{"id":"https://openalex.org/W4300773812","doi":"https://doi.org/10.1109/mim.2022.9908270","title":"The IEEE Technical Committee 10-The Waveform Generation, Measurement, and Analysis Committee: Update 2021","display_name":"The IEEE Technical Committee 10-The Waveform Generation, Measurement, and Analysis Committee: Update 2021","publication_year":2022,"publication_date":"2022-10-03","ids":{"openalex":"https://openalex.org/W4300773812","doi":"https://doi.org/10.1109/mim.2022.9908270"},"language":"en","primary_location":{"id":"doi:10.1109/mim.2022.9908270","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mim.2022.9908270","pdf_url":null,"source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation &amp; Measurement Magazine","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074293414","display_name":"Luca De Vito","orcid":"https://orcid.org/0000-0003-1896-2614"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Luca De Vito","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079045760","display_name":"John Jendzurski","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"John Jendzurski","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010415569","display_name":"Sergio Rapuano","orcid":"https://orcid.org/0000-0003-3249-0473"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Sergio Rapuano","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040432047","display_name":"W.B. Boyer","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"William B. Boyer","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007708462","display_name":"Jerome Blair","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jerome Blair","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5016401002","display_name":"Nicholas G. Paulter","orcid":"https://orcid.org/0000-0002-9782-0894"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Nicholas G. Paulter","raw_affiliation_strings":[],"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5074293414"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2908,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.54016226,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"25","issue":"8","first_page":"16","last_page":"18"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9864000082015991,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12004","display_name":"Advanced Frequency and Time Standards","score":0.973800003528595,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.705452024936676},{"id":"https://openalex.org/keywords/terminology","display_name":"Terminology","score":0.5397544503211975},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5030204653739929},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4923356771469116},{"id":"https://openalex.org/keywords/instrumentation","display_name":"Instrumentation (computer programming)","score":0.4605864882469177},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.4316943883895874},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4281509816646576},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3671231269836426},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.35938042402267456},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14022859930992126}],"concepts":[{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.705452024936676},{"id":"https://openalex.org/C547195049","wikidata":"https://www.wikidata.org/wiki/Q1725664","display_name":"Terminology","level":2,"score":0.5397544503211975},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5030204653739929},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4923356771469116},{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.4605864882469177},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.4316943883895874},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4281509816646576},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3671231269836426},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.35938042402267456},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14022859930992126},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mim.2022.9908270","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mim.2022.9908270","pdf_url":null,"source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation &amp; Measurement Magazine","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/2","score":0.5099999904632568,"display_name":"Zero hunger"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2187548090","https://openalex.org/W2561992868","https://openalex.org/W2576558450","https://openalex.org/W2578654221","https://openalex.org/W3105215875","https://openalex.org/W3211078711","https://openalex.org/W4206678736","https://openalex.org/W4252406483"],"related_works":["https://openalex.org/W2350593162","https://openalex.org/W2390350206","https://openalex.org/W1969477129","https://openalex.org/W2921208823","https://openalex.org/W2353483812","https://openalex.org/W2131808775","https://openalex.org/W2130038259","https://openalex.org/W2360756181","https://openalex.org/W2374093222","https://openalex.org/W2359533638"],"abstract_inverted_index":{"The":[0,66,124],"IEEE":[1,15,134,145,154,167,180,194],"Technical":[2],"Committee":[3,12],"10":[4],"(TC-10),":[5],"the":[6,14,22,73,81,92,110,114,130,210],"Waveform":[7,151],"Generation,":[8],"Measurement,":[9],"and":[10,17,26,33,36,47,64,100,108,119,122,128,141,160,173,186,193,200,209],"Analysis":[11],"of":[13,24,78,116],"Instrumentation":[16],"Measurement":[18],"Society":[19],"(IMS),":[20],"supports":[21],"advancement":[23],"industries":[25],"other":[27],"entities":[28],"that":[29,38,103,112],"research,":[30],"develop,":[31],"manufacture,":[32],"use":[34],"technologies":[35],"instruments":[37],"generate":[39],"or":[40],"acquire":[41],"signals.":[42],"These":[43],"signals":[44],"are":[45,104],"ubiquitous":[46],"used":[48,105],"in":[49,215],"many":[50],"technologies,":[51],"such":[52],"as,":[53],"but":[54],"not":[55],"limited":[56],"to,":[57],"communication,":[58],"computing,":[59],"transportation,":[60],"medicine,":[61],"entertainment,":[62],"manufacturing,":[63],"agriculture.":[65],"TC-10":[67,74,125,211],"work,":[68],"therefore,":[69],"impacts":[70],"everyone.":[71],"Because":[72],"is":[75,84],"a":[76],"developer":[77],"documentary":[79,132],"standards,":[80],"TC-10's":[82],"goal":[83],"achieved":[85],"by":[86],"fulfilling,":[87],"as":[88,90],"best":[89],"possible,":[91],"global":[93],"need":[94],"for":[95,149,158,163,171,176,184,189,198],"standardized":[96],"terms,":[97],"test":[98],"methods,":[99],"computational":[101],"methods":[102],"to":[106],"describe":[107,113],"measure":[109],"parameters":[111],"performance":[115],"signal":[117],"generators":[118],"waveform":[120],"recorders":[121],"analyzers.":[123],"has":[126],"developed":[127],"maintains":[129],"following":[131],"standards:":[133],"Std":[135,146,155,168,181],"181\u20132011,":[136],"Standard":[137,148,157,170,183,197],"on":[138,206],"Transitions,":[139],"Pulses,":[140],"Related":[142],"Waveforms":[143],"[1];":[144],"1057\u20132017,":[147],"Digitizing":[150],"Recorders":[152],"[2];":[153],"1241\u20132010,":[156],"Terminology":[159,172,185],"Test":[161,174,187],"Methods":[162,175,188],"Analog-to-Digital":[164],"Converters":[165,178],"[3];":[166],"1658\u20132011,":[169],"Digital-to-Analog":[177],"[4];":[179],"1696\u20132013,":[182],"Circuit":[190],"Probes":[191],"[5];":[192],"Std.":[195],"2414\u20132020,":[196],"Jitter":[199],"Phase":[201],"Noise":[202],"[6].":[203],"Additional":[204],"information":[205],"these":[207],"standards":[208],"can":[212],"be":[213],"found":[214],"[7],":[216],"[8].":[217]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
