{"id":"https://openalex.org/W4235868607","doi":"https://doi.org/10.1109/memcod.2003.1210094","title":"Panel: hierarchical and incremental verification for system level design: challenges and accomplishments","display_name":"Panel: hierarchical and incremental verification for system level design: challenges and accomplishments","publication_year":2005,"publication_date":"2005-04-12","ids":{"openalex":"https://openalex.org/W4235868607","doi":"https://doi.org/10.1109/memcod.2003.1210094"},"language":"en","primary_location":{"id":"doi:10.1109/memcod.2003.1210094","is_oa":false,"landing_page_url":"https://doi.org/10.1109/memcod.2003.1210094","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"First ACM and IEEE International Conference on Formal Methods and Models for Co-Design, 2003. MEMOCODE '03. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067197546","display_name":"G. Martin","orcid":null},"institutions":[{"id":"https://openalex.org/I148283060","display_name":"Lawrence Berkeley National Laboratory","ror":"https://ror.org/02jbv0t02","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I148283060","https://openalex.org/I39565521"]},{"id":"https://openalex.org/I66217453","display_name":"Cadence Design Systems (United States)","ror":"https://ror.org/04w8xa018","country_code":"US","type":"company","lineage":["https://openalex.org/I66217453"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"G. Martin","raw_affiliation_strings":["Cadence Berkeley Laboratories, Berkeley, CA, USA"],"affiliations":[{"raw_affiliation_string":"Cadence Berkeley Laboratories, Berkeley, CA, USA","institution_ids":["https://openalex.org/I66217453","https://openalex.org/I148283060"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028057771","display_name":"S. Shukla","orcid":null},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Shukla","raw_affiliation_strings":["Electrical and Computer Engineering Department, Virginia Polytechnic Institute and State University, Blacksburg, VA, USA"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, Virginia Polytechnic Institute and State University, Blacksburg, VA, USA","institution_ids":["https://openalex.org/I859038795"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5067197546"],"corresponding_institution_ids":["https://openalex.org/I148283060","https://openalex.org/I66217453"],"apc_list":null,"apc_paid":null,"fwci":0.5156,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.71694303,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"97","last_page":"99"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.8601999878883362,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.8601999878883362,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.7731000185012817,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.667227029800415},{"id":"https://openalex.org/keywords/electronic-system-level-design-and-verification","display_name":"Electronic system-level design and verification","score":0.47027331590652466},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.32843393087387085},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.3227512836456299},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.2002253234386444}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.667227029800415},{"id":"https://openalex.org/C77495112","wikidata":"https://www.wikidata.org/wiki/Q5358436","display_name":"Electronic system-level design and verification","level":2,"score":0.47027331590652466},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.32843393087387085},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.3227512836456299},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.2002253234386444}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/memcod.2003.1210094","is_oa":false,"landing_page_url":"https://doi.org/10.1109/memcod.2003.1210094","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"First ACM and IEEE International Conference on Formal Methods and Models for Co-Design, 2003. MEMOCODE '03. Proceedings.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","score":0.5899999737739563,"id":"https://metadata.un.org/sdg/13"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4237771018","https://openalex.org/W1572417577","https://openalex.org/W2103384799","https://openalex.org/W2351011383","https://openalex.org/W2099466221","https://openalex.org/W4247903974","https://openalex.org/W2165127864","https://openalex.org/W2125503095","https://openalex.org/W1550409889","https://openalex.org/W37150954"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}