{"id":"https://openalex.org/W7084056730","doi":"https://doi.org/10.1109/metroautomotive64646.2025.11119275","title":"Investigation into the Aging Mechanisms of a SiC-Based Power MOSFET by Thermal and Thermomechanical Analysis","display_name":"Investigation into the Aging Mechanisms of a SiC-Based Power MOSFET by Thermal and Thermomechanical Analysis","publication_year":2025,"publication_date":"2025-06-25","ids":{"openalex":"https://openalex.org/W7084056730","doi":"https://doi.org/10.1109/metroautomotive64646.2025.11119275"},"language":"en","primary_location":{"id":"doi:10.1109/metroautomotive64646.2025.11119275","is_oa":false,"landing_page_url":"https://doi.org/10.1109/metroautomotive64646.2025.11119275","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Workshop on Metrology for Automotive (MetroAutomotive)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Moreno d'Ambrosio","orcid":null},"institutions":[{"id":"https://openalex.org/I112862951","display_name":"University of Messina","ror":"https://ror.org/05ctdxz19","country_code":"IT","type":"education","lineage":["https://openalex.org/I112862951"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Moreno d'Ambrosio","raw_affiliation_strings":["University of Messina,Messina,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Messina,Messina,Italy","institution_ids":["https://openalex.org/I112862951"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Chiara Tripodi","orcid":null},"institutions":[{"id":"https://openalex.org/I112862951","display_name":"University of Messina","ror":"https://ror.org/05ctdxz19","country_code":"IT","type":"education","lineage":["https://openalex.org/I112862951"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Chiara Tripodi","raw_affiliation_strings":["University of Messina,Messina,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Messina,Messina,Italy","institution_ids":["https://openalex.org/I112862951"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Francesca Garesc\u00ec","orcid":null},"institutions":[{"id":"https://openalex.org/I112862951","display_name":"University of Messina","ror":"https://ror.org/05ctdxz19","country_code":"IT","type":"education","lineage":["https://openalex.org/I112862951"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Francesca Garesc\u00ec","raw_affiliation_strings":["University of Messina,Messina,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Messina,Messina,Italy","institution_ids":["https://openalex.org/I112862951"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Daniele Cosio","orcid":null},"institutions":[{"id":"https://openalex.org/I112862951","display_name":"University of Messina","ror":"https://ror.org/05ctdxz19","country_code":"IT","type":"education","lineage":["https://openalex.org/I112862951"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Daniele Cosio","raw_affiliation_strings":["University of Messina,Messina,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Messina,Messina,Italy","institution_ids":["https://openalex.org/I112862951"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Domenico Bonanno","orcid":null},"institutions":[{"id":"https://openalex.org/I112862951","display_name":"University of Messina","ror":"https://ror.org/05ctdxz19","country_code":"IT","type":"education","lineage":["https://openalex.org/I112862951"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Domenico Bonanno","raw_affiliation_strings":["University of Messina,Messina,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Messina,Messina,Italy","institution_ids":["https://openalex.org/I112862951"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Francesco Rundo","orcid":null},"institutions":[{"id":"https://openalex.org/I39063666","display_name":"University of Catania","ror":"https://ror.org/03a64bh57","country_code":"IT","type":"education","lineage":["https://openalex.org/I39063666"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Francesco Rundo","raw_affiliation_strings":["University of Catania,Catania,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Catania,Catania,Italy","institution_ids":["https://openalex.org/I39063666"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Angelo Alberto Messina","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Angelo Alberto Messina","raw_affiliation_strings":["STMicroelectronics,Catania,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Catania,Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Antonio Imbruglia","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Antonio Imbruglia","raw_affiliation_strings":["STMicroelectronics,Catania,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Catania,Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Michele Calabretta","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Michele Calabretta","raw_affiliation_strings":["STMicroelectronics,Catania,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Catania,Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"last","author":{"id":null,"display_name":"Salvatore Patan\u00e8","orcid":null},"institutions":[{"id":"https://openalex.org/I112862951","display_name":"University of Messina","ror":"https://ror.org/05ctdxz19","country_code":"IT","type":"education","lineage":["https://openalex.org/I112862951"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Salvatore Patan\u00e8","raw_affiliation_strings":["University of Messina,Messina,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Messina,Messina,Italy","institution_ids":["https://openalex.org/I112862951"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":10,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.34824985,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"168","last_page":"172"},"is_retracted":false,"is_paratext":false,"is_xpac":true,"primary_topic":{"id":"https://openalex.org/T10464","display_name":"Crystal structures of chemical compounds","score":0.7258999943733215,"subfield":{"id":"https://openalex.org/subfields/1604","display_name":"Inorganic Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10464","display_name":"Crystal structures of chemical compounds","score":0.7258999943733215,"subfield":{"id":"https://openalex.org/subfields/1604","display_name":"Inorganic Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13208","display_name":"Synthesis of heterocyclic compounds","score":0.03849999979138374,"subfield":{"id":"https://openalex.org/subfields/1605","display_name":"Organic Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10274","display_name":"Synthesis and biological activity","score":0.023399999365210533,"subfield":{"id":"https://openalex.org/subfields/1605","display_name":"Organic Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-semiconductor-device","display_name":"Power semiconductor device","score":0.5023000240325928},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.4812999963760376},{"id":"https://openalex.org/keywords/joule-heating","display_name":"Joule heating","score":0.47780001163482666},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.46639999747276306},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4341999888420105},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.43059998750686646},{"id":"https://openalex.org/keywords/power-mosfet","display_name":"Power MOSFET","score":0.40070000290870667},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.39910000562667847},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.3894999921321869}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5881999731063843},{"id":"https://openalex.org/C129014197","wikidata":"https://www.wikidata.org/wiki/Q906544","display_name":"Power semiconductor device","level":3,"score":0.5023000240325928},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.4812999963760376},{"id":"https://openalex.org/C117926987","wikidata":"https://www.wikidata.org/wiki/Q210009","display_name":"Joule heating","level":2,"score":0.47780001163482666},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.46639999747276306},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4341999888420105},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.43059998750686646},{"id":"https://openalex.org/C88653102","wikidata":"https://www.wikidata.org/wiki/Q570553","display_name":"Power MOSFET","level":5,"score":0.40070000290870667},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.39910000562667847},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.3894999921321869},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.38580000400543213},{"id":"https://openalex.org/C157090170","wikidata":"https://www.wikidata.org/wiki/Q167876","display_name":"Thermomechanical analysis","level":3,"score":0.37540000677108765},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3686999976634979},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3441999852657318},{"id":"https://openalex.org/C178911571","wikidata":"https://www.wikidata.org/wiki/Q593143","display_name":"Power electronics","level":3,"score":0.33090001344680786},{"id":"https://openalex.org/C129446986","wikidata":"https://www.wikidata.org/wiki/Q542419","display_name":"Thermal analysis","level":3,"score":0.3246999979019165},{"id":"https://openalex.org/C167781694","wikidata":"https://www.wikidata.org/wiki/Q6311800","display_name":"Junction temperature","level":3,"score":0.313400000333786},{"id":"https://openalex.org/C2777900271","wikidata":"https://www.wikidata.org/wiki/Q17105337","display_name":"Power cycling","level":4,"score":0.31049999594688416},{"id":"https://openalex.org/C141812795","wikidata":"https://www.wikidata.org/wiki/Q7236534","display_name":"Power module","level":3,"score":0.2840999960899353},{"id":"https://openalex.org/C7515471","wikidata":"https://www.wikidata.org/wiki/Q1936882","display_name":"Stress testing (software)","level":2,"score":0.28380000591278076},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.27959999442100525},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2770000100135803},{"id":"https://openalex.org/C2781300812","wikidata":"https://www.wikidata.org/wiki/Q178061","display_name":"Shock (circulatory)","level":2,"score":0.26489999890327454},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.2635999917984009},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.25589999556541443},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25529998540878296},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.2535000145435333},{"id":"https://openalex.org/C2775936607","wikidata":"https://www.wikidata.org/wiki/Q466845","display_name":"Tracking (education)","level":2,"score":0.25130000710487366}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/metroautomotive64646.2025.11119275","is_oa":false,"landing_page_url":"https://doi.org/10.1109/metroautomotive64646.2025.11119275","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Workshop on Metrology for Automotive (MetroAutomotive)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.48463672399520874,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1974259851","https://openalex.org/W1987479231","https://openalex.org/W2026999729","https://openalex.org/W2029699094","https://openalex.org/W2056126082","https://openalex.org/W2089650562","https://openalex.org/W2110438510","https://openalex.org/W2148901935","https://openalex.org/W2169212444","https://openalex.org/W2305893436","https://openalex.org/W2488561239","https://openalex.org/W2898928888","https://openalex.org/W2911819128","https://openalex.org/W3158585430","https://openalex.org/W3207919737","https://openalex.org/W4212921244","https://openalex.org/W4224074940","https://openalex.org/W4286209311"],"related_works":[],"abstract_inverted_index":{"The":[0],"use":[1],"of":[2,15,46,80,88,98,163,176],"wide-bandgap":[3],"semiconductor-based":[4],"transistors":[5],"has":[6],"become":[7],"essential":[8],"in":[9],"recent":[10],"years":[11],"for":[12,18,24,85],"the":[13,36,43,53,56,73,81,121,141,161,177,182],"development":[14],"new":[16],"systems":[17],"sustainable":[19],"mobility":[20],"and,":[21],"more":[22],"generally,":[23],"energy":[25],"conversion.":[26],"In":[27],"this":[28,86,119,165],"frame,":[29],"silicon":[30],"carbide-based":[31],"power":[32,116],"MOSFETs":[33],"are":[34],"currently":[35],"most":[37],"promising":[38],"devices,":[39,89],"as":[40,135,137],"they":[41],"enable":[42],"simultaneous":[44],"management":[45],"high":[47,50],"voltages":[48],"and":[49,109],"currents.":[51],"During":[52],"switching":[54],"phases,":[55],"device":[57,122],"experiences":[58],"current":[59],"pulses,":[60],"which,":[61],"due":[62],"to":[63,67,107,125,129],"Joule":[64],"heating,":[65],"lead":[66],"thermomechanical":[68],"expansion":[69],"processes":[70],"caused":[71],"by":[72,160],"generated":[74],"heat.":[75],"This":[76,101,156],"process":[77,134],"represents":[78],"one":[79],"main":[82],"aging":[83,133],"mechanisms":[84,92],"class":[87],"whose":[90],"failure":[91],"may":[93],"significantly":[94],"differ":[95],"from":[96],"that":[97],"silicon-based":[99],"devices.":[100],"work":[102],"proposes":[103],"an":[104],"analysis":[105],"protocol":[106],"thermally":[108],"thermomechanically":[110],"characterize":[111],"a":[112,151,173],"commercially":[113],"available":[114],"SiC":[115],"MOSFET.":[117],"To":[118,139],"end,":[120],"was":[123,154],"subjected":[124],"periodic":[126],"stress":[127],"cycles":[128],"realistically":[130],"simulate":[131],"its":[132,145],"closely":[136],"possible.":[138],"assess":[140],"device's":[142,178],"health":[143],"status,":[144],"dynamic":[146],"ON":[147],"resistance,":[148],"measured":[149],"during":[150,167],"test":[152],"pulse,":[153],"monitored.":[155],"choice":[157],"is":[158],"motivated":[159],"possibility":[162],"tracking":[164],"parameter":[166],"normal":[168],"system":[169],"operation,":[170],"thus":[171],"enabling":[172],"possible":[174],"estimation":[175],"remaining":[179],"lifetime":[180],"on":[181],"field.":[183]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}