{"id":"https://openalex.org/W4210800601","doi":"https://doi.org/10.1109/mim.2022.9693445","title":"Measured Data Reliability for Building Performance and Maintenance","display_name":"Measured Data Reliability for Building Performance and Maintenance","publication_year":2022,"publication_date":"2022-01-25","ids":{"openalex":"https://openalex.org/W4210800601","doi":"https://doi.org/10.1109/mim.2022.9693445"},"language":"en","primary_location":{"id":"doi:10.1109/mim.2022.9693445","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mim.2022.9693445","pdf_url":null,"source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation & Measurement Magazine","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050263160","display_name":"Vinu Subashini Rajus","orcid":"https://orcid.org/0000-0002-1998-1190"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Vinu Subashini Rajus","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045367874","display_name":"Joseph Boi-Ukeme","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Joseph Boi-Ukeme","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003417776","display_name":"Rishabh Sudhir Jiresal","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Rishabh Sudhir Jiresal","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026638641","display_name":"Nicolas Arellano Risopatron","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Nicolas Arellano Risopatron","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060202866","display_name":"Pedram Nojedehi","orcid":"https://orcid.org/0000-0001-8053-8254"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Pedram Nojedehi","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030054278","display_name":"Gabriel Wainer","orcid":"https://orcid.org/0000-0003-3366-9184"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Gabriel Wainer","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091859718","display_name":"Liam O\u2019Brien","orcid":"https://orcid.org/0000-0002-8603-1347"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Liam O'Brien","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5079739064","display_name":"Stephen Fai","orcid":"https://orcid.org/0000-0003-2369-5442"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Stephen Fai","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5156,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.59182088,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"25","issue":"1","first_page":"55","last_page":"61"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11006","display_name":"BIM and Construction Integration","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2215","display_name":"Building and Construction"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11006","display_name":"BIM and Construction Integration","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2215","display_name":"Building and Construction"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12256","display_name":"Facilities and Workplace Management","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/3207","display_name":"Social Psychology"},"field":{"id":"https://openalex.org/fields/32","display_name":"Psychology"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T14138","display_name":"Life Cycle Costing Analysis","score":0.9666000008583069,"subfield":{"id":"https://openalex.org/subfields/1402","display_name":"Accounting"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6389254927635193},{"id":"https://openalex.org/keywords/building-industry","display_name":"Building industry","score":0.6024161577224731},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.6019882559776306},{"id":"https://openalex.org/keywords/architectural-engineering","display_name":"Architectural engineering","score":0.5840121507644653},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.48892155289649963},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4713294804096222},{"id":"https://openalex.org/keywords/construction-engineering","display_name":"Construction engineering","score":0.45340412855148315},{"id":"https://openalex.org/keywords/construction-industry","display_name":"Construction industry","score":0.41909945011138916},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4178307056427002},{"id":"https://openalex.org/keywords/building-construction","display_name":"Building construction","score":0.41515052318573},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4094172716140747},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.3337152600288391},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.10050958395004272}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6389254927635193},{"id":"https://openalex.org/C2988425146","wikidata":"https://www.wikidata.org/wiki/Q385378","display_name":"Building industry","level":2,"score":0.6024161577224731},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.6019882559776306},{"id":"https://openalex.org/C170154142","wikidata":"https://www.wikidata.org/wiki/Q150737","display_name":"Architectural engineering","level":1,"score":0.5840121507644653},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.48892155289649963},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4713294804096222},{"id":"https://openalex.org/C107053488","wikidata":"https://www.wikidata.org/wiki/Q2674423","display_name":"Construction engineering","level":1,"score":0.45340412855148315},{"id":"https://openalex.org/C2984708878","wikidata":"https://www.wikidata.org/wiki/Q385378","display_name":"Construction industry","level":2,"score":0.41909945011138916},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4178307056427002},{"id":"https://openalex.org/C3018062273","wikidata":"https://www.wikidata.org/wiki/Q385378","display_name":"Building construction","level":2,"score":0.41515052318573},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4094172716140747},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.3337152600288391},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.10050958395004272},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mim.2022.9693445","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mim.2022.9693445","pdf_url":null,"source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation & Measurement Magazine","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.6499999761581421}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2327557979","https://openalex.org/W2495825432","https://openalex.org/W2578214075","https://openalex.org/W2810716047","https://openalex.org/W2866521088","https://openalex.org/W3085733379","https://openalex.org/W3088858379","https://openalex.org/W3113181732","https://openalex.org/W3169403294","https://openalex.org/W6787539730"],"related_works":["https://openalex.org/W639628190","https://openalex.org/W607127520","https://openalex.org/W4206917229","https://openalex.org/W2809752820","https://openalex.org/W2601302534","https://openalex.org/W2384917809","https://openalex.org/W4205098990","https://openalex.org/W3123816922","https://openalex.org/W4213239445","https://openalex.org/W4250652583"],"abstract_inverted_index":{"Occupants'":[0],"health":[1,61],"and":[2,12,21],"well":[3],"being":[4],"are":[5],"becoming":[6],"the":[7,10,30,42,52],"focus":[8],"in":[9,51],"building":[11,45,53],"construction":[13],"industry.":[14],"Indoor":[15],"factors":[16],"like":[17],"thermal,":[18],"visual,":[19],"acoustic,":[20],"chemical":[22],"exposure":[23],"all":[24],"impact":[25,58],"occupants'":[26,60],"wellbeing.":[27],"One":[28],"of":[29,41],"main":[31],"approaches":[32],"to":[33,37],"improve":[34],"wellbeing":[35],"is":[36],"have":[38,56],"continuous":[39],"monitoring":[40],"building.":[43],"Similarly,":[44],"design":[46],"issues":[47],"or":[48],"technical":[49],"flaws":[50],"software":[54],"can":[55],"negative":[57],"on":[59],"[1].":[62]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}