{"id":"https://openalex.org/W4385574771","doi":"https://doi.org/10.1109/mim.2023.10208250","title":"President's Message","display_name":"President's Message","publication_year":2023,"publication_date":"2023-08-01","ids":{"openalex":"https://openalex.org/W4385574771","doi":"https://doi.org/10.1109/mim.2023.10208250"},"language":"en","primary_location":{"id":"doi:10.1109/mim.2023.10208250","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1109/mim.2023.10208250","pdf_url":"https://ieeexplore.ieee.org/ielx7/5289/10208247/10208250.pdf","source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation & Measurement Magazine","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://ieeexplore.ieee.org/ielx7/5289/10208247/10208250.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113053587","display_name":"Juan Manuel Ramirez Cort\u00e9s","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Juan Manuel Ramirez Cort\u00e9s","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5010404427","display_name":"Mark E. Davis","orcid":"https://orcid.org/0000-0001-8294-1477"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Mark E. Davis","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.1048044,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"26","issue":"5","first_page":"2","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.05719999969005585,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.05719999969005585,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/instrumentation","display_name":"Instrumentation (computer programming)","score":0.7396737337112427},{"id":"https://openalex.org/keywords/work","display_name":"Work (physics)","score":0.5315677523612976},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5306322574615479},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4348519444465637},{"id":"https://openalex.org/keywords/library-science","display_name":"Library science","score":0.39326488971710205},{"id":"https://openalex.org/keywords/operations-research","display_name":"Operations research","score":0.3358073830604553},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30215638875961304}],"concepts":[{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.7396737337112427},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.5315677523612976},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5306322574615479},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4348519444465637},{"id":"https://openalex.org/C161191863","wikidata":"https://www.wikidata.org/wiki/Q199655","display_name":"Library science","level":1,"score":0.39326488971710205},{"id":"https://openalex.org/C42475967","wikidata":"https://www.wikidata.org/wiki/Q194292","display_name":"Operations research","level":1,"score":0.3358073830604553},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30215638875961304},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mim.2023.10208250","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1109/mim.2023.10208250","pdf_url":"https://ieeexplore.ieee.org/ielx7/5289/10208247/10208250.pdf","source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation & Measurement Magazine","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/mim.2023.10208250","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1109/mim.2023.10208250","pdf_url":"https://ieeexplore.ieee.org/ielx7/5289/10208247/10208250.pdf","source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation & Measurement Magazine","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4385574771.pdf","grobid_xml":"https://content.openalex.org/works/W4385574771.grobid-xml"},"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W562823126","https://openalex.org/W2106037662","https://openalex.org/W2165392093","https://openalex.org/W1530419332","https://openalex.org/W2143942744","https://openalex.org/W2469134140","https://openalex.org/W2045782830","https://openalex.org/W1972557159","https://openalex.org/W2993874308","https://openalex.org/W2103102750"],"abstract_inverted_index":{"On":[0],"behalf":[1],"of":[2,17,60],"the":[3,18,43,47,78,98],"Instrumentation":[4,19],"and":[5,20,82,101],"Measurement":[6,21],"Society":[7],"(IMS)":[8],"I":[9,93],"welcome":[10],"you":[11,75],"all":[12],"to":[13,41,55,63,71,96],"this":[14,65,91,109],"special":[15,66],"edition":[16],"Magazine,":[22],"constituted":[23],"by":[24],"selected":[25],"papers":[26,44,62],"presented":[27,45],"during":[28],"AUTOTESTCON":[29],"2022.":[30],"The":[31],"Conference":[32],"Committee":[33],"has":[34],"carried":[35],"out":[36],"a":[37,50],"thorough":[38],"review":[39],"process":[40],"accept":[42],"at":[46],"conference.":[48],"Subsequently,":[49],"few":[51],"authors":[52],"were":[53],"invited":[54],"submit":[56],"an":[57,69],"extended":[58],"version":[59],"their":[61],"conform":[64],"issue":[67],"with":[68],"orientation":[70],"wide":[72],"audiences.":[73],"As":[74],"can":[76],"see,":[77],"Best":[79,83],"Student":[80],"Paper":[81,85],"Technical":[84],"are":[86],"also":[87],"proudly":[88],"included":[89],"in":[90,107],"edition.":[92],"would":[94],"like":[95],"congratulate":[97],"authors,":[99],"editors":[100],"reviewers":[102],"for":[103],"his":[104],"valuable":[105],"work":[106],"making":[108],"happen.":[110]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}