{"id":"https://openalex.org/W3185041967","doi":"https://doi.org/10.1109/metroind4.0iot51437.2021.9488487","title":"Towards Zero Defect Manufacturing: probabilistic model for quality control effectiveness","display_name":"Towards Zero Defect Manufacturing: probabilistic model for quality control effectiveness","publication_year":2021,"publication_date":"2021-06-07","ids":{"openalex":"https://openalex.org/W3185041967","doi":"https://doi.org/10.1109/metroind4.0iot51437.2021.9488487","mag":"3185041967"},"language":"en","primary_location":{"id":"doi:10.1109/metroind4.0iot51437.2021.9488487","is_oa":false,"landing_page_url":"https://doi.org/10.1109/metroind4.0iot51437.2021.9488487","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007398246","display_name":"Elisa Verna","orcid":"https://orcid.org/0000-0003-0083-1907"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Elisa Verna","raw_affiliation_strings":["Politecnico di Torino, Turin, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057100670","display_name":"Gianfranco Genta","orcid":"https://orcid.org/0000-0002-2983-1196"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Gianfranco Genta","raw_affiliation_strings":["Politecnico di Torino, Turin, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081392181","display_name":"Maurizio Galetto","orcid":"https://orcid.org/0000-0003-0424-3416"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Maurizio Galetto","raw_affiliation_strings":["Politecnico di Torino, Turin, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076149889","display_name":"Fiorenzo Franceschini","orcid":"https://orcid.org/0000-0001-7131-4419"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Fiorenzo Franceschini","raw_affiliation_strings":["Politecnico di Torino, Turin, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5007398246"],"corresponding_institution_ids":["https://openalex.org/I177477856"],"apc_list":null,"apc_paid":null,"fwci":0.8896,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.78637188,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"522","last_page":"526"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9894999861717224,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.6832867860794067},{"id":"https://openalex.org/keywords/software-deployment","display_name":"Software deployment","score":0.6143549084663391},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.6063868999481201},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.5738575458526611},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5693259239196777},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.49529996514320374},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.48664721846580505},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.48202764987945557},{"id":"https://openalex.org/keywords/cyber-physical-system","display_name":"Cyber-physical system","score":0.48133477568626404},{"id":"https://openalex.org/keywords/industry-4.0","display_name":"Industry 4.0","score":0.45286673307418823},{"id":"https://openalex.org/keywords/manufacturing","display_name":"Manufacturing","score":0.4426334500312805},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.38214439153671265},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.38178688287734985},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.3750660717487335},{"id":"https://openalex.org/keywords/industrial-engineering","display_name":"Industrial engineering","score":0.36532312631607056},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3050536513328552},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.16665947437286377},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1425538957118988},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.11859533190727234},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.08525815606117249}],"concepts":[{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.6832867860794067},{"id":"https://openalex.org/C105339364","wikidata":"https://www.wikidata.org/wiki/Q2297740","display_name":"Software deployment","level":2,"score":0.6143549084663391},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.6063868999481201},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.5738575458526611},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5693259239196777},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.49529996514320374},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.48664721846580505},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.48202764987945557},{"id":"https://openalex.org/C179768478","wikidata":"https://www.wikidata.org/wiki/Q1120057","display_name":"Cyber-physical system","level":2,"score":0.48133477568626404},{"id":"https://openalex.org/C2777986313","wikidata":"https://www.wikidata.org/wiki/Q1661989","display_name":"Industry 4.0","level":2,"score":0.45286673307418823},{"id":"https://openalex.org/C175700187","wikidata":"https://www.wikidata.org/wiki/Q187939","display_name":"Manufacturing","level":2,"score":0.4426334500312805},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.38214439153671265},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.38178688287734985},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.3750660717487335},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.36532312631607056},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3050536513328552},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.16665947437286377},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1425538957118988},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.11859533190727234},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.08525815606117249},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C162853370","wikidata":"https://www.wikidata.org/wiki/Q39809","display_name":"Marketing","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/metroind4.0iot51437.2021.9488487","is_oa":false,"landing_page_url":"https://doi.org/10.1109/metroind4.0iot51437.2021.9488487","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.44999998807907104,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[{"id":"https://openalex.org/G5822973887","display_name":null,"funder_award_id":"TESUN-83486178370409","funder_id":"https://openalex.org/F4320321873","funder_display_name":"Ministero dell\u2019Istruzione, dell\u2019Universit\u00e0 e della Ricerca"}],"funders":[{"id":"https://openalex.org/F4320321873","display_name":"Ministero dell\u2019Istruzione, dell\u2019Universit\u00e0 e della Ricerca","ror":"https://ror.org/0166hxq48"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W565455913","https://openalex.org/W1511921953","https://openalex.org/W1986301048","https://openalex.org/W1987152874","https://openalex.org/W1991541520","https://openalex.org/W2069954116","https://openalex.org/W2089969884","https://openalex.org/W2325248289","https://openalex.org/W2493990996","https://openalex.org/W2608262991","https://openalex.org/W2762155090","https://openalex.org/W2762902206","https://openalex.org/W2793346385","https://openalex.org/W2811064003","https://openalex.org/W2939398318","https://openalex.org/W3003209956","https://openalex.org/W3011132247","https://openalex.org/W3037877747","https://openalex.org/W3039505827","https://openalex.org/W3042913096","https://openalex.org/W3079713928","https://openalex.org/W3115492197","https://openalex.org/W3131868613","https://openalex.org/W4232605254","https://openalex.org/W6787632617"],"related_works":["https://openalex.org/W3003666232","https://openalex.org/W2945357379","https://openalex.org/W2981104449","https://openalex.org/W2474294994","https://openalex.org/W2903493206","https://openalex.org/W2902177743","https://openalex.org/W2785197507","https://openalex.org/W2963246290","https://openalex.org/W4312821896","https://openalex.org/W2744599860"],"abstract_inverted_index":{"Recent":[0],"advances":[1],"in":[2],"the":[3,8,42,45,52,58,66,70,95,113,125],"manufacturing":[4,67,128],"industry":[5,68],"have":[6],"paved":[7],"way":[9],"for":[10,136],"a":[11,62,100,133],"systematical":[12],"deployment":[13],"and":[14,22,86,139],"implementation":[15],"of":[16,44,48,57],"systems,":[17],"including":[18],"Cyber-Physical":[19],"Systems":[20],"(CPS)":[21],"smart":[23],"tools,":[24],"aimed":[25],"at":[26],"reaching":[27],"Zero":[28],"Defect":[29],"Manufacturing":[30],"(ZDM).":[31],"Nowadays,":[32],"ZDM":[33],"strategies":[34],"are":[35],"easier":[36],"to":[37,41,69,84,91,107,115],"be":[38,92,105],"implemented":[39],"due":[40],"availability":[43],"required":[46],"amount":[47],"data":[49],"coming":[50],"from":[51],"distributed":[53],"sensor":[54],"network":[55],"architectures":[56],"production":[59],"systems.":[60],"Such":[61],"trend":[63],"is":[64,80],"transforming":[65],"next":[71],"generation,":[72],"namely":[73],"Industry":[74],"4.0.":[75],"In":[76],"this":[77],"context,":[78,129],"there":[79],"an":[81],"urgent":[82],"need":[83],"identify":[85,116],"adopt":[87],"effective":[88],"quality":[89,109],"controls":[90],"performed":[93],"on":[94],"products.":[96],"This":[97,119],"paper":[98],"proposes":[99],"probabilistic":[101],"model":[102],"that":[103],"can":[104,130],"used":[106],"evaluate":[108],"inspection":[110],"effectiveness,":[111],"i.e.,":[112],"ability":[114],"product":[117],"defects.":[118],"model,":[120],"which":[121],"integrates":[122],"perfectly":[123],"within":[124],"current":[126],"modern":[127],"act":[131],"as":[132],"support":[134],"tool":[135],"decision":[137],"making":[138],"guide":[140],"designers":[141],"toward":[142],"zero-defect":[143],"strategies.":[144]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}