{"id":"https://openalex.org/W4292862409","doi":"https://doi.org/10.1109/memea54994.2022.9856448","title":"Image Quality Assessment for Interdependent Image Parameters Using a Score-Based Technique for Endoscopy Applications","display_name":"Image Quality Assessment for Interdependent Image Parameters Using a Score-Based Technique for Endoscopy Applications","publication_year":2022,"publication_date":"2022-06-22","ids":{"openalex":"https://openalex.org/W4292862409","doi":"https://doi.org/10.1109/memea54994.2022.9856448"},"language":"en","primary_location":{"id":"doi:10.1109/memea54994.2022.9856448","is_oa":false,"landing_page_url":"https://doi.org/10.1109/memea54994.2022.9856448","pdf_url":null,"source":{"id":"https://openalex.org/S4363605601","display_name":"2022 IEEE International Symposium on Medical Measurements and Applications (MeMeA)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Symposium on Medical Measurements and Applications (MeMeA)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081376379","display_name":"R Nishitha","orcid":null},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"facility","lineage":["https://openalex.org/I24676775"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"R Nishitha","raw_affiliation_strings":["Indian Institute of Technology, Madras,Department of Electrical Engineering,Chennai,India","Department of Electrical Engineering, Indian Institute of Technology, Madras, Chennai, India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology, Madras,Department of Electrical Engineering,Chennai,India","institution_ids":["https://openalex.org/I24676775"]},{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology, Madras, Chennai, India","institution_ids":["https://openalex.org/I24676775"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087428350","display_name":"S Amalan","orcid":null},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"facility","lineage":["https://openalex.org/I24676775"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"S Amalan","raw_affiliation_strings":["Indian Institute of Technology, Madras,Department of Electrical Engineering,Chennai,India","Department of Electrical Engineering, Indian Institute of Technology, Madras, Chennai, India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology, Madras,Department of Electrical Engineering,Chennai,India","institution_ids":["https://openalex.org/I24676775"]},{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology, Madras, Chennai, India","institution_ids":["https://openalex.org/I24676775"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101916117","display_name":"Shubham Sharma","orcid":"https://orcid.org/0000-0003-3685-8706"},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"facility","lineage":["https://openalex.org/I24676775"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Shubham Sharma","raw_affiliation_strings":["Indian Institute of Technology, Madras,Department of Electrical Engineering,Chennai,India","Department of Electrical Engineering, Indian Institute of Technology, Madras, Chennai, India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology, Madras,Department of Electrical Engineering,Chennai,India","institution_ids":["https://openalex.org/I24676775"]},{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology, Madras, Chennai, India","institution_ids":["https://openalex.org/I24676775"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054706248","display_name":"S P Preejith","orcid":"https://orcid.org/0000-0002-0634-1194"},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"facility","lineage":["https://openalex.org/I24676775"]},{"id":"https://openalex.org/I4210102197","display_name":"Healthcare Technology Innovation Centre","ror":"https://ror.org/017mw4x28","country_code":"IN","type":"facility","lineage":["https://openalex.org/I4210102197"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"S P Preejith","raw_affiliation_strings":["Healthcare Technology Innovation Centre, Indian Institute of Technology, Madras,Chennai,India","Healthcare Technology Innovation Centre, Indian Institute of Technology, Madras, Chennai, India"],"affiliations":[{"raw_affiliation_string":"Healthcare Technology Innovation Centre, Indian Institute of Technology, Madras,Chennai,India","institution_ids":["https://openalex.org/I4210102197"]},{"raw_affiliation_string":"Healthcare Technology Innovation Centre, Indian Institute of Technology, Madras, Chennai, India","institution_ids":["https://openalex.org/I4210102197","https://openalex.org/I24676775"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056763944","display_name":"Mohanasankar Sivaprakasam","orcid":"https://orcid.org/0000-0002-6714-9147"},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"facility","lineage":["https://openalex.org/I24676775"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Mohanasankar Sivaprakasam","raw_affiliation_strings":["Indian Institute of Technology, Madras,Department of Electrical Engineering,Chennai,India","Department of Electrical Engineering, Indian Institute of Technology, Madras, Chennai, India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology, Madras,Department of Electrical Engineering,Chennai,India","institution_ids":["https://openalex.org/I24676775"]},{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology, Madras, Chennai, India","institution_ids":["https://openalex.org/I24676775"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5081376379"],"corresponding_institution_ids":["https://openalex.org/I24676775"],"apc_list":null,"apc_paid":null,"fwci":0.1799,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.49907315,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11666","display_name":"Color Science and Applications","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","score":0.9939000010490417,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7259743213653564},{"id":"https://openalex.org/keywords/image-quality","display_name":"Image quality","score":0.6588570475578308},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6414728164672852},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6356501579284668},{"id":"https://openalex.org/keywords/quality-score","display_name":"Quality Score","score":0.5995084643363953},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5912275314331055},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.4430541694164276},{"id":"https://openalex.org/keywords/image-noise","display_name":"Image noise","score":0.43638935685157776},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.43449458479881287},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.37623608112335205},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08426839113235474}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7259743213653564},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.6588570475578308},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6414728164672852},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6356501579284668},{"id":"https://openalex.org/C2779346075","wikidata":"https://www.wikidata.org/wiki/Q7268763","display_name":"Quality Score","level":3,"score":0.5995084643363953},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5912275314331055},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.4430541694164276},{"id":"https://openalex.org/C35772409","wikidata":"https://www.wikidata.org/wiki/Q1323086","display_name":"Image noise","level":3,"score":0.43638935685157776},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.43449458479881287},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.37623608112335205},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08426839113235474},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/memea54994.2022.9856448","is_oa":false,"landing_page_url":"https://doi.org/10.1109/memea54994.2022.9856448","pdf_url":null,"source":{"id":"https://openalex.org/S4363605601","display_name":"2022 IEEE International Symposium on Medical Measurements and Applications (MeMeA)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Symposium on Medical Measurements and Applications (MeMeA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1972446995","https://openalex.org/W1982471090","https://openalex.org/W2089517163","https://openalex.org/W2113851412","https://openalex.org/W2151152358","https://openalex.org/W2170062168","https://openalex.org/W2298211015","https://openalex.org/W2769148002","https://openalex.org/W3182458684","https://openalex.org/W6682128630"],"related_works":["https://openalex.org/W2005185696","https://openalex.org/W2161229648","https://openalex.org/W2235753890","https://openalex.org/W2993674027","https://openalex.org/W2130228941","https://openalex.org/W2092957489","https://openalex.org/W2366116130","https://openalex.org/W2611645609","https://openalex.org/W2574052219","https://openalex.org/W4292862409"],"abstract_inverted_index":{"It":[0],"is":[1,83,108,161],"an":[2,7],"arduous":[3],"task":[4],"to":[5,70,93],"perform":[6],"Image":[8],"Quality":[9],"Assessment":[10],"(IQA)":[11],"for":[12,25,75,97,140],"all":[13],"real-time":[14],"imaging":[15],"systems":[16,19,191],"like":[17],"endoscopy":[18,190,208],"which":[20,160],"have":[21],"no":[22],"reference":[23],"images":[24,34],"comparison.":[26],"That":[27],"being":[28],"a":[29,51,72,91,95],"challenge":[30],"in":[31,111,130,145,168,186],"itself,":[32],"the":[33,44,84,88,102,105,112,115,169,174,187,193,200],"must":[35],"be":[36],"assessed":[37],"subjectively":[38],"rather":[39],"than":[40],"objectively":[41],"so":[42],"that":[43],"assessments":[45],"comply":[46],"with":[47,64],"human":[48],"perception.":[49],"ImageLab,":[50],"complete":[52],"IQA":[53,89],"solution":[54],"developed":[55],"in-house":[56],"has":[57,127],"image":[58,77,98,106,143,176],"capture":[59],"and":[60,68,120,125,139,150,173,192,204],"illumination":[61],"capabilities":[62],"integrated":[63,110],"custom":[65],"test":[66],"charts":[67],"algorithms":[69],"provide":[71,94],"detailed":[73,182],"analysis":[74,82,165],"individual":[76,80],"parameters.":[78],"Though":[79],"parameter":[81],"primary":[85],"focus":[86],"of":[87,104,117,135,147,163,189],"tool,":[90],"technique":[92,197],"score":[96,178],"quality":[99,144,177],"based":[100],"on":[101,123],"interdependency":[103],"parameters":[107],"also":[109],"tool.":[113],"Specifically,":[114],"dependency":[116],"visual":[118,148,157],"noise":[119,149,158],"dynamic":[121,151,170],"range":[122,152,171],"sharpness":[124,136],"resolution":[126],"been":[128],"highlighted":[129],"this":[131],"paper.":[132],"Eight":[133],"levels":[134,159],"were":[137,153,166],"chosen":[138],"every":[141],"level,":[142],"terms":[146],"computed.":[154],"The":[155],"perceived":[156],"part":[162],"subjective":[164],"factored":[167],"calculations":[172],"final":[175],"was":[179],"derived.":[180],"These":[181],"measurements":[183],"would":[184,198],"aid":[185,199],"development":[188],"much":[194],"simpler":[195],"score-based":[196],"technicians":[201],"during":[202],"maintenance":[203],"calibration":[205],"check":[206],"before":[207],"examination.":[209]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}