{"id":"https://openalex.org/W7125578731","doi":"https://doi.org/10.1109/metroxraine66377.2025.11340058","title":"Deep Learning-Based Automated Defect Detection Systems in High-Speed Railway","display_name":"Deep Learning-Based Automated Defect Detection Systems in High-Speed Railway","publication_year":2025,"publication_date":"2025-10-22","ids":{"openalex":"https://openalex.org/W7125578731","doi":"https://doi.org/10.1109/metroxraine66377.2025.11340058"},"language":null,"primary_location":{"id":"doi:10.1109/metroxraine66377.2025.11340058","is_oa":false,"landing_page_url":"https://doi.org/10.1109/metroxraine66377.2025.11340058","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103526497","display_name":"Li Yang","orcid":"https://orcid.org/0009-0004-7545-8726"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liuchang Yang","raw_affiliation_strings":["Huazhong University of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5123740103","display_name":"Kang Du","orcid":null},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kang Du","raw_affiliation_strings":["Huazhong University of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047305204","display_name":"Chao Xu","orcid":"https://orcid.org/0000-0003-0444-7080"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Xu","raw_affiliation_strings":["Huazhong University of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107092227","display_name":"Jianfeng Cheng","orcid":null},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianfeng Cheng","raw_affiliation_strings":["Huazhong University of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021656992","display_name":"Renwei Kang","orcid":"https://orcid.org/0000-0003-3243-237X"},"institutions":[{"id":"https://openalex.org/I4210141966","display_name":"China Academy of Railway Sciences","ror":"https://ror.org/051wv2j09","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210141966"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Renwei Kang","raw_affiliation_strings":["China Academy of Railway Sciences Co, Ltd"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Academy of Railway Sciences Co, Ltd","institution_ids":["https://openalex.org/I4210141966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066483747","display_name":"Ting Bi","orcid":"https://orcid.org/0000-0001-6196-5613"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ting Bi","raw_affiliation_strings":["Huazhong University of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5123751621","display_name":"Tao Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tao Jiang","raw_affiliation_strings":["Huazhong University of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology","institution_ids":["https://openalex.org/I47720641"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.51017563,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1373","last_page":"1378"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10842","display_name":"Railway Engineering and Dynamics","score":0.6398000121116638,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10842","display_name":"Railway Engineering and Dynamics","score":0.6398000121116638,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11568","display_name":"Railway Systems and Energy Efficiency","score":0.09160000085830688,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.08470000326633453,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/software-deployment","display_name":"Software deployment","score":0.6686999797821045},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6672999858856201},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.5735999941825867},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.4869000017642975},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.4542999863624573},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4307999908924103},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.3765999972820282},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.33180001378059387}],"concepts":[{"id":"https://openalex.org/C105339364","wikidata":"https://www.wikidata.org/wiki/Q2297740","display_name":"Software deployment","level":2,"score":0.6686999797821045},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6672999858856201},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.5735999941825867},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5511000156402588},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5078999996185303},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.4869000017642975},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.4542999863624573},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4307999908924103},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.41670000553131104},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4032999873161316},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.3765999972820282},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3716000020503998},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.33180001378059387},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.3305000066757202},{"id":"https://openalex.org/C169806903","wikidata":"https://www.wikidata.org/wiki/Q5937752","display_name":"Human error","level":2,"score":0.3246999979019165},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.32120001316070557},{"id":"https://openalex.org/C2776151529","wikidata":"https://www.wikidata.org/wiki/Q3045304","display_name":"Object detection","level":3,"score":0.30480000376701355},{"id":"https://openalex.org/C3019060180","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automated method","level":2,"score":0.29190000891685486},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.2842999994754791},{"id":"https://openalex.org/C81293917","wikidata":"https://www.wikidata.org/wiki/Q4189534","display_name":"System deployment","level":3,"score":0.27630001306533813},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.2750000059604645},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.27239999175071716},{"id":"https://openalex.org/C138827492","wikidata":"https://www.wikidata.org/wiki/Q6661985","display_name":"Data processing","level":2,"score":0.27070000767707825},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.26759999990463257},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.26269999146461487},{"id":"https://openalex.org/C133462117","wikidata":"https://www.wikidata.org/wiki/Q4929239","display_name":"Data collection","level":2,"score":0.2513999938964844},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.2506999969482422}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/metroxraine66377.2025.11340058","is_oa":false,"landing_page_url":"https://doi.org/10.1109/metroxraine66377.2025.11340058","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Decent work and economic growth","id":"https://metadata.un.org/sdg/8","score":0.4244941473007202}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2972810872","https://openalex.org/W3013984308","https://openalex.org/W3119943851","https://openalex.org/W3157243312","https://openalex.org/W3195969653","https://openalex.org/W3199406809","https://openalex.org/W3208652168","https://openalex.org/W4319597842","https://openalex.org/W4322733148","https://openalex.org/W4323304780","https://openalex.org/W4390242528","https://openalex.org/W4399919431","https://openalex.org/W4403770406"],"related_works":[],"abstract_inverted_index":{"This":[0],"paper":[1],"addresses":[2],"the":[3,8],"critical":[4],"challenges":[5,79],"of":[6,10,94],"ensuring":[7],"reliability":[9],"Automated":[11],"Train":[12],"Protection":[13],"(ATP)":[14],"systems":[15],"in":[16],"high-speed":[17],"railways":[18],"under":[19],"complex":[20],"environmental":[21],"conditions.":[22],"Traditional":[23],"manual":[24],"inspection":[25],"methods":[26],"are":[27],"inefficient,":[28],"labor-intensive,":[29],"and":[30,60,84,96,112],"prone":[31],"to":[32,36],"human":[33],"error,":[34],"failing":[35],"meet":[37],"modern":[38],"safety":[39,117],"standards.":[40],"To":[41],"overcome":[42],"these":[43],"limitations,":[44],"we":[45],"propose":[46],"an":[47,61],"automated":[48],"defect":[49,72],"detection":[50],"framework":[51],"integrating":[52],"advanced":[53],"image":[54,78],"enhancement":[55],"techniques,":[56],"high-precision":[57],"data":[58],"annotation,":[59],"optimized":[62],"YOLO11":[63],"deep":[64],"learning":[65],"architecture.":[66],"Our":[67],"approach":[68],"significantly":[69],"improves":[70],"microscopic":[71],"identification":[73],"accuracy":[74],"while":[75],"addressing":[76],"field-acquired":[77],"including":[80],"uneven":[81],"illumination,":[82],"blur,":[83],"noise.":[85],"Experimental":[86],"validation":[87],"demonstrates":[88],"a":[89],"mean":[90],"Average":[91],"Precision":[92],"(mAP)":[93],"95.1%":[95],"real-time":[97],"processing":[98],"at":[99],"322":[100],"frames":[101],"per":[102],"second":[103],"(FPS),":[104],"enabling":[105],"proactive":[106],"maintenance":[107],"strategies,":[108],"substantial":[109],"cost":[110],"reduction,":[111],"scalable":[113],"deployment":[114],"across":[115],"railway":[116],"systems.":[118]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2026-01-25T00:00:00"}