{"id":"https://openalex.org/W2040744269","doi":"https://doi.org/10.1109/mim.2013.6495682","title":"Efficacy of the frequency and damping estimation of a real-value sinusoid Part 44 in a series of tutorials on instrumentation and measurement","display_name":"Efficacy of the frequency and damping estimation of a real-value sinusoid Part 44 in a series of tutorials on instrumentation and measurement","publication_year":2013,"publication_date":"2013-04-01","ids":{"openalex":"https://openalex.org/W2040744269","doi":"https://doi.org/10.1109/mim.2013.6495682","mag":"2040744269"},"language":"en","primary_location":{"id":"doi:10.1109/mim.2013.6495682","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mim.2013.6495682","pdf_url":null,"source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation & Measurement Magazine","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033243576","display_name":"Krzysztof Duda","orcid":"https://orcid.org/0000-0003-3827-8553"},"institutions":[{"id":"https://openalex.org/I686019","display_name":"AGH University of Krakow","ror":"https://ror.org/00bas1c41","country_code":"PL","type":"education","lineage":["https://openalex.org/I686019"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Krzysztof Duda","raw_affiliation_strings":["Department of Measurement, Instrumentation and Electronics, AGH University of Science and Technology, Krakow, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Measurement, Instrumentation and Electronics, AGH University of Science and Technology, Krakow, Poland","institution_ids":["https://openalex.org/I686019"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000440934","display_name":"Tomasz P. Zieli\u0144ski","orcid":"https://orcid.org/0000-0001-5078-522X"},"institutions":[{"id":"https://openalex.org/I686019","display_name":"AGH University of Krakow","ror":"https://ror.org/00bas1c41","country_code":"PL","type":"education","lineage":["https://openalex.org/I686019"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Tomasz P. Zielinski","raw_affiliation_strings":["Department of Telecommunications, AGH University of Science and Technology, Krakow, Poland","Department of Telecommunications, AGH University of Science and Technology , Krak\u00f3w, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Telecommunications, AGH University of Science and Technology, Krakow, Poland","institution_ids":["https://openalex.org/I686019"]},{"raw_affiliation_string":"Department of Telecommunications, AGH University of Science and Technology , Krak\u00f3w, Poland","institution_ids":["https://openalex.org/I686019"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I686019"],"apc_list":null,"apc_paid":null,"fwci":2.6404,"has_fulltext":false,"cited_by_count":38,"citation_normalized_percentile":{"value":0.90585424,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"16","issue":"2","first_page":"48","last_page":"58"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10534","display_name":"Structural Health Monitoring Techniques","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5564600825309753},{"id":"https://openalex.org/keywords/frequency-domain","display_name":"Frequency domain","score":0.5400484800338745},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.485371470451355},{"id":"https://openalex.org/keywords/white-noise","display_name":"White noise","score":0.44231465458869934},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.4264363646507263},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.33272403478622437},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.32573333382606506},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.29545557498931885},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27144157886505127},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.22868934273719788},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.15553787350654602},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.11754253506660461},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10330435633659363}],"concepts":[{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5564600825309753},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.5400484800338745},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.485371470451355},{"id":"https://openalex.org/C112633086","wikidata":"https://www.wikidata.org/wiki/Q381287","display_name":"White noise","level":2,"score":0.44231465458869934},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4264363646507263},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.33272403478622437},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.32573333382606506},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.29545557498931885},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27144157886505127},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.22868934273719788},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.15553787350654602},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.11754253506660461},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10330435633659363},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mim.2013.6495682","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mim.2013.6495682","pdf_url":null,"source":{"id":"https://openalex.org/S121167460","display_name":"IEEE Instrumentation & Measurement Magazine","issn_l":"1094-6969","issn":["1094-6969","1941-0123"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Instrumentation & Measurement Magazine","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4099999964237213,"id":"https://metadata.un.org/sdg/4","display_name":"Quality Education"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W1527765362","https://openalex.org/W1545496238","https://openalex.org/W1597732836","https://openalex.org/W1602659231","https://openalex.org/W1993055148","https://openalex.org/W1996348247","https://openalex.org/W1999810742","https://openalex.org/W2015881065","https://openalex.org/W2021123050","https://openalex.org/W2042094536","https://openalex.org/W2061171222","https://openalex.org/W2065656021","https://openalex.org/W2067718036","https://openalex.org/W2083473582","https://openalex.org/W2083637937","https://openalex.org/W2089700633","https://openalex.org/W2100567194","https://openalex.org/W2105292630","https://openalex.org/W2107115183","https://openalex.org/W2111460811","https://openalex.org/W2120842456","https://openalex.org/W2127411941","https://openalex.org/W2128133720","https://openalex.org/W2146884793","https://openalex.org/W2149070701","https://openalex.org/W2149122607","https://openalex.org/W2149392240","https://openalex.org/W2158589846","https://openalex.org/W2158823920","https://openalex.org/W2159540673","https://openalex.org/W2165887549","https://openalex.org/W2167218293","https://openalex.org/W2170332089","https://openalex.org/W2478884216","https://openalex.org/W2984139959","https://openalex.org/W4211205285","https://openalex.org/W4249762338","https://openalex.org/W6631625273"],"related_works":["https://openalex.org/W4210376836","https://openalex.org/W4210925376","https://openalex.org/W2378774807","https://openalex.org/W2115273602","https://openalex.org/W2076145139","https://openalex.org/W2019602065","https://openalex.org/W914688845","https://openalex.org/W2152217203","https://openalex.org/W2008709934","https://openalex.org/W2367225802"],"abstract_inverted_index":{"Sinusoidal":[0],"and":[1,15,39,52,68,113,121,139,146,168,189,211,226,234,244],"damped":[2,157],"sinusoidal":[3,100,131,158],"signals":[4],"are":[5],"common":[6],"in":[7,20,74],"different":[8],"branches":[9],"of":[10,13,143,265],"engineering.":[11],"Estimation":[12],"frequency":[14,67,169],"damping":[16,69],"is":[17,59,241,257,268],"very":[18,60],"important":[19],"many":[21],"fields":[22],"[1]\u2013[15],":[23],"e.g.,":[24],"linear":[25],"system":[26,36],"identification,":[27],"speech":[28],"processing,":[29,31],"image":[30],"transient":[32],"analysis,":[33,37],"electric":[34],"power":[35],"radar":[38],"sonar":[40],"systems,":[41],"communication,":[42],"nuclear":[43],"magnetic":[44],"resonance":[45],"spectroscopy":[46],"(NMRS),":[47],"mechanical":[48],"spectroscopy,":[49],"economics,":[50],"seismology,":[51],"others.":[53],"The":[54,262],"literature":[55],"on":[56,87],"the":[57,75,88,91,152,197,201,205,216,231,246],"subject":[58],"rich.":[61],"Recently":[62],"an":[63,129],"interesting":[64],"introduction":[65],"to":[66,224,242],"estimation":[70,118],"methods":[71,89,142,199],"was":[72],"published":[73],"IEEE":[76],"Instrumentation":[77],"&":[78],"Measurement":[79],"Magazine":[80],"[15].":[81],"In":[82,108],"this":[83,192,266],"paper,":[84],"we":[85,115,194],"focus":[86],"with":[90,134,161,222,230],"best":[92,198,247],"performance":[93],"for":[94,128,149,156],"a":[95,252,258,271],"single":[96],"component,":[97],"damped,":[98],"real-valued":[99,253],"signal":[101,132,159,254,267],"disturbed":[102,269],"by":[103,270],"additive":[104],"white":[105],"Gaussian":[106],"noise.":[107],"our":[109],"previous":[110],"works":[111],"[14]":[112],"[16]\u2013[18],":[114],"investigated":[116],"these":[117],"methods,":[119],"two-point":[120],"three-point":[122],"interpolated":[123],"Discrete":[124],"Fourier":[125],"Transform":[126],"(IpDFT)":[127],"undamped":[130],"analyzed":[133,160],"Rife-Vincent":[135,162],"class":[136,163],"I,":[137],"Kaiser-Bessel":[138],"Dolph-Chebyshev":[140],"windows,":[141,165],"Bertocco,":[144],"Yoshida":[145],"Bertocco-Yoshida":[147,206],"family":[148],"orders":[150],"0-3,":[151],"Agrez":[153],"algorithm,":[154],"IpDFT":[155],"I":[164],"time":[166],"domain":[167,170],"Least":[171],"Squares":[172],"(LS)":[173],"optimization,":[174],"Hilbert":[175],"transform,":[176],"covariance,":[177],"Prony,":[178],"iterative":[179,217],"Steiglitz-McBride":[180],"(STMB),":[181],"Kumaresan-Tufts,":[182],"total":[183],"least":[184],"squares,":[185],"Matrix":[186],"Pencil":[187],"(MatPen),":[188],"Pisarenko.":[190],"For":[191],"presentation,":[193],"choose":[195],"only":[196],"from":[200],"above":[202],"set,":[203],"i.e.":[204],"order":[207],"1":[208],"(BY1)":[209],"STMB":[210],"MatPen.":[212],"We":[213,250],"also":[214],"describe":[215,243],"leakage":[218,273],"correction":[219],"algorithm":[220,236],"[19]":[221],"application":[223],"BY1,":[225],"compare":[227,245],"all":[228],"results":[229],"well-known":[232],"Aboutanios":[233],"Mulgrew":[235],"(AbM)":[237],"[13].":[238],"Our":[239],"intention":[240],"existing":[248],"algorithms.":[249],"consider":[251],"because":[255],"it":[256],"typical":[259],"measurement":[260],"case.":[261],"DFT":[263],"spectrum":[264],"spectral":[272],"[5].":[274]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":8},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":5},{"year":2014,"cited_by_count":4}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}