{"id":"https://openalex.org/W3041106392","doi":"https://doi.org/10.1109/memea49120.2020.9137277","title":"Calibration Standard for Impulse Energy of Defibrillator and Defibrillator Analyzer","display_name":"Calibration Standard for Impulse Energy of Defibrillator and Defibrillator Analyzer","publication_year":2020,"publication_date":"2020-06-01","ids":{"openalex":"https://openalex.org/W3041106392","doi":"https://doi.org/10.1109/memea49120.2020.9137277","mag":"3041106392"},"language":"en","primary_location":{"id":"doi:10.1109/memea49120.2020.9137277","is_oa":false,"landing_page_url":"https://doi.org/10.1109/memea49120.2020.9137277","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Symposium on Medical Measurements and Applications (MeMeA)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100695572","display_name":"Wei Zhao","orcid":"https://orcid.org/0000-0002-7346-5947"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wei ZHAO","raw_affiliation_strings":["National Institute of Metrology,Beijing,China","National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology,Beijing,China","institution_ids":["https://openalex.org/I4210162136"]},{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001452215","display_name":"Haiming Shao","orcid":"https://orcid.org/0000-0002-3305-4190"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haiming SHAO","raw_affiliation_strings":["National Institute of Metrology,Beijing,China","National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology,Beijing,China","institution_ids":["https://openalex.org/I4210162136"]},{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074000379","display_name":"Huanghui Zhang","orcid":"https://orcid.org/0000-0003-3412-6763"},"institutions":[{"id":"https://openalex.org/I4210109881","display_name":"Fujian Metrology Institute","ror":"https://ror.org/017y22r40","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210109881"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huanghui ZHANG","raw_affiliation_strings":["Fujian Metrology Institute,Fuzhou,China","Fujian Metrology Institute, Fuzhou, China"],"affiliations":[{"raw_affiliation_string":"Fujian Metrology Institute,Fuzhou,China","institution_ids":["https://openalex.org/I4210109881"]},{"raw_affiliation_string":"Fujian Metrology Institute, Fuzhou, China","institution_ids":["https://openalex.org/I4210109881"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100695572"],"corresponding_institution_ids":["https://openalex.org/I4210162136"],"apc_list":null,"apc_paid":null,"fwci":0.1681,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.58451285,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.7079296708106995},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.7048172950744629},{"id":"https://openalex.org/keywords/impulse","display_name":"Impulse (physics)","score":0.6399896740913391},{"id":"https://openalex.org/keywords/spectrum-analyzer","display_name":"Spectrum analyzer","score":0.5704217553138733},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.5169031620025635},{"id":"https://openalex.org/keywords/joule","display_name":"Joule (programming language)","score":0.48900020122528076},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3871738314628601},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.35834428668022156},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3365260660648346},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23692584037780762},{"id":"https://openalex.org/keywords/efficient-energy-use","display_name":"Efficient energy use","score":0.12337911128997803},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09581854939460754},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08880367875099182},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.07919177412986755},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07626128196716309}],"concepts":[{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.7079296708106995},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7048172950744629},{"id":"https://openalex.org/C70836080","wikidata":"https://www.wikidata.org/wiki/Q837940","display_name":"Impulse (physics)","level":2,"score":0.6399896740913391},{"id":"https://openalex.org/C158007255","wikidata":"https://www.wikidata.org/wiki/Q1055222","display_name":"Spectrum analyzer","level":2,"score":0.5704217553138733},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.5169031620025635},{"id":"https://openalex.org/C2779058145","wikidata":"https://www.wikidata.org/wiki/Q6294583","display_name":"Joule (programming language)","level":3,"score":0.48900020122528076},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3871738314628601},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35834428668022156},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3365260660648346},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23692584037780762},{"id":"https://openalex.org/C2742236","wikidata":"https://www.wikidata.org/wiki/Q924713","display_name":"Efficient energy use","level":2,"score":0.12337911128997803},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09581854939460754},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08880367875099182},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.07919177412986755},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07626128196716309},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/memea49120.2020.9137277","is_oa":false,"landing_page_url":"https://doi.org/10.1109/memea49120.2020.9137277","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Symposium on Medical Measurements and Applications (MeMeA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8100000023841858}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1903527385","https://openalex.org/W1978712841","https://openalex.org/W2002552583","https://openalex.org/W2020135329","https://openalex.org/W2049259534","https://openalex.org/W2057003493","https://openalex.org/W2075472515","https://openalex.org/W2089145789","https://openalex.org/W2142499192","https://openalex.org/W2194649871","https://openalex.org/W2552672503","https://openalex.org/W2553412269","https://openalex.org/W2898622789"],"related_works":["https://openalex.org/W1998546186","https://openalex.org/W2061967405","https://openalex.org/W2391061712","https://openalex.org/W2094171095","https://openalex.org/W2923974939","https://openalex.org/W4231462422","https://openalex.org/W2174860717","https://openalex.org/W2392646414","https://openalex.org/W3015838480","https://openalex.org/W1980429525"],"abstract_inverted_index":{"Impulse":[0],"energy":[1],"is":[2,75,103],"one":[3],"of":[4,22,31,55,64,82,92,99],"the":[5,44,49,52,72,90,93,96,100],"most":[6],"important":[7],"parameters":[8],"that":[9],"need":[10],"to":[11,77],"be":[12,78],"calibrated":[13],"for":[14,48],"defibrillator":[15,17,24,73],"and":[16,95],"analyzer.":[18],"The":[19,68],"measurement":[20,45,66,101],"accuracy":[21],"commercial":[23],"analyzer":[25,74],"could":[26],"reach":[27],"\u00b1":[28],"1":[29],"%":[30],"reading":[32,83],"plus":[33,84],"0.1":[34],"Joule":[35],"nowadays.":[36],"So,":[37],"it":[38],"placed":[39],"a":[40,62],"greater":[41],"demand":[42],"on":[43,71],"standard":[46,102],"used":[47],"calibration.":[50],"In":[51,87],"National":[53],"Institute":[54],"Metrology":[56],"(NIM)":[57],"China,":[58],"we":[59],"had":[60],"developed":[61],"set":[63],"national":[65],"standard.":[67],"calibration":[69],"uncertainty":[70,97],"evaluated":[76],"better":[79],"than":[80],"0.06%":[81],"0.06":[85],"Joule.":[86],"this":[88],"manuscript,":[89],"components":[91],"system":[94],"evaluation":[98],"introduced.":[104]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2025-12-01T00:03:43.161839","created_date":"2025-10-10T00:00:00"}
