{"id":"https://openalex.org/W2966213996","doi":"https://doi.org/10.1109/mim.2019.8782200","title":"The jitter measurement ways: The jitter graphs","display_name":"The jitter measurement ways: The jitter graphs","publication_year":2019,"publication_date":"2019-07-30","ids":{"openalex":"https://openalex.org/W2966213996","doi":"https://doi.org/10.1109/mim.2019.8782200","mag":"2966213996"},"language":"en","primary_location":{"id":"doi:10.1109/mim.2019.8782200","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mim.2019.8782200","pdf_url":null,"source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation & Measurement Magazine","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029530605","display_name":"Eulalia Balestrieri","orcid":"https://orcid.org/0000-0002-9155-5989"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"Eulalia Balestrieri","raw_affiliation_strings":["Vision for Robotics Laboratory, Automation and Control Institute, TU Wien, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"Vision for Robotics Laboratory, Automation and Control Institute, TU Wien, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087692673","display_name":"Francesco Picariello","orcid":"https://orcid.org/0000-0001-6854-3026"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Francesco Picariello","raw_affiliation_strings":["Vision for Robotics Laboratory, Automation and Control Institute, TU Wien, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"Vision for Robotics Laboratory, Automation and Control Institute, TU Wien, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010415569","display_name":"Sergio Rapuano","orcid":"https://orcid.org/0000-0003-3249-0473"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Sergio Rapuano","raw_affiliation_strings":["Vision for Robotics Laboratory, Automation and Control Institute, TU Wien, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"Vision for Robotics Laboratory, Automation and Control Institute, TU Wien, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087673689","display_name":"Ioan Tudosa","orcid":"https://orcid.org/0000-0002-5127-578X"},"institutions":[{"id":"https://openalex.org/I16337185","display_name":"University of Sannio","ror":"https://ror.org/04vc81p87","country_code":"IT","type":"education","lineage":["https://openalex.org/I16337185"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Ioan Tudosa","raw_affiliation_strings":["Universita degli Studi del Sannio, Benevento, Campania, IT"],"affiliations":[{"raw_affiliation_string":"Universita degli Studi del Sannio, Benevento, Campania, IT","institution_ids":["https://openalex.org/I16337185"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5029530605"],"corresponding_institution_ids":["https://openalex.org/I145847075"],"apc_list":null,"apc_paid":null,"fwci":0.3783,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.58761545,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"22","issue":"4","first_page":"50","last_page":"57"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14163","display_name":"Astronomical Observations and Instrumentation","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14163","display_name":"Astronomical Observations and Instrumentation","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11750","display_name":"Phytoplasmas and Hemiptera pathogens","score":0.9419999718666077,"subfield":{"id":"https://openalex.org/subfields/1110","display_name":"Plant Science"},"field":{"id":"https://openalex.org/fields/11","display_name":"Agricultural and Biological Sciences"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9000999927520752,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.9445114135742188},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5195463299751282},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.28892672061920166}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.9445114135742188},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5195463299751282},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.28892672061920166}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mim.2019.8782200","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mim.2019.8782200","pdf_url":null,"source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation & Measurement Magazine","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5099999904632568}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1995199629","https://openalex.org/W2096974486","https://openalex.org/W2168901237","https://openalex.org/W2176700360","https://openalex.org/W2689496271","https://openalex.org/W2794101942"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2121182846","https://openalex.org/W2315668284","https://openalex.org/W2155789024","https://openalex.org/W2109491806","https://openalex.org/W3213608175","https://openalex.org/W2058044441","https://openalex.org/W3117675750","https://openalex.org/W4321068651","https://openalex.org/W2141743053"],"abstract_inverted_index":{"In":[0],"recent":[1],"years,":[2],"jitter":[3,28,76],"characterization":[4],"has":[5],"acquired":[6],"an":[7,73],"ever":[8],"greater":[9],"importance":[10],"for":[11],"many":[12],"applications":[13],"and":[14,33,53,82],"standard":[15],"technologies.":[16],"As":[17],"a":[18],"consequence,":[19],"several":[20],"measurement":[21,34],"approaches":[22],"have":[23],"been":[24],"developed,":[25],"including":[26],"different":[27],"graphical":[29,77],"representations,":[30,78],"decomposition":[31],"methods":[32],"instruments":[35],"that":[36],"can":[37,58],"be":[38,59],"used":[39],"singularly":[40],"or":[41,55],"together.":[42],"Unfortunately,":[43],"choosing":[44],"the":[45,50,67],"approach":[46],"most":[47],"suited":[48],"to":[49],"particular":[51],"need":[52],"/":[54],"specific":[56],"application":[57],"very":[60],"hard.":[61],"To":[62],"help":[63],"engineers":[64],"dealing":[65],"with":[66],"graph":[68],"choice,":[69],"this":[70],"paper":[71],"provides":[72],"overview":[74],"of":[75],"highlighting":[79],"their":[80],"limitations":[81],"advantages.":[83]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}