{"id":"https://openalex.org/W2885981462","doi":"https://doi.org/10.1109/memea.2018.8438689","title":"High Precision Integrator for CVD-Diamond Detectors for Dosimetric Applications","display_name":"High Precision Integrator for CVD-Diamond Detectors for Dosimetric Applications","publication_year":2018,"publication_date":"2018-06-01","ids":{"openalex":"https://openalex.org/W2885981462","doi":"https://doi.org/10.1109/memea.2018.8438689","mag":"2885981462"},"language":"en","primary_location":{"id":"doi:10.1109/memea.2018.8438689","is_oa":false,"landing_page_url":"https://doi.org/10.1109/memea.2018.8438689","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Symposium on Medical Measurements and Applications (MeMeA)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003931700","display_name":"Erika D\u2019Antonio","orcid":"https://orcid.org/0000-0002-1761-6982"},"institutions":[{"id":"https://openalex.org/I4210124295","display_name":"University Niccol\u00f2 Cusano","ror":"https://ror.org/032c3ae16","country_code":"IT","type":"education","lineage":["https://openalex.org/I4210124295"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"E. D'Antonio","raw_affiliation_strings":["Fac. of Eng., Univ. degli Studi Niccolo Cusano, Rome, Italy"],"affiliations":[{"raw_affiliation_string":"Fac. of Eng., Univ. degli Studi Niccolo Cusano, Rome, Italy","institution_ids":["https://openalex.org/I4210124295"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032024084","display_name":"S. Salvatori","orcid":"https://orcid.org/0000-0002-6722-1794"},"institutions":[{"id":"https://openalex.org/I4210124295","display_name":"University Niccol\u00f2 Cusano","ror":"https://ror.org/032c3ae16","country_code":"IT","type":"education","lineage":["https://openalex.org/I4210124295"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"S. Salvatori","raw_affiliation_strings":["Faculty of Engineering, Universit\u00e0 degli Studi Niccol\u00f2 Cusano, Via don Carlo Gnocchi 3 - 00166, Rome, Italy"],"affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Universit\u00e0 degli Studi Niccol\u00f2 Cusano, Via don Carlo Gnocchi 3 - 00166, Rome, Italy","institution_ids":["https://openalex.org/I4210124295"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012609922","display_name":"P. Oliva","orcid":"https://orcid.org/0000-0002-3572-3255"},"institutions":[{"id":"https://openalex.org/I4210124295","display_name":"University Niccol\u00f2 Cusano","ror":"https://ror.org/032c3ae16","country_code":"IT","type":"education","lineage":["https://openalex.org/I4210124295"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"P. Oliva","raw_affiliation_strings":["Faculty of Engineering, Universit\u00e0 degli Studi Niccol\u00f2 Cusano, Via don Carlo Gnocchi 3 - 00166, Rome, Italy"],"affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Universit\u00e0 degli Studi Niccol\u00f2 Cusano, Via don Carlo Gnocchi 3 - 00166, Rome, Italy","institution_ids":["https://openalex.org/I4210124295"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069154103","display_name":"Fabrizio Patan\u00e8","orcid":"https://orcid.org/0000-0003-0488-6139"},"institutions":[{"id":"https://openalex.org/I4210124295","display_name":"University Niccol\u00f2 Cusano","ror":"https://ror.org/032c3ae16","country_code":"IT","type":"education","lineage":["https://openalex.org/I4210124295"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"F. Patane","raw_affiliation_strings":["Faculty of Engineering, Universit\u00e0 degli Studi Niccol\u00f2 Cusano, Via don Carlo Gnocchi 3 - 00166, Rome, Italy"],"affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Universit\u00e0 degli Studi Niccol\u00f2 Cusano, Via don Carlo Gnocchi 3 - 00166, Rome, Italy","institution_ids":["https://openalex.org/I4210124295"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055699637","display_name":"M. Girolami","orcid":"https://orcid.org/0000-0003-0063-3636"},"institutions":[{"id":"https://openalex.org/I4210114374","display_name":"Institute of Structure of Matter","ror":"https://ror.org/01zz9wh30","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210114374","https://openalex.org/I4210155236"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Girolami","raw_affiliation_strings":["Consiglio Nazionale delle Ricerche, Sede secondaria di Montelibretti, Via Salaria km 29,300 \u2013 00015 Monterotondo Stazione, CNR-ISM,, Istituto di Struttura della Materia, Rome, Italy"],"affiliations":[{"raw_affiliation_string":"Consiglio Nazionale delle Ricerche, Sede secondaria di Montelibretti, Via Salaria km 29,300 \u2013 00015 Monterotondo Stazione, CNR-ISM,, Istituto di Struttura della Materia, Rome, Italy","institution_ids":["https://openalex.org/I4210114374"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032741693","display_name":"D.M. Trucchi","orcid":"https://orcid.org/0000-0001-8278-4707"},"institutions":[{"id":"https://openalex.org/I4210114374","display_name":"Institute of Structure of Matter","ror":"https://ror.org/01zz9wh30","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210114374","https://openalex.org/I4210155236"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"D.M. Trucchi","raw_affiliation_strings":["Consiglio Nazionale delle Ricerche, Sede secondaria di Montelibretti, Via Salaria km 29,300 \u2013 00015 Monterotondo Stazione, CNR-ISM,, Istituto di Struttura della Materia, Rome, Italy"],"affiliations":[{"raw_affiliation_string":"Consiglio Nazionale delle Ricerche, Sede secondaria di Montelibretti, Via Salaria km 29,300 \u2013 00015 Monterotondo Stazione, CNR-ISM,, Istituto di Struttura della Materia, Rome, Italy","institution_ids":["https://openalex.org/I4210114374"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5003931700"],"corresponding_institution_ids":["https://openalex.org/I4210124295"],"apc_list":null,"apc_paid":null,"fwci":0.2911,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.50441037,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10478","display_name":"Diamond and Carbon-based Materials Research","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10478","display_name":"Diamond and Carbon-based Materials Research","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11216","display_name":"Radiation Detection and Scintillator Technologies","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dosimeter","display_name":"Dosimeter","score":0.8302512764930725},{"id":"https://openalex.org/keywords/integrator","display_name":"Integrator","score":0.7577536106109619},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6314012408256531},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.5807856321334839},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5099586248397827},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.5090522170066833},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5041154623031616},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.49369916319847107},{"id":"https://openalex.org/keywords/diamond","display_name":"Diamond","score":0.491432785987854},{"id":"https://openalex.org/keywords/photocurrent","display_name":"Photocurrent","score":0.4833616614341736},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.47980764508247375},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4578503668308258},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4557506740093231},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.453105628490448},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.437010794878006},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3740140199661255},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3415396213531494},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.28053802251815796},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.249271422624588},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.24701762199401855},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.23403650522232056},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10854536294937134}],"concepts":[{"id":"https://openalex.org/C105636585","wikidata":"https://www.wikidata.org/wiki/Q303665","display_name":"Dosimeter","level":3,"score":0.8302512764930725},{"id":"https://openalex.org/C79518650","wikidata":"https://www.wikidata.org/wiki/Q2081431","display_name":"Integrator","level":3,"score":0.7577536106109619},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6314012408256531},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.5807856321334839},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5099586248397827},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.5090522170066833},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5041154623031616},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.49369916319847107},{"id":"https://openalex.org/C2776921476","wikidata":"https://www.wikidata.org/wiki/Q5283","display_name":"Diamond","level":2,"score":0.491432785987854},{"id":"https://openalex.org/C2779845233","wikidata":"https://www.wikidata.org/wiki/Q3381567","display_name":"Photocurrent","level":2,"score":0.4833616614341736},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.47980764508247375},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4578503668308258},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4557506740093231},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.453105628490448},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.437010794878006},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3740140199661255},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3415396213531494},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.28053802251815796},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.249271422624588},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.24701762199401855},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.23403650522232056},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10854536294937134},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/memea.2018.8438689","is_oa":false,"landing_page_url":"https://doi.org/10.1109/memea.2018.8438689","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Symposium on Medical Measurements and Applications (MeMeA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.5699999928474426,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W647243217","https://openalex.org/W1509024480","https://openalex.org/W1964153475","https://openalex.org/W1990431265","https://openalex.org/W2006681022","https://openalex.org/W2010148362","https://openalex.org/W2021372971","https://openalex.org/W2037134955","https://openalex.org/W2039163632","https://openalex.org/W2059014762","https://openalex.org/W2071442044","https://openalex.org/W2072475127","https://openalex.org/W2083510584","https://openalex.org/W2084033952","https://openalex.org/W2092812836","https://openalex.org/W2143491361","https://openalex.org/W2157962730","https://openalex.org/W2172800207","https://openalex.org/W2272762281","https://openalex.org/W2300389999","https://openalex.org/W2309302464","https://openalex.org/W2461690550","https://openalex.org/W2462969593","https://openalex.org/W2508303794","https://openalex.org/W2510793478","https://openalex.org/W2544886102","https://openalex.org/W2775536452","https://openalex.org/W4251773886"],"related_works":["https://openalex.org/W2320896204","https://openalex.org/W1979746066","https://openalex.org/W2908534251","https://openalex.org/W2765125811","https://openalex.org/W3152606410","https://openalex.org/W2128615339","https://openalex.org/W2163747086","https://openalex.org/W2789062182","https://openalex.org/W4280522623","https://openalex.org/W2144928230"],"abstract_inverted_index":{"CVD-diamond":[0],"represents":[1],"a":[2,33,47,92],"well-known":[3],"solid":[4],"state":[5],"material":[6],"also":[7],"used":[8,26],"for":[9,27],"the":[10,38,42,58,75,101],"fabrication":[11],"of":[12,37,70,100],"dosimeters":[13],"applied":[14],"in":[15,68,74],"radiotherapy.":[16],"In":[17,44,82],"this":[18,45],"field,":[19],"sensitive":[20],"electronics":[21],"as":[22],"electrometers":[23],"are":[24],"commonly":[25],"signal":[28],"acquisition,":[29],"mainly":[30],"due":[31],"to":[32,53,57,90],"relatively":[34],"low":[35],"amplitude":[36],"photocurrent":[39],"produced":[40],"by":[41],"dosimeter.":[43],"paper,":[46],"compact":[48],"and":[49,72],"portable":[50],"equipment":[51],"able":[52],"measure":[54],"currents":[55],"down":[56],"pA":[59],"range":[60,78],"is":[61,88],"illustrated.":[62],"Experimental":[63],"results":[64],"highlight":[65],"excellent":[66],"performance":[67],"terms":[69],"linearity":[71],"sensitivity":[73],"wide":[76],"investigated":[77],"(pA":[79],"-":[80],"nA).":[81],"addition,":[83],"an":[84],"in-system":[85],"self-calibration":[86],"mechanism":[87],"proposed":[89],"guarantee":[91],"very":[93],"good":[94],"system":[95],"accuracy":[96],"without":[97],"any":[98],"increase":[99],"circuit":[102],"complexity.":[103]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}