{"id":"https://openalex.org/W4210694665","doi":"https://doi.org/10.1109/mim.2022.9693455","title":"The Jitter Measurement Ways: The Instrumentation","display_name":"The Jitter Measurement Ways: The Instrumentation","publication_year":2022,"publication_date":"2022-01-25","ids":{"openalex":"https://openalex.org/W4210694665","doi":"https://doi.org/10.1109/mim.2022.9693455"},"language":"en","primary_location":{"id":"doi:10.1109/mim.2022.9693455","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mim.2022.9693455","pdf_url":null,"source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation & Measurement Magazine","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029530605","display_name":"Eulalia Balestrieri","orcid":"https://orcid.org/0000-0002-9155-5989"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Eulalia Balestrieri","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074293414","display_name":"Luca De Vito","orcid":"https://orcid.org/0000-0003-1896-2614"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Luca De Vito","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003087494","display_name":"Francesco Lamonaca","orcid":"https://orcid.org/0000-0002-6263-8929"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Francesco Lamonaca","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087692673","display_name":"Francesco Picariello","orcid":"https://orcid.org/0000-0001-6854-3026"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Francesco Picariello","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010415569","display_name":"Sergio Rapuano","orcid":"https://orcid.org/0000-0003-3249-0473"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Sergio Rapuano","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5087673689","display_name":"Ioan Tudosa","orcid":"https://orcid.org/0000-0002-5127-578X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ioan Tudosa","raw_affiliation_strings":[],"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5029530605"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.6404,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.64988312,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"25","issue":"1","first_page":"76","last_page":"82"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9934999942779541,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.9619492292404175},{"id":"https://openalex.org/keywords/schematic","display_name":"Schematic","score":0.6567515730857849},{"id":"https://openalex.org/keywords/instrumentation","display_name":"Instrumentation (computer programming)","score":0.6315519213676453},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.596153736114502},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.5881357789039612},{"id":"https://openalex.org/keywords/object","display_name":"Object (grammar)","score":0.436916708946228},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.38710686564445496},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36407625675201416},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2903493046760559},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.19364869594573975},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13182836771011353},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.08754593133926392}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.9619492292404175},{"id":"https://openalex.org/C192328126","wikidata":"https://www.wikidata.org/wiki/Q4514647","display_name":"Schematic","level":2,"score":0.6567515730857849},{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.6315519213676453},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.596153736114502},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.5881357789039612},{"id":"https://openalex.org/C2781238097","wikidata":"https://www.wikidata.org/wiki/Q175026","display_name":"Object (grammar)","level":2,"score":0.436916708946228},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.38710686564445496},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36407625675201416},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2903493046760559},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.19364869594573975},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13182836771011353},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.08754593133926392},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mim.2022.9693455","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mim.2022.9693455","pdf_url":null,"source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation & Measurement Magazine","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.49000000953674316,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W282702537","https://openalex.org/W1515792080","https://openalex.org/W1995199629","https://openalex.org/W2100924159","https://openalex.org/W2525847024","https://openalex.org/W2760651611","https://openalex.org/W2794101942","https://openalex.org/W2889420974","https://openalex.org/W2945722260","https://openalex.org/W2966213996","https://openalex.org/W3094287900","https://openalex.org/W4206678736","https://openalex.org/W4256045815"],"related_works":["https://openalex.org/W3154683910","https://openalex.org/W1846734616","https://openalex.org/W3134543635","https://openalex.org/W2121182846","https://openalex.org/W2359532622","https://openalex.org/W2921318524","https://openalex.org/W2377571686","https://openalex.org/W4380988671","https://openalex.org/W1925657225","https://openalex.org/W2315668284"],"abstract_inverted_index":{"Jitter":[0],"characterization":[1],"is":[2],"an":[3],"essential":[4],"requirement":[5],"for":[6,35],"different":[7],"applications":[8],"and":[9,18,24,37,52],"technologies.":[10],"For":[11],"this":[12,62],"reason,":[13],"measurement":[14,19],"approaches,":[15],"decomposition":[16],"methods":[17],"instruments":[20,41,73],"aimed":[21],"at":[22],"quantifying":[23],"analyzing":[25],"jitter":[26,60],"continue":[27],"to":[28,44],"be":[29],"object":[30],"of":[31,68,72],"great":[32],"interest":[33],"both":[34],"researchers":[36],"manufacturers.":[38],"Currently,":[39],"various":[40],"are":[42],"available":[43,74],"measure":[45],"jitter,":[46],"each":[47],"one":[48],"having":[49],"specific":[50],"advantages":[51],"disadvantages.":[53],"To":[54],"help":[55],"engineers":[56],"who":[57],"deal":[58],"with":[59],"measurements,":[61],"paper":[63],"provides":[64],"a":[65],"schematic":[66],"overview":[67],"the":[69,76],"main":[70],"types":[71],"on":[75],"market.":[77]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}