Mile Ivanda","orcid":"https://orcid.org/0000-0002-3785-8321"},"institutions":[{"id":"https://openalex.org/I4210123216","display_name":"Rudjer Boskovic Institute","ror":"https://ror.org/02mw21745","country_code":"HR","type":"facility","lineage":["https://openalex.org/I4210123216"]}],"countries":["HR"],"is_corresponding":false,"raw_author_name":"M. Ivanda","raw_affiliation_strings":["Laboratory for Molecular Physics, Rudjer Boskovic Institute, Zagreb, Croatia"],"affiliations":[{"raw_affiliation_string":"Laboratory for Molecular Physics, Rudjer Boskovic Institute, Zagreb, Croatia","institution_ids":["https://openalex.org/I4210123216"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065232901","display_name":"K. L. Wang","orcid":"https://orcid.org/0009-0005-0313-6477"},"institutions":[{"id":"https://openalex.org/I161318765","display_name":"University of California, Los Angeles","ror":"https://ror.org/046rm7j60","country_code":"US","type":"education","lineage":["https://openalex.org/I161318765"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. L. Wang","raw_affiliation_strings":["Department of Electrical Engineering, University of California at Los Angeles, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of California at Los Angeles, CA, USA","institution_ids":["https://openalex.org/I161318765"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061642935","display_name":"Tomislav Suligoj","orcid":null},"institutions":[{"id":"https://openalex.org/I181343428","display_name":"University of Zagreb","ror":"https://ror.org/00mv6sv71","country_code":"HR","type":"education","lineage":["https://openalex.org/I181343428"]}],"countries":["HR"],"is_corresponding":false,"raw_author_name":"T. Suligoj","raw_affiliation_strings":["Faculty of Electrical Engineering and Computing, University of Zagreb, Croatia"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Engineering and Computing, University of Zagreb, Croatia","institution_ids":["https://openalex.org/I181343428"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5003032308"],"corresponding_institution_ids":["https://openalex.org/I181343428"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11202114,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"143","issue":null,"first_page":"27","last_page":"32"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10083","display_name":"Graphene research and applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10083","display_name":"Graphene research and applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12627","display_name":"Graphene and Nanomaterials Applications","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10074","display_name":"Carbon Nanotubes in Composites","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/graphene","display_name":"Graphene","score":0.9479473233222961},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.8323550224304199},{"id":"https://openalex.org/keywords/annealing","display_name":"Annealing (glass)","score":0.7427997589111328},{"id":"https://openalex.org/keywords/contact-resistance","display_name":"Contact resistance","score":0.7285746335983276},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6412367820739746},{"id":"https://openalex.org/keywords/field-effect-transistor","display_name":"Field-effect transistor","score":0.5750761032104492},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5368142127990723},{"id":"https://openalex.org/keywords/electron-mobility","display_name":"Electron mobility","score":0.5304550528526306},{"id":"https://openalex.org/keywords/scattering","display_name":"Scattering","score":0.44447624683380127},{"id":"https://openalex.org/keywords/impurity","display_name":"Impurity","score":0.43659907579421997},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.3608391582965851},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.20917150378227234},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1181202232837677},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.11119386553764343},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09508350491523743},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.06726685166358948},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.06479960680007935}],"concepts":[{"id":"https://openalex.org/C30080830","wikidata":"https://www.wikidata.org/wiki/Q169917","display_name":"Graphene","level":2,"score":0.9479473233222961},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8323550224304199},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.7427997589111328},{"id":"https://openalex.org/C123671423","wikidata":"https://www.wikidata.org/wiki/Q332329","display_name":"Contact resistance","level":3,"score":0.7285746335983276},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6412367820739746},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.5750761032104492},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5368142127990723},{"id":"https://openalex.org/C106782819","wikidata":"https://www.wikidata.org/wiki/Q6501076","display_name":"Electron mobility","level":2,"score":0.5304550528526306},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.44447624683380127},{"id":"https://openalex.org/C71987851","wikidata":"https://www.wikidata.org/wiki/Q7216430","display_name":"Impurity","level":2,"score":0.43659907579421997},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.3608391582965851},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.20917150378227234},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1181202232837677},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.11119386553764343},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09508350491523743},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.06726685166358948},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.06479960680007935},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mipro.2014.6859527","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mipro.2014.6859527","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 37th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6000000238418579}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1987412819","https://openalex.org/W1991859775","https://openalex.org/W1999175619","https://openalex.org/W2005815052","https://openalex.org/W2010561486","https://openalex.org/W2058122340","https://openalex.org/W2060009331","https://openalex.org/W2072383154","https://openalex.org/W2074880343","https://openalex.org/W2080284466","https://openalex.org/W2084679444","https://openalex.org/W2087638855","https://openalex.org/W2105685140","https://openalex.org/W2119882629","https://openalex.org/W2132515584","https://openalex.org/W2140373452","https://openalex.org/W2142840270","https://openalex.org/W2148243431","https://openalex.org/W2151097667","https://openalex.org/W2499844158","https://openalex.org/W3020833317","https://openalex.org/W3102620251","https://openalex.org/W4211172053"],"related_works":["https://openalex.org/W2166893257","https://openalex.org/W2019774880","https://openalex.org/W2072424359","https://openalex.org/W2053242415","https://openalex.org/W2061674058","https://openalex.org/W2902506738","https://openalex.org/W2750055590","https://openalex.org/W1990516236","https://openalex.org/W2780469790","https://openalex.org/W1976012112"],"abstract_inverted_index":{"Graphene":[0],"field-effect":[1],"transistors":[2],"are":[3,14],"fabricated":[4],"using":[5],"CVD-grown":[6],"graphene":[7,40,48],"and":[8,24,33,69,71],"a":[9],"wet":[10],"transfer":[11,25],"technique.":[12],"Devices":[13],"characterized":[15],"in":[16,76],"terms":[17],"of":[18,58,74],"carrier":[19,65],"mobility,":[20],"contact":[21,34],"resistance,":[22],"output":[23],"characteristics.":[26],"We":[27],"found":[28,46],"that":[29,47],"the":[30,38,72],"mobility":[31],"decreases":[32],"resistance":[35],"increases":[36],"with":[37],"decreasing":[39],"microstrip":[41],"width.":[42],"In":[43],"addition,":[44],"we":[45],"FET":[49],"characteristics":[50,60],"strongly":[51],"depend":[52],"on":[53,67],"annealing":[54],"time.":[55],"The":[56],"behavior":[57],"device":[59],"is":[61],"explained":[62],"by":[63],"discussing":[64],"scattering":[66],"defects":[68],"impurities,":[70],"formation":[73],"pn-junctions":[75],"graphene.":[77]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}