{"id":"https://openalex.org/W2946114049","doi":"https://doi.org/10.1109/mim.2019.8716269","title":"The units for mass, voltage, resistance, and electrical current in the SI","display_name":"The units for mass, voltage, resistance, and electrical current in the SI","publication_year":2019,"publication_date":"2019-05-15","ids":{"openalex":"https://openalex.org/W2946114049","doi":"https://doi.org/10.1109/mim.2019.8716269","mag":"2946114049"},"language":"en","primary_location":{"id":"doi:10.1109/mim.2019.8716269","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mim.2019.8716269","pdf_url":null,"source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation & Measurement Magazine","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073846453","display_name":"Stephan Schlamminger","orcid":"https://orcid.org/0000-0002-9270-4018"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Stephan Schlamminger","raw_affiliation_strings":["National Institute of Standards and Technology in Gaithersburg, Maryland"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology in Gaithersburg, Maryland","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113537616","display_name":"Patrick J. Abbott","orcid":null},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Patrick Abbott","raw_affiliation_strings":["Mass and Force Group, National Institute of Standards and Technology (NIST)"],"affiliations":[{"raw_affiliation_string":"Mass and Force Group, National Institute of Standards and Technology (NIST)","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049506774","display_name":"Zeina J. Kubarych","orcid":"https://orcid.org/0000-0003-4053-4683"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zeina Kubarych","raw_affiliation_strings":["Mass and Force Group, National Institute of Standards and Technology, USA"],"affiliations":[{"raw_affiliation_string":"Mass and Force Group, National Institute of Standards and Technology, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043286311","display_name":"Dean G. Jarrett","orcid":"https://orcid.org/0000-0003-1392-423X"},"institutions":[{"id":"https://openalex.org/I4210124755","display_name":"National Institute of Standards","ror":"https://ror.org/02zftm050","country_code":"EG","type":"facility","lineage":["https://openalex.org/I4210124755"]},{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["EG","US"],"is_corresponding":false,"raw_author_name":"Dean Jarrett","raw_affiliation_strings":["Metrology of the Ohm, National Institute of Standards and Technology"],"affiliations":[{"raw_affiliation_string":"Metrology of the Ohm, National Institute of Standards and Technology","institution_ids":["https://openalex.org/I4210124755","https://openalex.org/I1321296531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078951512","display_name":"Randolph E. Elmquist","orcid":"https://orcid.org/0000-0001-9041-7966"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I4210124755","display_name":"National Institute of Standards","ror":"https://ror.org/02zftm050","country_code":"EG","type":"facility","lineage":["https://openalex.org/I4210124755"]}],"countries":["EG","US"],"is_corresponding":false,"raw_author_name":"Randolph Elmquist","raw_affiliation_strings":["National Institute of Standards and Technology"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology","institution_ids":["https://openalex.org/I4210124755","https://openalex.org/I1321296531"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5073846453"],"corresponding_institution_ids":["https://openalex.org/I1321296531"],"apc_list":null,"apc_paid":null,"fwci":0.9677,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.80570287,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"22","issue":"3","first_page":"9","last_page":"16"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9804999828338623,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13414","display_name":"Radioactive Decay and Measurement Techniques","score":0.9627000093460083,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ohm","display_name":"Ohm","score":0.9404058456420898},{"id":"https://openalex.org/keywords/kilogram","display_name":"Kilogram","score":0.8566392660140991},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.7536329627037048},{"id":"https://openalex.org/keywords/international-system-of-units","display_name":"International System of Units","score":0.7379242777824402},{"id":"https://openalex.org/keywords/ampere","display_name":"Ampere","score":0.6787506937980652},{"id":"https://openalex.org/keywords/units-of-measurement","display_name":"Units of measurement","score":0.5964237451553345},{"id":"https://openalex.org/keywords/unit","display_name":"Unit (ring theory)","score":0.542181134223938},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5325217843055725},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5274639129638672},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.4749467670917511},{"id":"https://openalex.org/keywords/volt","display_name":"Volt","score":0.4726606607437134},{"id":"https://openalex.org/keywords/base","display_name":"Base (topology)","score":0.43804487586021423},{"id":"https://openalex.org/keywords/electrical-resistance-and-conductance","display_name":"Electrical resistance and conductance","score":0.43052026629447937},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.34419625997543335},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3433200418949127},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2918083071708679},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.1383390724658966},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.12486663460731506},{"id":"https://openalex.org/keywords/mathematics-education","display_name":"Mathematics education","score":0.11423197388648987}],"concepts":[{"id":"https://openalex.org/C32211213","wikidata":"https://www.wikidata.org/wiki/Q47083","display_name":"Ohm","level":2,"score":0.9404058456420898},{"id":"https://openalex.org/C207892153","wikidata":"https://www.wikidata.org/wiki/Q11570","display_name":"Kilogram","level":3,"score":0.8566392660140991},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.7536329627037048},{"id":"https://openalex.org/C87585026","wikidata":"https://www.wikidata.org/wiki/Q12457","display_name":"International System of Units","level":3,"score":0.7379242777824402},{"id":"https://openalex.org/C4941483","wikidata":"https://www.wikidata.org/wiki/Q25272","display_name":"Ampere","level":3,"score":0.6787506937980652},{"id":"https://openalex.org/C151233233","wikidata":"https://www.wikidata.org/wiki/Q47574","display_name":"Units of measurement","level":2,"score":0.5964237451553345},{"id":"https://openalex.org/C122637931","wikidata":"https://www.wikidata.org/wiki/Q118084","display_name":"Unit (ring theory)","level":2,"score":0.542181134223938},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5325217843055725},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5274639129638672},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.4749467670917511},{"id":"https://openalex.org/C157985801","wikidata":"https://www.wikidata.org/wiki/Q25250","display_name":"Volt","level":3,"score":0.4726606607437134},{"id":"https://openalex.org/C42058472","wikidata":"https://www.wikidata.org/wiki/Q810214","display_name":"Base (topology)","level":2,"score":0.43804487586021423},{"id":"https://openalex.org/C94857076","wikidata":"https://www.wikidata.org/wiki/Q106603432","display_name":"Electrical resistance and conductance","level":2,"score":0.43052026629447937},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.34419625997543335},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3433200418949127},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2918083071708679},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.1383390724658966},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.12486663460731506},{"id":"https://openalex.org/C145420912","wikidata":"https://www.wikidata.org/wiki/Q853077","display_name":"Mathematics education","level":1,"score":0.11423197388648987},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C147583825","wikidata":"https://www.wikidata.org/wiki/Q620876","display_name":"Body weight","level":2,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mim.2019.8716269","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mim.2019.8716269","pdf_url":null,"source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation & Measurement Magazine","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","score":0.46000000834465027,"id":"https://metadata.un.org/sdg/11"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1191304555","https://openalex.org/W1783188183","https://openalex.org/W1870912220","https://openalex.org/W1968814407","https://openalex.org/W2061000251","https://openalex.org/W2090296656","https://openalex.org/W2154459920","https://openalex.org/W2524286052","https://openalex.org/W2525912394","https://openalex.org/W2526158836","https://openalex.org/W2566706182","https://openalex.org/W2766378176","https://openalex.org/W2790484061","https://openalex.org/W2946623289"],"related_works":["https://openalex.org/W2948000342","https://openalex.org/W4252316133","https://openalex.org/W2095913865","https://openalex.org/W2087748948","https://openalex.org/W2945913350","https://openalex.org/W2946114049","https://openalex.org/W2910316021","https://openalex.org/W2945954498","https://openalex.org/W2023871496","https://openalex.org/W3088412252"],"abstract_inverted_index":{"On":[0],"May":[1],"20,":[2],"World":[3],"Metrology":[4],"Day":[5],"2019,":[6],"the":[7,20,27,50,75,81,85,88],"international":[8],"system":[9,22],"of":[10,49,57,77,83],"units":[11,35,90],"(SI)":[12],"underwent":[13],"a":[14,45],"momentous":[15],"change.":[16],"The":[17],"philosophy":[18],"behind":[19],"unit":[21,82],"was":[23],"altered":[24],"by":[25,53],"replacing":[26],"former":[28],"definitions":[29,62],"that":[30],"rely":[31],"on":[32],"seven":[33,37],"base":[34],"with":[36],"defining":[38],"physical":[39],"constants":[40],"to":[41],"be":[42],"used":[43],"as":[44],"basis":[46],"for":[47,80],"realizations":[48],"units.":[51],"Supported":[52],"results":[54],"from":[55],"decades":[56],"precise":[58],"measurements,":[59],"four":[60,64],"new":[61],"and":[63,87,93],"fixed":[65],"numerical":[66],"values":[67],"were":[68],"assigned.":[69],"In":[70],"this":[71,78],"article,":[72],"we":[73],"discuss":[74],"significance":[76],"change":[79],"mass":[84],"kilogram":[86],"electrical":[89],"ampere,":[91],"volt,":[92],"ohm.":[94]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}