{"id":"https://openalex.org/W4286572020","doi":"https://doi.org/10.1109/metroind4.0iot54413.2022.9831674","title":"Surface roughness measurements of turned parts through a vision-based measurement system: uncertainty analysis and performance comparison with state-of-the-art instruments","display_name":"Surface roughness measurements of turned parts through a vision-based measurement system: uncertainty analysis and performance comparison with state-of-the-art instruments","publication_year":2022,"publication_date":"2022-06-07","ids":{"openalex":"https://openalex.org/W4286572020","doi":"https://doi.org/10.1109/metroind4.0iot54413.2022.9831674"},"language":"en","primary_location":{"id":"doi:10.1109/metroind4.0iot54413.2022.9831674","is_oa":false,"landing_page_url":"https://doi.org/10.1109/metroind4.0iot54413.2022.9831674","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048046148","display_name":"Alessia Baleani","orcid":null},"institutions":[{"id":"https://openalex.org/I122534668","display_name":"Marche Polytechnic University","ror":"https://ror.org/00x69rs40","country_code":"IT","type":"education","lineage":["https://openalex.org/I122534668"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Alessia Baleani","raw_affiliation_strings":["Università Politecnica delle Marche,Dept. of Industrial Engineering and Mathematical Sciences,Ancona,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Università Politecnica delle Marche,Dept. of Industrial Engineering and Mathematical Sciences,Ancona,Italy","institution_ids":["https://openalex.org/I122534668"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060894553","display_name":"Nicola Paone","orcid":"https://orcid.org/0000-0002-1228-8967"},"institutions":[{"id":"https://openalex.org/I122534668","display_name":"Marche Polytechnic University","ror":"https://ror.org/00x69rs40","country_code":"IT","type":"education","lineage":["https://openalex.org/I122534668"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Nicola Paone","raw_affiliation_strings":["Università Politecnica delle Marche,Dept. of Industrial Engineering and Mathematical Sciences,Ancona,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Università Politecnica delle Marche,Dept. of Industrial Engineering and Mathematical Sciences,Ancona,Italy","institution_ids":["https://openalex.org/I122534668"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053922584","display_name":"Jona Gladines","orcid":"https://orcid.org/0000-0002-9306-5078"},"institutions":[{"id":"https://openalex.org/I149213910","display_name":"University of Antwerp","ror":"https://ror.org/008x57b05","country_code":"BE","type":"education","lineage":["https://openalex.org/I149213910"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Jona Gladines","raw_affiliation_strings":["University of Antwerp,Faculty of Applied Engineering,Antwerp,Belgium","Faculty of Applied Engineering, University of Antwerp, Antwerp, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Antwerp,Faculty of Applied Engineering,Antwerp,Belgium","institution_ids":["https://openalex.org/I149213910"]},{"raw_affiliation_string":"Faculty of Applied Engineering, University of Antwerp, Antwerp, Belgium","institution_ids":["https://openalex.org/I149213910"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071951202","display_name":"Steve Vanlanduit","orcid":"https://orcid.org/0000-0002-7975-1338"},"institutions":[{"id":"https://openalex.org/I149213910","display_name":"University of Antwerp","ror":"https://ror.org/008x57b05","country_code":"BE","type":"education","lineage":["https://openalex.org/I149213910"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Steve Vanlanduit","raw_affiliation_strings":["University of Antwerp,Faculty of Applied Engineering,Antwerp,Belgium","Faculty of Applied Engineering, University of Antwerp, Antwerp, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Antwerp,Faculty of Applied Engineering,Antwerp,Belgium","institution_ids":["https://openalex.org/I149213910"]},{"raw_affiliation_string":"Faculty of Applied Engineering, University of Antwerp, Antwerp, Belgium","institution_ids":["https://openalex.org/I149213910"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3304,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.62724014,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"37","issue":null,"first_page":"17","last_page":"22"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/stylus","display_name":"Stylus","score":0.9481143951416016},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.6958075761795044},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.6355162858963013},{"id":"https://openalex.org/keywords/surface-roughness","display_name":"Surface roughness","score":0.6082286834716797},{"id":"https://openalex.org/keywords/optical-transfer-function","display_name":"Optical transfer function","score":0.5906134247779846},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.568341851234436},{"id":"https://openalex.org/keywords/measuring-instrument","display_name":"Measuring instrument","score":0.5575242042541504},{"id":"https://openalex.org/keywords/surface-finish","display_name":"Surface finish","score":0.5343531370162964},{"id":"https://openalex.org/keywords/surface-metrology","display_name":"Surface metrology","score":0.5193641781806946},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.5067687630653381},{"id":"https://openalex.org/keywords/machine-vision","display_name":"Machine vision","score":0.49066293239593506},{"id":"https://openalex.org/keywords/lens","display_name":"Lens (geology)","score":0.4779627025127411},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.45892953872680664},{"id":"https://openalex.org/keywords/measuring-principle","display_name":"Measuring principle","score":0.4333760142326355},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3874540328979492},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3648001253604889},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.33701473474502563},{"id":"https://openalex.org/keywords/profilometer","display_name":"Profilometer","score":0.2729359567165375},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26606088876724243},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.23553261160850525},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.2100878357887268},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11484947800636292},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09088647365570068}],"concepts":[{"id":"https://openalex.org/C164086593","wikidata":"https://www.wikidata.org/wiki/Q1227035","display_name":"Stylus","level":2,"score":0.9481143951416016},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.6958075761795044},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.6355162858963013},{"id":"https://openalex.org/C107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","level":2,"score":0.6082286834716797},{"id":"https://openalex.org/C175231954","wikidata":"https://www.wikidata.org/wiki/Q1942321","display_name":"Optical transfer function","level":2,"score":0.5906134247779846},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.568341851234436},{"id":"https://openalex.org/C62646347","wikidata":"https://www.wikidata.org/wiki/Q2041172","display_name":"Measuring instrument","level":2,"score":0.5575242042541504},{"id":"https://openalex.org/C71039073","wikidata":"https://www.wikidata.org/wiki/Q3439090","display_name":"Surface finish","level":2,"score":0.5343531370162964},{"id":"https://openalex.org/C2777625669","wikidata":"https://www.wikidata.org/wiki/Q7645991","display_name":"Surface metrology","level":4,"score":0.5193641781806946},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.5067687630653381},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.49066293239593506},{"id":"https://openalex.org/C15336307","wikidata":"https://www.wikidata.org/wiki/Q1766051","display_name":"Lens (geology)","level":2,"score":0.4779627025127411},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.45892953872680664},{"id":"https://openalex.org/C71928083","wikidata":"https://www.wikidata.org/wiki/Q1530469","display_name":"Measuring principle","level":2,"score":0.4333760142326355},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3874540328979492},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3648001253604889},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.33701473474502563},{"id":"https://openalex.org/C79261456","wikidata":"https://www.wikidata.org/wiki/Q443756","display_name":"Profilometer","level":3,"score":0.2729359567165375},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26606088876724243},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.23553261160850525},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2100878357887268},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11484947800636292},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09088647365570068},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/metroind4.0iot54413.2022.9831674","is_oa":false,"landing_page_url":"https://doi.org/10.1109/metroind4.0iot54413.2022.9831674","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)","raw_type":"proceedings-article"},{"id":"pmh:oai:iris.univpm.it:11566/309525","is_oa":false,"landing_page_url":"https://hdl.handle.net/11566/309525","pdf_url":null,"source":{"id":"https://openalex.org/S4306402571","display_name":"Universit\u00e0 Politecnica delle Marche (Universit\u00e0 Politecnica delle Marche)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I122534668","host_organization_name":"Marche Polytechnic University","host_organization_lineage":["https://openalex.org/I122534668"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/11","score":0.6499999761581421,"display_name":"Sustainable cities and communities"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1964499264","https://openalex.org/W1965857552","https://openalex.org/W1977873336","https://openalex.org/W1981000344","https://openalex.org/W2758363008","https://openalex.org/W2891922991","https://openalex.org/W3010756680","https://openalex.org/W3184911977","https://openalex.org/W4238789680","https://openalex.org/W6754849745","https://openalex.org/W6775585701","https://openalex.org/W6922304946"],"related_works":["https://openalex.org/W2029872898","https://openalex.org/W1996062621","https://openalex.org/W1971136824","https://openalex.org/W2460196748","https://openalex.org/W1965076875","https://openalex.org/W2888452878","https://openalex.org/W4386356504","https://openalex.org/W1991004174","https://openalex.org/W2353104051","https://openalex.org/W2371058679"],"abstract_inverted_index":{"The":[0,29,46,115,165],"focus":[1],"of":[2,13,48,56,66,79,100,134,152,174],"this":[3,144,189],"study":[4],"is":[5,31,103,160],"to":[6,18,24,52,61,71,92],"design":[7],"a":[8,32,106,132,150,161],"vision-based":[9,140,185],"measurement":[10,27,34,163],"instrument":[11,30,102,159,186],"capable":[12],"measuring":[14],"surface":[15],"roughness":[16,85,135],"and":[17,65,97,146,168],"discuss":[19],"its":[20],"metrological":[21],"performance":[22],"compared":[23],"more":[25],"traditional":[26],"instruments.":[28,127],"non-contact":[33],"system":[35,141],"characterized":[36],"by":[37,138],"short":[38],"inspection":[39],"time":[40],"which":[41],"allows":[42],"for":[43],"in-line":[44],"implementation.":[45],"aim":[47],"the":[49,54,57,63,87,98,101,118,122,139,157,169,175,184],"work":[50,145],"was":[51,95],"combine":[53],"use":[55],"Modulation":[58],"Transfer":[59],"Function":[60],"estimate":[62],"resolution":[64],"an":[67,73],"Electrically":[68],"Tunable":[69],"Lens":[70],"obtain":[72],"optimally":[74],"focused":[75],"image.":[76],"A":[77],"set":[78,151],"turned":[80,153],"steel":[81],"samples":[82],"with":[83,125,180],"different":[84,126],"in":[86,143,188],"range":[88],"Ra":[89],"2.38":[90],"\u00b5m":[91,94],"15.07":[93],"prepared":[96],"layout":[99],"presented,":[104],"including":[105,183],"discussion":[107],"on":[108,121,149],"how":[109],"optimal":[110],"imaging":[111],"conditions":[112],"were":[113],"obtained.":[114],"paper":[116],"describes":[117],"comparison":[119,133],"performed":[120,137],"measurements":[123,136],"collected":[124],"In":[128,155],"particular,":[129,156],"it":[130],"reports":[131],"designed":[142],"state-of-the-art":[147],"instruments":[148],"samples.":[154],"reference":[158],"stylus-based":[162],"system.":[164],"data":[166],"acquired":[167],"results":[170],"showed":[171],"that":[172],"all":[173],"instruments'":[176],"performances":[177],"are":[178],"compatible":[179],"each":[181],"other,":[182],"developed":[187],"work.":[190]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}