{"id":"https://openalex.org/W2033759480","doi":"https://doi.org/10.1109/memea.2014.6860090","title":"Software validation of medical instruments","display_name":"Software validation of medical instruments","publication_year":2014,"publication_date":"2014-06-01","ids":{"openalex":"https://openalex.org/W2033759480","doi":"https://doi.org/10.1109/memea.2014.6860090","mag":"2033759480"},"language":"en","primary_location":{"id":"doi:10.1109/memea.2014.6860090","is_oa":false,"landing_page_url":"https://doi.org/10.1109/memea.2014.6860090","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Symposium on Medical Measurements and Applications (MeMeA)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038742950","display_name":"Davidson R. Boccardo","orcid":null},"institutions":[{"id":"https://openalex.org/I40891861","display_name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia","ror":"https://ror.org/01f8vhd41","country_code":"BR","type":"government","lineage":["https://openalex.org/I2801200668","https://openalex.org/I2802647933","https://openalex.org/I40891861"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Davidson R. Boccardo","raw_affiliation_strings":["Brazilian National Institute of Metrology, Quality and Technology - Inmetro, Rio de Janeiro, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brazilian National Institute of Metrology, Quality and Technology - Inmetro, Rio de Janeiro, Brazil","institution_ids":["https://openalex.org/I40891861"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036855105","display_name":"Raphael C. S. Machado","orcid":"https://orcid.org/0000-0003-3339-9735"},"institutions":[{"id":"https://openalex.org/I40891861","display_name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia","ror":"https://ror.org/01f8vhd41","country_code":"BR","type":"government","lineage":["https://openalex.org/I2801200668","https://openalex.org/I2802647933","https://openalex.org/I40891861"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Raphael C. S. Machado","raw_affiliation_strings":["Brazilian National Institute of Metrology, Quality and Technology - Inmetro, Rio de Janeiro, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brazilian National Institute of Metrology, Quality and Technology - Inmetro, Rio de Janeiro, Brazil","institution_ids":["https://openalex.org/I40891861"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038576844","display_name":"Sergio Camara","orcid":null},"institutions":[{"id":"https://openalex.org/I40891861","display_name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia","ror":"https://ror.org/01f8vhd41","country_code":"BR","type":"government","lineage":["https://openalex.org/I2801200668","https://openalex.org/I2802647933","https://openalex.org/I40891861"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Sergio M. Camara","raw_affiliation_strings":["Brazilian National Institute of Metrology, Quality and Technology - Inmetro, Rio de Janeiro, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brazilian National Institute of Metrology, Quality and Technology - Inmetro, Rio de Janeiro, Brazil","institution_ids":["https://openalex.org/I40891861"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103163883","display_name":"Charles B. Prado","orcid":"https://orcid.org/0000-0003-3119-9772"},"institutions":[{"id":"https://openalex.org/I40891861","display_name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia","ror":"https://ror.org/01f8vhd41","country_code":"BR","type":"government","lineage":["https://openalex.org/I2801200668","https://openalex.org/I2802647933","https://openalex.org/I40891861"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Charles B. do Prado","raw_affiliation_strings":["Brazilian National Institute of Metrology, Quality and Technology - Inmetro, Rio de Janeiro, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brazilian National Institute of Metrology, Quality and Technology - Inmetro, Rio de Janeiro, Brazil","institution_ids":["https://openalex.org/I40891861"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034828758","display_name":"Wilson S. Melo","orcid":"https://orcid.org/0000-0002-7710-7995"},"institutions":[{"id":"https://openalex.org/I40891861","display_name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia","ror":"https://ror.org/01f8vhd41","country_code":"BR","type":"government","lineage":["https://openalex.org/I2801200668","https://openalex.org/I2802647933","https://openalex.org/I40891861"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Wilson S. Melo","raw_affiliation_strings":["Brazilian National Institute of Metrology, Quality and Technology - Inmetro, Rio de Janeiro, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brazilian National Institute of Metrology, Quality and Technology - Inmetro, Rio de Janeiro, Brazil","institution_ids":["https://openalex.org/I40891861"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002630102","display_name":"Leonardo Costa Ribeiro","orcid":"https://orcid.org/0000-0002-7772-9313"},"institutions":[{"id":"https://openalex.org/I40891861","display_name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia","ror":"https://ror.org/01f8vhd41","country_code":"BR","type":"government","lineage":["https://openalex.org/I2801200668","https://openalex.org/I2802647933","https://openalex.org/I40891861"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Leonardo C. Ribeiro","raw_affiliation_strings":["Brazilian National Institute of Metrology, Quality and Technology - Inmetro, Rio de Janeiro, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brazilian National Institute of Metrology, Quality and Technology - Inmetro, Rio de Janeiro, Brazil","institution_ids":["https://openalex.org/I40891861"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041466653","display_name":"Luiz Fernando Rust da Costa Carmo","orcid":"https://orcid.org/0000-0001-6131-7771"},"institutions":[{"id":"https://openalex.org/I40891861","display_name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia","ror":"https://ror.org/01f8vhd41","country_code":"BR","type":"government","lineage":["https://openalex.org/I2801200668","https://openalex.org/I2802647933","https://openalex.org/I40891861"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Luiz F. R. da Costa Carmo","raw_affiliation_strings":["Brazilian National Institute of Metrology, Quality and Technology - Inmetro, Rio de Janeiro, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brazilian National Institute of Metrology, Quality and Technology - Inmetro, Rio de Janeiro, Brazil","institution_ids":["https://openalex.org/I40891861"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I40891861"],"apc_list":null,"apc_paid":null,"fwci":0.4489,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.5962539,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"241 244","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13612","display_name":"Advanced Scientific and Engineering Studies","score":0.9889000058174133,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T13612","display_name":"Advanced Scientific and Engineering Studies","score":0.9889000058174133,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13885","display_name":"Geophysics and Sensor Technology","score":0.9750999808311462,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13018","display_name":"Seismology and Earthquake Studies","score":0.9710000157356262,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6198055148124695},{"id":"https://openalex.org/keywords/traceability","display_name":"Traceability","score":0.5973851680755615},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5887027978897095},{"id":"https://openalex.org/keywords/verification-and-validation","display_name":"Verification and validation","score":0.5675239562988281},{"id":"https://openalex.org/keywords/correctness","display_name":"Correctness","score":0.5645775198936462},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.5096981525421143},{"id":"https://openalex.org/keywords/conformity","display_name":"Conformity","score":0.4820047914981842},{"id":"https://openalex.org/keywords/work","display_name":"Work (physics)","score":0.4237178862094879},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3749759793281555},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.35435277223587036},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.1794413924217224},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1634451448917389}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6198055148124695},{"id":"https://openalex.org/C153876917","wikidata":"https://www.wikidata.org/wiki/Q899704","display_name":"Traceability","level":2,"score":0.5973851680755615},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5887027978897095},{"id":"https://openalex.org/C48002344","wikidata":"https://www.wikidata.org/wiki/Q2919644","display_name":"Verification and validation","level":2,"score":0.5675239562988281},{"id":"https://openalex.org/C55439883","wikidata":"https://www.wikidata.org/wiki/Q360812","display_name":"Correctness","level":2,"score":0.5645775198936462},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.5096981525421143},{"id":"https://openalex.org/C142172996","wikidata":"https://www.wikidata.org/wiki/Q221284","display_name":"Conformity","level":2,"score":0.4820047914981842},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.4237178862094879},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3749759793281555},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.35435277223587036},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.1794413924217224},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1634451448917389},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/memea.2014.6860090","is_oa":false,"landing_page_url":"https://doi.org/10.1109/memea.2014.6860090","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Symposium on Medical Measurements and Applications (MeMeA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6499999761581421,"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1973144647","https://openalex.org/W2016310411","https://openalex.org/W2059156768","https://openalex.org/W2059378462","https://openalex.org/W2100505193","https://openalex.org/W2141726502","https://openalex.org/W2277781126","https://openalex.org/W4300978744"],"related_works":["https://openalex.org/W2011517474","https://openalex.org/W3093361777","https://openalex.org/W2375986109","https://openalex.org/W4312551713","https://openalex.org/W4386545958","https://openalex.org/W2061182527","https://openalex.org/W4252128182","https://openalex.org/W2050458297","https://openalex.org/W2361343466","https://openalex.org/W3027371154"],"abstract_inverted_index":{"Software":[0],"validation":[1,14,72],"is":[2,67],"a":[3,70],"critical":[4],"issue":[5],"in":[6,17,30],"several":[7],"applications.":[8],"For":[9],"medical":[10,32],"instruments,":[11,33],"an":[12,56,61,65,92],"ineffective":[13],"may":[15],"result":[16],"human":[18],"injuries":[19],"and":[20,42,76,82,110,118],"death.":[21],"We":[22],"consider":[23],"the":[24,39,80,87,96,103,106,112,121],"problem":[25],"of":[26,38,64,73,98,120],"analyzing":[27],"software":[28,75],"embedded":[29],"these":[31],"correlating":[34],"with":[35],"other":[36],"instruments":[37],"Legal":[40],"Metrology":[41],"Conformity":[43],"Assessment,":[44],"such":[45,54],"as":[46],"smart":[47],"meters":[48],"or":[49],"employee":[50],"payroll":[51],"recorders.":[52],"In":[53,86],"cases,":[55],"effective":[57],"way":[58],"to":[59,68,102],"guarantee":[60],"appropriate":[62],"behavior":[63],"instrument":[66],"conduct":[69],"complete":[71],"its":[74],"hardware":[77,83],"\u2014":[78],"including":[79],"source-code":[81],"topology":[84],"details.":[85],"present":[88],"work,":[89],"we":[90],"describe":[91],"approach":[93],"that":[94],"reduces":[95],"amount":[97],"intellectual":[99,108],"property":[100],"released":[101],"regulator,":[104],"protecting":[105],"manufacturer's":[107],"property,":[109],"at":[111],"same":[113],"time":[114],"it":[115],"provides":[116],"traceability":[117],"correctness":[119],"measurements.":[122]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}