{"id":"https://openalex.org/W3185737405","doi":"https://doi.org/10.1109/metroind4.0iot51437.2021.9488490","title":"Industrial Data Services for Quality Control in Smart Manufacturing \u2013 the i4Q Framework","display_name":"Industrial Data Services for Quality Control in Smart Manufacturing \u2013 the i4Q Framework","publication_year":2021,"publication_date":"2021-06-07","ids":{"openalex":"https://openalex.org/W3185737405","doi":"https://doi.org/10.1109/metroind4.0iot51437.2021.9488490","mag":"3185737405"},"language":"en","primary_location":{"id":"doi:10.1109/metroind4.0iot51437.2021.9488490","is_oa":false,"landing_page_url":"https://doi.org/10.1109/metroind4.0iot51437.2021.9488490","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/10251/190666","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040123224","display_name":"\u0391\u03bd\u03b1\u03c3\u03c4\u03ac\u03c3\u03b9\u03bf\u03c2 \u039a\u03b1\u03c1\u03b1\u03ba\u03ce\u03c3\u03c4\u03b1\u03c2","orcid":"https://orcid.org/0000-0002-8508-3903"},"institutions":[{"id":"https://openalex.org/I4210134249","display_name":"Centre for Research and Technology Hellas","ror":"https://ror.org/03bndpq63","country_code":"GR","type":"facility","lineage":["https://openalex.org/I4210134249"]},{"id":"https://openalex.org/I4210093649","display_name":"Information Technologies Institute","ror":"https://ror.org/0069akp70","country_code":"GR","type":"nonprofit","lineage":["https://openalex.org/I4210093649"]}],"countries":["GR"],"is_corresponding":true,"raw_author_name":"Anastasios Karakostas","raw_affiliation_strings":["Information Technologies Institute, Centre for Research and Technology Hellas (CERTH-ITI), Thessaloniki, Greece"],"affiliations":[{"raw_affiliation_string":"Information Technologies Institute, Centre for Research and Technology Hellas (CERTH-ITI), Thessaloniki, Greece","institution_ids":["https://openalex.org/I4210093649","https://openalex.org/I4210134249"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009412588","display_name":"Ra\u00fal Poler","orcid":"https://orcid.org/0000-0003-4475-6371"},"institutions":[{"id":"https://openalex.org/I60053951","display_name":"Universitat Polit\u00e8cnica de Val\u00e8ncia","ror":"https://ror.org/01460j859","country_code":"ES","type":"education","lineage":["https://openalex.org/I60053951"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Raul Poler","raw_affiliation_strings":["Research Centre on Production Management and Engineering (CIGIP), Escuela Polit\u00e9cnica Superior de Alcoy, Universitat Polit\u00e8cnica de Val\u00e8ncia, Alcoy, Spain"],"affiliations":[{"raw_affiliation_string":"Research Centre on Production Management and Engineering (CIGIP), Escuela Polit\u00e9cnica Superior de Alcoy, Universitat Polit\u00e8cnica de Val\u00e8ncia, Alcoy, Spain","institution_ids":["https://openalex.org/I60053951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028807780","display_name":"Francisco Fraile","orcid":"https://orcid.org/0000-0003-0852-8953"},"institutions":[{"id":"https://openalex.org/I60053951","display_name":"Universitat Polit\u00e8cnica de Val\u00e8ncia","ror":"https://ror.org/01460j859","country_code":"ES","type":"education","lineage":["https://openalex.org/I60053951"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Francisco Fraile","raw_affiliation_strings":["Research Centre on Production Management and Engineering (CIGIP), Universitat Polit\u00e8cnica de Val\u00e8ncia, Valencia, Spain"],"affiliations":[{"raw_affiliation_string":"Research Centre on Production Management and Engineering (CIGIP), Universitat Polit\u00e8cnica de Val\u00e8ncia, Valencia, Spain","institution_ids":["https://openalex.org/I60053951"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065313479","display_name":"Stefanos Vrochidis","orcid":"https://orcid.org/0000-0002-2505-9178"},"institutions":[{"id":"https://openalex.org/I4210093649","display_name":"Information Technologies Institute","ror":"https://ror.org/0069akp70","country_code":"GR","type":"nonprofit","lineage":["https://openalex.org/I4210093649"]},{"id":"https://openalex.org/I4210134249","display_name":"Centre for Research and Technology Hellas","ror":"https://ror.org/03bndpq63","country_code":"GR","type":"facility","lineage":["https://openalex.org/I4210134249"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Stefanos Vrochidis","raw_affiliation_strings":["Information Technologies Institute, Centre for Research and Technology Hellas (CERTH-ITI), Thessaloniki, Greece"],"affiliations":[{"raw_affiliation_string":"Information Technologies Institute, Centre for Research and Technology Hellas (CERTH-ITI), Thessaloniki, Greece","institution_ids":["https://openalex.org/I4210093649","https://openalex.org/I4210134249"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5040123224"],"corresponding_institution_ids":["https://openalex.org/I4210093649","https://openalex.org/I4210134249"],"apc_list":null,"apc_paid":null,"fwci":0.9045,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.78980976,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"454","last_page":"457"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.9891999959945679,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12017","display_name":"Recycling and Waste Management Techniques","score":0.9584000110626221,"subfield":{"id":"https://openalex.org/subfields/2311","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/control-reconfiguration","display_name":"Control reconfiguration","score":0.6199221611022949},{"id":"https://openalex.org/keywords/certification","display_name":"Certification","score":0.527743399143219},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.5170415043830872},{"id":"https://openalex.org/keywords/factory","display_name":"Factory (object-oriented programming)","score":0.5061048865318298},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5020101070404053},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.4965110421180725},{"id":"https://openalex.org/keywords/quality-assurance","display_name":"Quality assurance","score":0.433888703584671},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.42766982316970825},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.42346128821372986},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.42025405168533325},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.32872575521469116},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30399972200393677},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.20822280645370483},{"id":"https://openalex.org/keywords/operations-management","display_name":"Operations management","score":0.12973621487617493}],"concepts":[{"id":"https://openalex.org/C119701452","wikidata":"https://www.wikidata.org/wiki/Q5165881","display_name":"Control reconfiguration","level":2,"score":0.6199221611022949},{"id":"https://openalex.org/C46304622","wikidata":"https://www.wikidata.org/wiki/Q374814","display_name":"Certification","level":2,"score":0.527743399143219},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.5170415043830872},{"id":"https://openalex.org/C40149104","wikidata":"https://www.wikidata.org/wiki/Q5620977","display_name":"Factory (object-oriented programming)","level":2,"score":0.5061048865318298},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5020101070404053},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.4965110421180725},{"id":"https://openalex.org/C106436119","wikidata":"https://www.wikidata.org/wiki/Q836575","display_name":"Quality assurance","level":3,"score":0.433888703584671},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.42766982316970825},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.42346128821372986},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.42025405168533325},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.32872575521469116},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30399972200393677},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.20822280645370483},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.12973621487617493},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C2778618615","wikidata":"https://www.wikidata.org/wiki/Q4008393","display_name":"External quality assessment","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/metroind4.0iot51437.2021.9488490","is_oa":false,"landing_page_url":"https://doi.org/10.1109/metroind4.0iot51437.2021.9488490","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)","raw_type":"proceedings-article"},{"id":"pmh:oai:riunet.upv.es:10251/190666","is_oa":true,"landing_page_url":"http://hdl.handle.net/10251/190666","pdf_url":null,"source":{"id":"https://openalex.org/S4306401500","display_name":"RiuNet (Politechnical University of Valencia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I60053951","host_organization_name":"Universitat Polit\u00e8cnica de Val\u00e8ncia","host_organization_lineage":["https://openalex.org/I60053951"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:zenodo.org:5853140","is_oa":true,"landing_page_url":"https://zenodo.org/record/5853140","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:riunet.upv.es:10251/190666","is_oa":true,"landing_page_url":"http://hdl.handle.net/10251/190666","pdf_url":null,"source":{"id":"https://openalex.org/S4306401500","display_name":"RiuNet (Politechnical University of Valencia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I60053951","host_organization_name":"Universitat Polit\u00e8cnica de Val\u00e8ncia","host_organization_lineage":["https://openalex.org/I60053951"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[{"score":0.6899999976158142,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[{"id":"https://openalex.org/G1964579094","display_name":null,"funder_award_id":"958205","funder_id":"https://openalex.org/F4320320300","funder_display_name":"European Commission"}],"funders":[{"id":"https://openalex.org/F4320320300","display_name":"European Commission","ror":"https://ror.org/00k4n6c32"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1567491469","https://openalex.org/W2004291985","https://openalex.org/W2138011864","https://openalex.org/W2617697157","https://openalex.org/W2733383708","https://openalex.org/W2788276261","https://openalex.org/W2808485473","https://openalex.org/W2899614238","https://openalex.org/W2900071921","https://openalex.org/W2953595181","https://openalex.org/W3104279142","https://openalex.org/W4249416796"],"related_works":["https://openalex.org/W1981002473","https://openalex.org/W2357657342","https://openalex.org/W2153432761","https://openalex.org/W2152623100","https://openalex.org/W4214878056","https://openalex.org/W1580144672","https://openalex.org/W2142042635","https://openalex.org/W583571217","https://openalex.org/W2754952496","https://openalex.org/W2141261139"],"abstract_inverted_index":{"This":[0,116],"paper":[1,117],"presents":[2,118],"a":[3,26],"new":[4],"innovative":[5,32],"framework":[6,17,125],"to":[7,35,109,113],"support":[8],"smart":[9],"manufacturing":[10,56,93,106],"quality":[11,98],"assurance.":[12],"More":[13],"specifically,":[14],"the":[15,37,75,119,123,127],"i4Q":[16,62,85,124],"provides":[18],"an":[19,110],"IoT-based":[20],"Reliable":[21],"Industrial":[22],"Data":[23],"Services":[24],"(RIDS),":[25],"complete":[27],"suite":[28],"consisting":[29],"of":[30,40,122],"22":[31],"Solutions,":[33],"able":[34],"manage":[36],"huge":[38],"amount":[39],"industrial":[41,129],"data":[42,65,76],"coming":[43],"from":[44],"cheap":[45],"cost-effective,":[46],"smart,":[47],"and":[48,59,83,89,101,126],"small":[49],"size":[50],"interconnected":[51],"factory":[52],"devices":[53],"for":[54,92,103],"supporting":[55],"online":[57],"monitoring":[58],"control.":[60],"The":[61],"Framework":[63],"guarantees":[64],"reliability":[66],"with":[67],"functions":[68],"grouped":[69],"into":[70],"five":[71],"basic":[72],"capabilities":[73],"around":[74],"cycle:":[77],"sensing,":[78],"communication,":[79],"computing":[80],"infrastructure,":[81],"storage,":[82],"analysis-optimization.":[84],"RIDS":[86],"includes":[87],"simulation":[88],"optimization":[90],"tools":[91],"line":[94],"continuous":[95],"process":[96],"qualification,":[97],"diagnosis,":[99],"reconfiguration":[100],"certification":[102],"ensuring":[104],"high":[105],"efficiency,":[107],"leading":[108],"integrated":[111],"approach":[112],"zero-defect":[114],"manufacturing.":[115],"main":[120],"principles":[121],"relevant":[128],"case":[130],"studies":[131],"on":[132],"which":[133],"it":[134],"will":[135],"be":[136],"evaluated.":[137]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}