{"id":"https://openalex.org/W3015766341","doi":"https://doi.org/10.1109/mim.2020.9062683","title":"Practical aspects of a pulse generator calibration","display_name":"Practical aspects of a pulse generator calibration","publication_year":2020,"publication_date":"2020-04-01","ids":{"openalex":"https://openalex.org/W3015766341","doi":"https://doi.org/10.1109/mim.2020.9062683","mag":"3015766341"},"language":"en","primary_location":{"id":"doi:10.1109/mim.2020.9062683","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mim.2020.9062683","pdf_url":null,"source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation &amp; Measurement Magazine","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hdl.handle.net/2117/191575","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070312234","display_name":"Martin Hudli\u010dka","orcid":"https://orcid.org/0000-0001-7304-7780"},"institutions":[{"id":"https://openalex.org/I4210124866","display_name":"\u010cesk\u00fd Metrologick\u00fd Institut","ror":"https://ror.org/02m5haa59","country_code":"CZ","type":"facility","lineage":["https://openalex.org/I4210124866"]}],"countries":["CZ"],"is_corresponding":true,"raw_author_name":"Martin Hudlicka","raw_affiliation_strings":["Czech metrology institute, Brno, Czech Republic"],"affiliations":[{"raw_affiliation_string":"Czech metrology institute, Brno, Czech Republic","institution_ids":["https://openalex.org/I4210124866"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014080475","display_name":"Marco A. Azp\u00farua","orcid":"https://orcid.org/0000-0001-8078-5116"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Marco A. Azpurua","raw_affiliation_strings":["Universitat Polit\u00e8cnica de Catalunya, Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"Universitat Polit\u00e8cnica de Catalunya, Barcelona, Spain","institution_ids":["https://openalex.org/I9617848"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053502057","display_name":"Murat Celep","orcid":"https://orcid.org/0000-0001-7754-4856"},"institutions":[{"id":"https://openalex.org/I4210124062","display_name":"T\u00fcbitak National Metrology Institute","ror":"https://ror.org/02zcjdk53","country_code":"TR","type":"facility","lineage":["https://openalex.org/I4210124062"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Murat Celep","raw_affiliation_strings":["TUBITAK Ulusal Metroloji Enstit\u00fcs\u00fc (UME), Gebze, Turkey"],"affiliations":[{"raw_affiliation_string":"TUBITAK Ulusal Metroloji Enstit\u00fcs\u00fc (UME), Gebze, Turkey","institution_ids":["https://openalex.org/I4210124062"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5070312234"],"corresponding_institution_ids":["https://openalex.org/I4210124866"],"apc_list":null,"apc_paid":null,"fwci":0.1039,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.40714638,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"23","issue":"2","first_page":"13","last_page":"20"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9879000186920166,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.7243004441261292},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.6272011399269104},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.6197627782821655},{"id":"https://openalex.org/keywords/emi","display_name":"EMI","score":0.611007571220398},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.5421643257141113},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5207222104072571},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5096173286437988},{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"Electromagnetic compatibility","score":0.47233930230140686},{"id":"https://openalex.org/keywords/pulse-generator","display_name":"Pulse generator","score":0.4700566530227661},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.4481208324432373},{"id":"https://openalex.org/keywords/conformance-testing","display_name":"Conformance testing","score":0.44666820764541626},{"id":"https://openalex.org/keywords/emphasis","display_name":"Emphasis (telecommunications)","score":0.42867782711982727},{"id":"https://openalex.org/keywords/signal-generator","display_name":"Signal generator","score":0.4237528145313263},{"id":"https://openalex.org/keywords/electromagnetic-pulse","display_name":"Electromagnetic pulse","score":0.4106651246547699},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3870668411254883},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.36097288131713867},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16754603385925293},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09831249713897705}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7243004441261292},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.6272011399269104},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.6197627782821655},{"id":"https://openalex.org/C43461449","wikidata":"https://www.wikidata.org/wiki/Q2495531","display_name":"EMI","level":3,"score":0.611007571220398},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.5421643257141113},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5207222104072571},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5096173286437988},{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.47233930230140686},{"id":"https://openalex.org/C51319974","wikidata":"https://www.wikidata.org/wiki/Q3509564","display_name":"Pulse generator","level":3,"score":0.4700566530227661},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4481208324432373},{"id":"https://openalex.org/C76844732","wikidata":"https://www.wikidata.org/wiki/Q4072285","display_name":"Conformance testing","level":3,"score":0.44666820764541626},{"id":"https://openalex.org/C177454536","wikidata":"https://www.wikidata.org/wiki/Q578290","display_name":"Emphasis (telecommunications)","level":2,"score":0.42867782711982727},{"id":"https://openalex.org/C207912722","wikidata":"https://www.wikidata.org/wiki/Q1259123","display_name":"Signal generator","level":3,"score":0.4237528145313263},{"id":"https://openalex.org/C14589660","wikidata":"https://www.wikidata.org/wiki/Q64122","display_name":"Electromagnetic pulse","level":2,"score":0.4106651246547699},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3870668411254883},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.36097288131713867},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16754603385925293},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09831249713897705},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/mim.2020.9062683","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mim.2020.9062683","pdf_url":null,"source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation &amp; Measurement Magazine","raw_type":"journal-article"},{"id":"pmh:oai:upcommons.upc.edu:2117/191575","is_oa":true,"landing_page_url":"https://hdl.handle.net/2117/191575","pdf_url":null,"source":{"id":"https://openalex.org/S4210207057","display_name":"QRU Quaderns de Recerca en Urbanisme","issn_l":"2014-9689","issn":["2014-9689","2385-6777"],"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310322448","host_organization_name":"Q71272178","host_organization_lineage":["https://openalex.org/P4310322448"],"host_organization_lineage_names":["Q71272178"],"type":"journal"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:dnet:upcommonspor::bdbb6c3ae39672ee615c63bc004a17ec","is_oa":true,"landing_page_url":"http://hdl.handle.net/2117/191575","pdf_url":null,"source":{"id":"https://openalex.org/S4306402641","display_name":"LA Referencia (Red Federada de Repositorios Institucionales de Publicaciones Cient\u00edficas)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4383465926","host_organization_name":"LA Referencia","host_organization_lineage":["https://openalex.org/I4383465926"],"host_organization_lineage_names":[],"type":"repository"},"license":"public-domain","license_id":"https://openalex.org/licenses/public-domain","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/submittedVersion"}],"best_oa_location":{"id":"pmh:oai:upcommons.upc.edu:2117/191575","is_oa":true,"landing_page_url":"https://hdl.handle.net/2117/191575","pdf_url":null,"source":{"id":"https://openalex.org/S4210207057","display_name":"QRU Quaderns de Recerca en Urbanisme","issn_l":"2014-9689","issn":["2014-9689","2385-6777"],"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310322448","host_organization_name":"Q71272178","host_organization_lineage":["https://openalex.org/P4310322448"],"host_organization_lineage_names":["Q71272178"],"type":"journal"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.4099999964237213,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2008457587","https://openalex.org/W2008849167","https://openalex.org/W2139695676","https://openalex.org/W2521521868","https://openalex.org/W2763948710","https://openalex.org/W2792204015","https://openalex.org/W2794313214","https://openalex.org/W2962548383","https://openalex.org/W4245618853"],"related_works":["https://openalex.org/W2546728196","https://openalex.org/W1480498310","https://openalex.org/W4251032928","https://openalex.org/W4206560771","https://openalex.org/W2545836076","https://openalex.org/W2077870190","https://openalex.org/W2367110990","https://openalex.org/W1652885902","https://openalex.org/W1985317999","https://openalex.org/W1995150619"],"abstract_inverted_index":{"Measuring":[0],"receivers":[1,20,27,41],"are":[2,42,67,139],"used":[3],"for":[4,39,186],"measurement":[5,142],"of":[6,74,77,82,94,110,131,144,174],"radio":[7],"disturbance":[8],"in":[9,44,99,152,159],"the":[10,32,71,78,100,107,111,122,132,145,153],"frequency":[11],"range":[12],"typically":[13],"9":[14],"kHz":[15],"to":[16,168],"18":[17],"GHz.":[18],"Such":[19],"can":[21],"be":[22,184],"either":[23],"electromagnetic":[24],"interference":[25],"(EMI)":[26],"or":[28],"spectrum":[29],"analyzers":[30],"with":[31,80,179],"quasi-peak":[33],"(QP)":[34],"detector":[35],"[1],":[36],"[2].":[37],"Requirements":[38],"measuring":[40],"discussed":[43,98,151,158],"European":[45],"CISPR":[46,115],"documents":[47],"(Comit\u00e9":[48],"International":[49],"Sp\u00e9cial":[50],"des":[51],"Perturbations":[52],"Radio\u00e9lectriques)":[53],"and":[54,136,190],"US":[55],"standards":[56,84],"ANSI":[57],"63.2":[58],"(QP":[59],"parts":[60],"derived":[61],"from":[62],"CISPR).":[63],"Although":[64],"novel":[65],"techniques":[66],"being":[68],"evaluated":[69],"[3],":[70],"traditional":[72],"way":[73],"checking":[75],"compliance":[76],"receiver":[79],"requirements":[81],"these":[83],"is":[85,97,106,134,149],"using":[86],"a":[87,127,170],"calibrated":[88],"pulse":[89,95,146],"generator":[90,147],"[4].":[91],"The":[92,141],"calibration":[93,176,188],"generators":[96],"standard":[101,113,123],"EN":[102],"55016-1-1":[103],"[5],":[104,124],"which":[105,182],"harmonized":[108],"version":[109],"international":[112],"IEC/":[114],"16-1-1":[116],"(currently":[117],"Ed.":[118],"4)":[119],"[6].":[120],"In":[121],"however,":[125,155],"only":[126],"very":[128],"brief":[129],"description":[130,173],"methods":[133,177],"given":[135],"technical":[137],"details":[138],"hidden.":[140],"uncertainty":[143],"characterization":[148],"not":[150],"standards;":[154],"it":[156],"was":[157],"several":[160],"previous":[161],"works":[162],"[7],":[163],"[8].":[164],"This":[165],"paper":[166],"aims":[167],"provide":[169],"more":[171],"thorough":[172],"particular":[175],"together":[178],"practical":[180],"hints":[181],"may":[183],"useful":[185],"students,":[187],"engineers":[189],"practitioners.":[191]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}
