{"id":"https://openalex.org/W7128793578","doi":"https://doi.org/10.1109/mim.2026.11395466","title":"Accurate Characterization of Transceiver Devices Using 3-Port Balun De-Embedding Techniques","display_name":"Accurate Characterization of Transceiver Devices Using 3-Port Balun De-Embedding Techniques","publication_year":2026,"publication_date":"2026-02-01","ids":{"openalex":"https://openalex.org/W7128793578","doi":"https://doi.org/10.1109/mim.2026.11395466"},"language":null,"primary_location":{"id":"doi:10.1109/mim.2026.11395466","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mim.2026.11395466","pdf_url":null,"source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation & Measurement Magazine","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081982957","display_name":"Shirong Lv","orcid":"https://orcid.org/0000-0002-1378-1497"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shirong Lv","raw_affiliation_strings":["Peking University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Peking University","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5125979806","display_name":"Yong Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yong Wang","raw_affiliation_strings":["Beijing Microelectronics Technology Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024871348","display_name":"Liang Xie","orcid":"https://orcid.org/0000-0003-4576-0225"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liang Xie","raw_affiliation_strings":["Chinese Academy of Sciences"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114752547","display_name":"Yuxuan Jiang","orcid":"https://orcid.org/0000-0002-0143-8579"},"institutions":[{"id":"https://openalex.org/I94305156","display_name":"Indian Academy of Sciences","ror":"https://ror.org/00wdyp114","country_code":"IN","type":"government","lineage":["https://openalex.org/I2799351866","https://openalex.org/I4210098748","https://openalex.org/I4210134808","https://openalex.org/I94305156"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Yuxuan Jiang","raw_affiliation_strings":["University of Chinease Academy of Sciences"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Chinease Academy of Sciences","institution_ids":["https://openalex.org/I94305156"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103217076","display_name":"Huailin Liao","orcid":"https://orcid.org/0000-0003-3221-8146"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huailin Liao","raw_affiliation_strings":["Peking University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Peking University","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101388422","display_name":"Wen Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wu Wen","raw_affiliation_strings":["Beijing Microelectrics Technology Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Microelectrics Technology Institute","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022588934","display_name":"Chong Duan","orcid":null},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chong Duan","raw_affiliation_strings":["Beijing Microelectrics Technology Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Microelectrics Technology Institute","institution_ids":["https://openalex.org/I4210089056"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.13474733,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"29","issue":"1","first_page":"41","last_page":"49"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9519000053405762,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9519000053405762,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.01360000018030405,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.00989999994635582,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/balun","display_name":"Balun","score":0.9358000159263611},{"id":"https://openalex.org/keywords/baseband","display_name":"Baseband","score":0.9204999804496765},{"id":"https://openalex.org/keywords/transceiver","display_name":"Transceiver","score":0.6812999844551086},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.5830000042915344},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.4778999984264374},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.47450000047683716},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4081999957561493},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.35089999437332153}],"concepts":[{"id":"https://openalex.org/C114489654","wikidata":"https://www.wikidata.org/wiki/Q805838","display_name":"Balun","level":3,"score":0.9358000159263611},{"id":"https://openalex.org/C65165936","wikidata":"https://www.wikidata.org/wiki/Q575784","display_name":"Baseband","level":3,"score":0.9204999804496765},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.7214000225067139},{"id":"https://openalex.org/C7720470","wikidata":"https://www.wikidata.org/wiki/Q954187","display_name":"Transceiver","level":3,"score":0.6812999844551086},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.5830000042915344},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.4778999984264374},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.47450000047683716},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.47279998660087585},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4643000066280365},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4081999957561493},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.35089999437332153},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.35010001063346863},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.34880000352859497},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.33379998803138733},{"id":"https://openalex.org/C612350","wikidata":"https://www.wikidata.org/wiki/Q1761108","display_name":"Impedance matching","level":3,"score":0.3075000047683716},{"id":"https://openalex.org/C173413354","wikidata":"https://www.wikidata.org/wiki/Q7049470","display_name":"Nonlinear distortion","level":4,"score":0.2939999997615814},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2897000014781952},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.2694000005722046},{"id":"https://openalex.org/C76249512","wikidata":"https://www.wikidata.org/wiki/Q1206780","display_name":"Device under test","level":3,"score":0.258899986743927},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.2531999945640564}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mim.2026.11395466","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mim.2026.11395466","pdf_url":null,"source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation & Measurement Magazine","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2014238043","https://openalex.org/W2065048334","https://openalex.org/W2122584909","https://openalex.org/W2136162940","https://openalex.org/W3163123728","https://openalex.org/W4237740261","https://openalex.org/W4312577900","https://openalex.org/W4385337711","https://openalex.org/W4400108038","https://openalex.org/W4402218494","https://openalex.org/W4403211440","https://openalex.org/W4408852290","https://openalex.org/W4409014722"],"related_works":[],"abstract_inverted_index":{"This":[0,30],"paper":[1],"presents":[2],"a":[3,10,83],"baseband":[4,49,69],"data":[5,50,70],"compensation":[6,51,71],"method":[7,88,110],"that":[8,86],"utilizes":[9],"3-port":[11,38],"balun":[12,39,57],"de-embedding":[13,40,64],"technique":[14],"to":[15,75],"accurately":[16],"measure":[17],"the":[18,33,37,42,48,56,68,77,91,102,114],"RF":[19,94,106,117],"parameters":[20],"of":[21,36,44,55,93,104,116],"transceiver":[22],"chips,":[23],"including":[24],"noise":[25],"figure":[26],"and":[27,47,66,125],"nonlinear":[28],"characteristics.":[29],"study":[31],"explores":[32],"theoretical":[34],"derivation":[35],"algorithm,":[41,65],"design":[43],"calibration":[45],"components,":[46],"algorithm.":[52],"The":[53,108],"S-parameters":[54],"are":[58],"derived":[59],"using":[60],"an":[61],"optimized":[62],"TRL":[63],"then":[67],"algorithm":[72],"is":[73],"applied":[74],"correct":[76],"amplitude.":[78],"Experimental":[79],"results":[80],"conducted":[81],"on":[82],"PCB":[84],"demonstrate":[85],"this":[87],"significantly":[89],"improves":[90],"accuracy":[92,115],"parameter":[95],"measurements,":[96],"providing":[97],"technical":[98,126],"support":[99],"for":[100,128],"enhancing":[101],"performance":[103],"programmable":[105],"transceivers.":[107],"proposed":[109],"not":[111],"only":[112],"enhances":[113],"chip":[118],"testing":[119],"but":[120],"also":[121],"provides":[122],"new":[123],"insights":[124],"approaches":[127],"future":[129],"research":[130],"in":[131],"related":[132],"fields.":[133]},"counts_by_year":[],"updated_date":"2026-02-15T05:58:04.055770","created_date":"2026-02-14T00:00:00"}