{"id":"https://openalex.org/W4238130923","doi":"https://doi.org/10.1109/micro.2016.7783758","title":"T&lt;inf&gt;i&lt;/inf&gt;-states: Processor power management in the temperature inversion region","display_name":"T&lt;inf&gt;i&lt;/inf&gt;-states: Processor power management in the temperature inversion region","publication_year":2016,"publication_date":"2016-10-01","ids":{"openalex":"https://openalex.org/W4238130923","doi":"https://doi.org/10.1109/micro.2016.7783758"},"language":"en","primary_location":{"id":"doi:10.1109/micro.2016.7783758","is_oa":false,"landing_page_url":"https://doi.org/10.1109/micro.2016.7783758","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 49th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020600861","display_name":"Yazhou Zu","orcid":"https://orcid.org/0000-0003-0047-6976"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Yazhou Zu","raw_affiliation_strings":["The University of Texas at Austin"],"affiliations":[{"raw_affiliation_string":"The University of Texas at Austin","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100352881","display_name":"Wei Huang","orcid":"https://orcid.org/0000-0001-7004-6408"},"institutions":[{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Wei Huang","raw_affiliation_strings":["Advanced Micro Devices, Inc"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc","institution_ids":["https://openalex.org/I1311921367"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061667903","display_name":"Indrani Paul","orcid":"https://orcid.org/0009-0008-5175-5207"},"institutions":[{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Indrani Paul","raw_affiliation_strings":["Advanced Micro Devices, Inc"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc","institution_ids":["https://openalex.org/I1311921367"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000635267","display_name":"Vijay Janapa Reddi","orcid":"https://orcid.org/0000-0002-5259-7721"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vijay Janapa Reddi","raw_affiliation_strings":["The University of Texas at Austin"],"affiliations":[{"raw_affiliation_string":"The University of Texas at Austin","institution_ids":["https://openalex.org/I86519309"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5020600861"],"corresponding_institution_ids":["https://openalex.org/I86519309"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.27701313,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inversion","display_name":"Inversion (geology)","score":0.7512331008911133},{"id":"https://openalex.org/keywords/operating-temperature","display_name":"Operating temperature","score":0.6120039820671082},{"id":"https://openalex.org/keywords/power-management","display_name":"Power management","score":0.4824824631214142},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.46114784479141235},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.460385799407959},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4561059772968292},{"id":"https://openalex.org/keywords/atmospheric-temperature-range","display_name":"Atmospheric temperature range","score":0.4331699311733246},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4011419713497162},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.31042078137397766},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23490148782730103},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.22206127643585205}],"concepts":[{"id":"https://openalex.org/C1893757","wikidata":"https://www.wikidata.org/wiki/Q3653001","display_name":"Inversion (geology)","level":3,"score":0.7512331008911133},{"id":"https://openalex.org/C131321042","wikidata":"https://www.wikidata.org/wiki/Q656685","display_name":"Operating temperature","level":2,"score":0.6120039820671082},{"id":"https://openalex.org/C2778774385","wikidata":"https://www.wikidata.org/wiki/Q4437810","display_name":"Power management","level":3,"score":0.4824824631214142},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.46114784479141235},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.460385799407959},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4561059772968292},{"id":"https://openalex.org/C39353612","wikidata":"https://www.wikidata.org/wiki/Q5283759","display_name":"Atmospheric temperature range","level":2,"score":0.4331699311733246},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4011419713497162},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.31042078137397766},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23490148782730103},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22206127643585205},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C109007969","wikidata":"https://www.wikidata.org/wiki/Q749565","display_name":"Structural basin","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/micro.2016.7783758","is_oa":false,"landing_page_url":"https://doi.org/10.1109/micro.2016.7783758","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 49th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8500000238418579}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":42,"referenced_works":["https://openalex.org/W100799738","https://openalex.org/W1966797259","https://openalex.org/W1972661221","https://openalex.org/W1974338211","https://openalex.org/W1981384041","https://openalex.org/W1994172067","https://openalex.org/W1994805710","https://openalex.org/W2014039723","https://openalex.org/W2015496862","https://openalex.org/W2016652708","https://openalex.org/W2021433466","https://openalex.org/W2023304380","https://openalex.org/W2023571465","https://openalex.org/W2024946198","https://openalex.org/W2033140395","https://openalex.org/W2039865334","https://openalex.org/W2042255220","https://openalex.org/W2051192488","https://openalex.org/W2069345435","https://openalex.org/W2123821392","https://openalex.org/W2129960401","https://openalex.org/W2130720335","https://openalex.org/W2144302754","https://openalex.org/W2144553551","https://openalex.org/W2150322402","https://openalex.org/W2152165066","https://openalex.org/W2162517322","https://openalex.org/W2165221819","https://openalex.org/W2167213696","https://openalex.org/W2215665513","https://openalex.org/W2234633824","https://openalex.org/W2235375535","https://openalex.org/W2295769636","https://openalex.org/W2295907836","https://openalex.org/W2296699588","https://openalex.org/W2323131249","https://openalex.org/W4245916113","https://openalex.org/W4249633267","https://openalex.org/W6643305534","https://openalex.org/W6660970044","https://openalex.org/W6681611573","https://openalex.org/W6688592396"],"related_works":["https://openalex.org/W1980470275","https://openalex.org/W2086322839","https://openalex.org/W2344971351","https://openalex.org/W2363509351","https://openalex.org/W2377084220","https://openalex.org/W1990581988","https://openalex.org/W2384206310","https://openalex.org/W2354391290","https://openalex.org/W1132198633","https://openalex.org/W3086414210"],"abstract_inverted_index":{"Temperature":[0],"inversion":[1,36,75,100],"is":[2,37,186,203,223],"a":[3,32,77,134,166,173],"transistor-level":[4],"effect":[5],"that":[6,92,138],"can":[7,101,238],"improve":[8,149],"performance":[9,60],"when":[10,120],"temperature":[11,35,51,74,99,147,190,199,222],"increases.":[12],"It":[13],"has":[14],"largely":[15],"been":[16],"ignored":[17],"in":[18,26,41,122,261],"the":[19,27,64,71,81,93,123,140,196,217],"past":[20],"because":[21],"it":[22],"does":[23],"not":[24],"occur":[25],"typical":[28],"operating":[29,121,189,247],"region":[30],"of":[31,73,168,198],"processor,":[33,79],"but":[34],"becoming":[38],"increasing":[39],"important":[40,255],"current":[42],"and":[43,57,59,112,181,227,245,258,264],"future":[44,262],"technologies.":[45,266],"In":[46],"this":[47,113,129],"paper,":[48],"we":[49,131,183],"study":[50],"inversion's":[52],"implications":[53],"on":[54,70,76,144],"architecture":[55],"design,":[56],"power":[58,135,150,163,207,214,233,248,257],"management.":[61],"We":[62,90],"present":[63,132],"first":[65],"public":[66],"comprehensive":[67],"measurement-based":[68],"analysis":[69],"effects":[72],"real":[78],"using":[80],"AMD":[82],"A10-8700P":[83],"processor":[84],"as":[85],"our":[86],"system":[87],"under":[88],"test.":[89],"show":[91,184],"extra":[94],"timing":[95],"margin":[96],"introduced":[97],"by":[98,216],"provide":[102],"more":[103,117],"than":[104,118],"5%":[105],"V":[106],"<sub":[107,153],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[108,154],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">dd</sub>":[109],"reduction":[110,215],"benefit,":[111],"improvement":[114],"increases":[115],"to":[116,148,158,160,172,179,194,204,230,241],"8%":[119,229],"near-threshold,":[124],"low-voltage":[125],"region.":[126],"To":[127],"harness":[128],"opportunity,":[130],"Ti-states,":[133],"management":[136,260],"technique":[137],"sets":[139],"processor's":[141],"voltage":[142],"based":[143],"real-time":[145],"silicon":[146],"efficiency.":[151],"T":[152],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">i</sub>":[155],"-states":[156],"lead":[157],"6%":[159],"12%":[161],"measured":[162],"saving":[164],"across":[165],"range":[167],"different":[169],"temperatures":[170,211],"compared":[171],"fixed":[174],"margin.":[175],"As":[176],"technology":[177],"scales":[178],"FD-SOI":[180],"FinFET,":[182],"there":[185],"an":[187],"ideal":[188],"for":[191,249,256],"various":[192],"workloads":[193],"maximize":[195],"benefits":[197],"inversion.":[200],"The":[201,219,235],"key":[202],"counterbalance":[205],"leakage":[206],"increase":[208],"at":[209],"higher":[210],"with":[212],"dynamic":[213],"Ti-states.":[218],"projected":[220],"optimal":[221,236],"typically":[224],"around":[225],"60\u00b0C":[226],"yields":[228],"9%":[231],"chip":[232],"saving.":[234],"high-temperature":[237],"be":[239],"exploited":[240],"reduce":[242],"design":[243],"cost":[244],"runtime":[246],"overall":[250],"cooling.":[251],"Our":[252],"findings":[253],"are":[254],"thermal":[259],"chips":[263],"process":[265]},"counts_by_year":[{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}