{"id":"https://openalex.org/W3015432977","doi":"https://doi.org/10.1109/mim.2020.9062677","title":"Guest editorial: Instrumentation and measurement in central and Eastern Europe","display_name":"Guest editorial: Instrumentation and measurement in central and Eastern Europe","publication_year":2020,"publication_date":"2020-04-01","ids":{"openalex":"https://openalex.org/W3015432977","doi":"https://doi.org/10.1109/mim.2020.9062677","mag":"3015432977"},"language":"en","primary_location":{"id":"doi:10.1109/mim.2020.9062677","is_oa":true,"landing_page_url":"https://doi.org/10.1109/mim.2020.9062677","pdf_url":"https://ieeexplore.ieee.org/ielx7/5289/9062670/09062677.pdf","source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation & Measurement Magazine","raw_type":"journal-article"},"type":"editorial","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://ieeexplore.ieee.org/ielx7/5289/9062670/09062677.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006531391","display_name":"Daniel Belega","orcid":"https://orcid.org/0000-0002-4520-9292"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Daniel Belega","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5082256895","display_name":"Vedran Bilas","orcid":"https://orcid.org/0000-0003-1785-2915"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Vedran Bilas","raw_affiliation_strings":[],"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5006531391"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.05037745,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"23","issue":"2","first_page":"3","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.7621999979019165,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.7621999979019165,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/instrumentation","display_name":"Instrumentation (computer programming)","score":0.8484433889389038},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.6420974731445312},{"id":"https://openalex.org/keywords/work","display_name":"Work (physics)","score":0.518089234828949},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5064908266067505},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5050764679908752},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.48991578817367554},{"id":"https://openalex.org/keywords/biomedicine","display_name":"Biomedicine","score":0.42901021242141724},{"id":"https://openalex.org/keywords/engineering-management","display_name":"Engineering management","score":0.4221703112125397},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3883565664291382},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.1601209044456482},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07865756750106812}],"concepts":[{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.8484433889389038},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.6420974731445312},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.518089234828949},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5064908266067505},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5050764679908752},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.48991578817367554},{"id":"https://openalex.org/C66782513","wikidata":"https://www.wikidata.org/wiki/Q864601","display_name":"Biomedicine","level":2,"score":0.42901021242141724},{"id":"https://openalex.org/C110354214","wikidata":"https://www.wikidata.org/wiki/Q6314146","display_name":"Engineering management","level":1,"score":0.4221703112125397},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3883565664291382},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.1601209044456482},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07865756750106812},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mim.2020.9062677","is_oa":true,"landing_page_url":"https://doi.org/10.1109/mim.2020.9062677","pdf_url":"https://ieeexplore.ieee.org/ielx7/5289/9062670/09062677.pdf","source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation & Measurement Magazine","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/mim.2020.9062677","is_oa":true,"landing_page_url":"https://doi.org/10.1109/mim.2020.9062677","pdf_url":"https://ieeexplore.ieee.org/ielx7/5289/9062670/09062677.pdf","source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation & Measurement Magazine","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/2","display_name":"Zero hunger","score":0.5799999833106995}],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3015432977.pdf","grobid_xml":"https://content.openalex.org/works/W3015432977.grobid-xml"},"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2017899917","https://openalex.org/W2080571363","https://openalex.org/W2481322495","https://openalex.org/W2898682754","https://openalex.org/W2993874308","https://openalex.org/W2363498374","https://openalex.org/W2152596889","https://openalex.org/W2489600020","https://openalex.org/W1497201623"],"abstract_inverted_index":{"Nowadays,":[0],"Instrumentation":[1],"and":[2,14,26,41,44,56,62,70,116],"Measurement":[3],"(I&M)":[4],"play":[5],"a":[6],"very":[7,37],"important":[8],"role":[9],"in":[10,67,92,99,114],"all":[11],"science":[12],"domains":[13],"industry.":[15],"The":[16],"involved":[17],"researchers":[18,113],"around":[19],"the":[20,30,45,80,84,89,93,107,128],"world":[21],"from":[22,112],"universities,":[23],"metrology":[24],"institutes,":[25],"industry":[27],"work":[28],"on":[29],"development":[31],"of":[32,47,106],"new":[33],"accurate":[34],"measurement":[35,52,63],"techniques,":[36],"low":[38],"uncertainty":[39],"instruments,":[40],"smart":[42],"sensors":[43],"evaluation":[46],"their":[48,100],"performances.":[49],"Also,":[50],"current":[51],"standards":[53],"are":[54,73],"analyzed":[55],"improved.":[57],"New":[58],"solutions":[59],"for":[60],"sensing":[61],"related":[64],"to":[65,79,96],"challenges":[66],"biomedicine,":[68],"environment,":[69],"food":[71],"production":[72],"developed.":[74],"Special":[75],"attention":[76],"is":[77],"given":[78],"educational":[81],"aspect.":[82],"Thus,":[83],"students":[85],"should":[86],"learn":[87],"about":[88],"recent":[90],"developments":[91],"I&M":[94,108,130],"field":[95],"gain":[97],"skills":[98],"application.":[101],"In":[102],"this":[103],"special":[104],"issue":[105],"Magazine,":[109],"eight":[110],"papers":[111,125],"Central":[115],"Eastern":[117],"Europe":[118],"(IEEE":[119],"Region":[120],"8)":[121],"were":[122],"invited.":[123],"These":[124],"deal":[126],"with":[127],"above":[129],"aspects.":[131]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}