{"id":"https://openalex.org/W2967633825","doi":"https://doi.org/10.1109/metroi4.2019.8792906","title":"Metrological traceability for digital sensors in smart manufacturing: calibration of MEMS accelerometers and microphones at INRiM","display_name":"Metrological traceability for digital sensors in smart manufacturing: calibration of MEMS accelerometers and microphones at INRiM","publication_year":2019,"publication_date":"2019-06-01","ids":{"openalex":"https://openalex.org/W2967633825","doi":"https://doi.org/10.1109/metroi4.2019.8792906","mag":"2967633825"},"language":"en","primary_location":{"id":"doi:10.1109/metroi4.2019.8792906","is_oa":false,"landing_page_url":"https://doi.org/10.1109/metroi4.2019.8792906","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 II Workshop on Metrology for Industry 4.0 and IoT (MetroInd4.0&IoT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037809005","display_name":"Andrea Prato","orcid":"https://orcid.org/0000-0003-3733-4189"},"institutions":[{"id":"https://openalex.org/I4210136559","display_name":"Istituto Nazionale di Ricerca Metrologica","ror":"https://ror.org/03vn1bh77","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210104593","https://openalex.org/I4210136559","https://openalex.org/I4392021227"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Andrea Prato","raw_affiliation_strings":["Division of Applied Metrology and Engineering, INRiM \u2013 National Institute of Metrological Research, Torino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Applied Metrology and Engineering, INRiM \u2013 National Institute of Metrological Research, Torino, Italy","institution_ids":["https://openalex.org/I4210136559"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028905055","display_name":"Fabrizio Mazzoleni","orcid":"https://orcid.org/0000-0001-5924-2184"},"institutions":[{"id":"https://openalex.org/I4210136559","display_name":"Istituto Nazionale di Ricerca Metrologica","ror":"https://ror.org/03vn1bh77","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210104593","https://openalex.org/I4210136559","https://openalex.org/I4392021227"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Fabrizio Mazzoleni","raw_affiliation_strings":["Division of Applied Metrology and Engineering, INRiM \u2013 National Institute of Metrological Research, Torino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Applied Metrology and Engineering, INRiM \u2013 National Institute of Metrological Research, Torino, Italy","institution_ids":["https://openalex.org/I4210136559"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012154284","display_name":"Alessandro Schiavi","orcid":"https://orcid.org/0000-0003-4168-3605"},"institutions":[{"id":"https://openalex.org/I4210136559","display_name":"Istituto Nazionale di Ricerca Metrologica","ror":"https://ror.org/03vn1bh77","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210104593","https://openalex.org/I4210136559","https://openalex.org/I4392021227"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Alessandro Schiavi","raw_affiliation_strings":["Division of Applied Metrology and Engineering, INRiM \u2013 National Institute of Metrological Research, Torino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Applied Metrology and Engineering, INRiM \u2013 National Institute of Metrological Research, Torino, Italy","institution_ids":["https://openalex.org/I4210136559"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.3958,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.79847736,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"371","last_page":"375"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.972599983215332,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/traceability","display_name":"Traceability","score":0.8835744857788086},{"id":"https://openalex.org/keywords/accelerometer","display_name":"Accelerometer","score":0.8436473608016968},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.7454756498336792},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.7155794501304626},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.597333550453186},{"id":"https://openalex.org/keywords/microelectromechanical-systems","display_name":"Microelectromechanical systems","score":0.5904531478881836},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.5314491987228394},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48209813237190247},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4432259500026703},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.43383413553237915},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3838596045970917}],"concepts":[{"id":"https://openalex.org/C153876917","wikidata":"https://www.wikidata.org/wiki/Q899704","display_name":"Traceability","level":2,"score":0.8835744857788086},{"id":"https://openalex.org/C89805583","wikidata":"https://www.wikidata.org/wiki/Q192940","display_name":"Accelerometer","level":2,"score":0.8436473608016968},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.7454756498336792},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7155794501304626},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.597333550453186},{"id":"https://openalex.org/C37977207","wikidata":"https://www.wikidata.org/wiki/Q175561","display_name":"Microelectromechanical systems","level":2,"score":0.5904531478881836},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.5314491987228394},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48209813237190247},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4432259500026703},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.43383413553237915},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3838596045970917},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/metroi4.2019.8792906","is_oa":false,"landing_page_url":"https://doi.org/10.1109/metroi4.2019.8792906","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 II Workshop on Metrology for Industry 4.0 and IoT (MetroInd4.0&IoT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.5299999713897705}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W2012789442","https://openalex.org/W2033657756","https://openalex.org/W2060913890","https://openalex.org/W2090767179","https://openalex.org/W2094714277","https://openalex.org/W2175330946","https://openalex.org/W2322219934","https://openalex.org/W2411149632","https://openalex.org/W2552999262","https://openalex.org/W2726150830","https://openalex.org/W2752253279","https://openalex.org/W2760534774","https://openalex.org/W2765757445","https://openalex.org/W2788276261","https://openalex.org/W2791869483","https://openalex.org/W2796173049","https://openalex.org/W2803535760","https://openalex.org/W2886353057","https://openalex.org/W2896641547","https://openalex.org/W2900938773","https://openalex.org/W2943286931","https://openalex.org/W6749430554","https://openalex.org/W6960042753"],"related_works":["https://openalex.org/W2077453531","https://openalex.org/W3209492875","https://openalex.org/W3161496874","https://openalex.org/W4381747133","https://openalex.org/W2011011149","https://openalex.org/W2026330382","https://openalex.org/W2915680872","https://openalex.org/W1670618853","https://openalex.org/W2554858923","https://openalex.org/W2356216756"],"abstract_inverted_index":{"The":[0],"use":[1],"of":[2,23,29,67,75],"digital":[3,43,83,98,113],"sensors":[4,32],"in":[5,14,18,20,37,65,116],"engineering":[6],"applications":[7],"and":[8,39,46,60,69,78,101],"monitoring":[9],"systems":[10],"is":[11,124],"widely":[12],"increased":[13],"the":[15,21,57,61,73,105],"last":[16],"years,":[17],"particular":[19],"context":[22],"smart":[24],"manufacturing,":[25],"Industry":[26],"4.0,":[27],"Internet":[28],"Things":[30],"(IoT)":[31],"networking,":[33],"as":[34,36],"well":[35],"environmental":[38],"infrastructural":[40],"monitoring.":[41],"Nevertheless,":[42],"MEMS":[44,99],"accelerometers":[45,100],"microphones":[47],"are":[48],"currently":[49],"not":[50],"reliable":[51],"to":[52,72,96,107,118,121],"quantify":[53],"with":[54],"adequate":[55],"accuracy":[56],"vibratory":[58],"phenomena":[59],"sound":[62],"pressure":[63],"fluctuations,":[64],"terms":[66],"amplitude":[68],"frequency,":[70],"due":[71],"lack":[74],"metrological":[76],"traceability":[77,120],"suitable":[79,95],"sensitivity":[80,111],"parameters":[81],"for":[82,112],"sensors.":[84],"This":[85],"paper":[86],"presents":[87],"two":[88],"calibration":[89],"procedures,":[90],"recently":[91],"realized":[92],"at":[93],"INRiM,":[94],"characterize":[97],"microphones.":[102],"In":[103],"particular,":[104],"possibility":[106],"provide":[108],"a":[109],"proper":[110],"signal":[114],"outputs,":[115],"order":[117],"ensure":[119],"primary":[122],"standard,":[123],"addressed.":[125]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":5}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}