{"id":"https://openalex.org/W1598846430","doi":"https://doi.org/10.1109/med.2015.7158773","title":"Timed Discrete event system approach to online testing of asynchronous circuits","display_name":"Timed Discrete event system approach to online testing of asynchronous circuits","publication_year":2015,"publication_date":"2015-06-01","ids":{"openalex":"https://openalex.org/W1598846430","doi":"https://doi.org/10.1109/med.2015.7158773","mag":"1598846430"},"language":"en","primary_location":{"id":"doi:10.1109/med.2015.7158773","is_oa":false,"landing_page_url":"https://doi.org/10.1109/med.2015.7158773","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 23rd Mediterranean Conference on Control and Automation (MED)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5055447641","display_name":"Pradeep Kumar Biswal","orcid":"https://orcid.org/0000-0001-5687-8179"},"institutions":[{"id":"https://openalex.org/I1317621060","display_name":"Indian Institute of Technology Guwahati","ror":"https://ror.org/0022nd079","country_code":"IN","type":"education","lineage":["https://openalex.org/I1317621060"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Pradeep Kumar Biswal","raw_affiliation_strings":["Dept. of Computer Science and Engineering, Indian Institute of Technology, Guwahati, India","Department of Computer Science, and Engineering, Indian Institute of Technology Guwahati, India"],"affiliations":[{"raw_affiliation_string":"Dept. of Computer Science and Engineering, Indian Institute of Technology, Guwahati, India","institution_ids":["https://openalex.org/I1317621060"]},{"raw_affiliation_string":"Department of Computer Science, and Engineering, Indian Institute of Technology Guwahati, India","institution_ids":["https://openalex.org/I1317621060"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052215348","display_name":"Santosh Biswas","orcid":"https://orcid.org/0000-0003-3020-4154"},"institutions":[{"id":"https://openalex.org/I1317621060","display_name":"Indian Institute of Technology Guwahati","ror":"https://ror.org/0022nd079","country_code":"IN","type":"education","lineage":["https://openalex.org/I1317621060"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Santosh Biswas","raw_affiliation_strings":["Dept. of Computer Science and Engineering, Indian Institute of Technology, Guwahati, India","Department of Computer Science, and Engineering, Indian Institute of Technology Guwahati, India"],"affiliations":[{"raw_affiliation_string":"Dept. of Computer Science and Engineering, Indian Institute of Technology, Guwahati, India","institution_ids":["https://openalex.org/I1317621060"]},{"raw_affiliation_string":"Department of Computer Science, and Engineering, Indian Institute of Technology Guwahati, India","institution_ids":["https://openalex.org/I1317621060"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5055447641"],"corresponding_institution_ids":["https://openalex.org/I1317621060"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.03379292,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"16","issue":null,"first_page":"341","last_page":"348"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/asynchronous-communication","display_name":"Asynchronous communication","score":0.7889753580093384},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7564241886138916},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.6905739307403564},{"id":"https://openalex.org/keywords/semaphore","display_name":"Semaphore","score":0.6821227073669434},{"id":"https://openalex.org/keywords/asynchronous-circuit","display_name":"Asynchronous circuit","score":0.6411466002464294},{"id":"https://openalex.org/keywords/correctness","display_name":"Correctness","score":0.6411119103431702},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5889687538146973},{"id":"https://openalex.org/keywords/asynchronous-system","display_name":"Asynchronous system","score":0.5550746917724609},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.46264731884002686},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.45920661091804504},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.4582192003726959},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4282362163066864},{"id":"https://openalex.org/keywords/synchronization","display_name":"Synchronization (alternating current)","score":0.42390093207359314},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.4192524552345276},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3727034032344818},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.255977064371109},{"id":"https://openalex.org/keywords/clock-signal","display_name":"Clock signal","score":0.21540376543998718},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.21164315938949585},{"id":"https://openalex.org/keywords/synchronous-circuit","display_name":"Synchronous circuit","score":0.1705307960510254},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13879400491714478},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1167561411857605},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.08097571134567261}],"concepts":[{"id":"https://openalex.org/C151319957","wikidata":"https://www.wikidata.org/wiki/Q752739","display_name":"Asynchronous communication","level":2,"score":0.7889753580093384},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7564241886138916},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.6905739307403564},{"id":"https://openalex.org/C95203288","wikidata":"https://www.wikidata.org/wiki/Q221682","display_name":"Semaphore","level":2,"score":0.6821227073669434},{"id":"https://openalex.org/C87695204","wikidata":"https://www.wikidata.org/wiki/Q629971","display_name":"Asynchronous circuit","level":5,"score":0.6411466002464294},{"id":"https://openalex.org/C55439883","wikidata":"https://www.wikidata.org/wiki/Q360812","display_name":"Correctness","level":2,"score":0.6411119103431702},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5889687538146973},{"id":"https://openalex.org/C7923308","wikidata":"https://www.wikidata.org/wiki/Q4812211","display_name":"Asynchronous system","level":5,"score":0.5550746917724609},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.46264731884002686},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.45920661091804504},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.4582192003726959},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4282362163066864},{"id":"https://openalex.org/C2778562939","wikidata":"https://www.wikidata.org/wiki/Q1298791","display_name":"Synchronization (alternating current)","level":3,"score":0.42390093207359314},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.4192524552345276},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3727034032344818},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.255977064371109},{"id":"https://openalex.org/C137059387","wikidata":"https://www.wikidata.org/wiki/Q426882","display_name":"Clock signal","level":3,"score":0.21540376543998718},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.21164315938949585},{"id":"https://openalex.org/C42196554","wikidata":"https://www.wikidata.org/wiki/Q1186179","display_name":"Synchronous circuit","level":4,"score":0.1705307960510254},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13879400491714478},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1167561411857605},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.08097571134567261},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/med.2015.7158773","is_oa":false,"landing_page_url":"https://doi.org/10.1109/med.2015.7158773","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 23rd Mediterranean Conference on Control and Automation (MED)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1529208532","https://openalex.org/W1547948144","https://openalex.org/W1906369229","https://openalex.org/W1966547590","https://openalex.org/W1969127849","https://openalex.org/W2035720669","https://openalex.org/W2064418024","https://openalex.org/W2071482811","https://openalex.org/W2072572082","https://openalex.org/W2088302981","https://openalex.org/W2094461746","https://openalex.org/W2096737976","https://openalex.org/W2106714226","https://openalex.org/W2119810157","https://openalex.org/W2121883482","https://openalex.org/W2124264087","https://openalex.org/W2127700382","https://openalex.org/W2128620504","https://openalex.org/W2130995731","https://openalex.org/W2133361634","https://openalex.org/W2141784591","https://openalex.org/W2147942902","https://openalex.org/W2149342955","https://openalex.org/W2151088563","https://openalex.org/W2155161304","https://openalex.org/W2163578050","https://openalex.org/W2164815137","https://openalex.org/W2168545508","https://openalex.org/W2174635824","https://openalex.org/W4298011152","https://openalex.org/W6675783969","https://openalex.org/W6681787616","https://openalex.org/W6684799195"],"related_works":["https://openalex.org/W4312516786","https://openalex.org/W2146990170","https://openalex.org/W2093992207","https://openalex.org/W2085028021","https://openalex.org/W1993985975","https://openalex.org/W3094139610","https://openalex.org/W2129978639","https://openalex.org/W304800142","https://openalex.org/W2388325543","https://openalex.org/W2035720669"],"abstract_inverted_index":{"Now-a-days":[0],"On-line":[1],"testing":[2,27,105],"becomes":[3],"an":[4,129],"indispensable":[5],"part":[6],"of":[7,23,43,48,54,61,64,70,78,89,106,116,156],"DFT":[8],"(design":[9],"for":[10,12,30],"testability)":[11],"detecting":[13],"rapidly":[14],"increasing":[15],"intermittent":[16],"faults":[17],"in":[18,95,148,170],"deep":[19],"sub-micron":[20],"ICs.":[21],"Much":[22],"the":[24,52,55,75,79,87,96,114,117,138,144,171],"proposed":[25,110],"on-line":[26,104,140],"techniques":[28,42],"are":[29,74,159],"synchronous":[31],"circuits":[32,45],"as":[33],"compared":[34,165],"to":[35,103,166],"asynchronous":[36,44,107],"circuits.":[37,108],"The":[38,58,109,135,153],"existing":[39],"online":[40],"testing(OLT)":[41],"involve":[46],"development":[47],"checkers":[49,65],"that":[50],"verify":[51],"correctness":[53],"predefined":[56],"protocol.":[57],"area":[59,163],"overhead":[60],"this":[62,82,157],"type":[63],"is":[66,133,146],"quit":[67],"high":[68],"because":[69],"Mutex":[71],"blocks,":[72],"which":[73],"main":[76,154],"component":[77],"checker.":[80],"In":[81],"paper,":[83],"we":[84],"have":[85],"adapted":[86],"theory":[88],"Failure":[90],"Detection":[91],"and":[92,121,127,141,161],"Diagnosis(FDD)":[93],"available":[94],"literature":[97],"on":[98],"Timed":[99],"Discrete":[100],"Event":[101],"Systems(TDES)":[102],"scheme":[111,158],"includes":[112],"modeling":[113],"behavior":[115],"circuit":[118,132,139,145],"under":[119],"normal":[120,149],"various":[122],"stuck":[123],"at":[124],"fault":[125],"conditions":[126],"eventually,":[128],"on-chip":[130],"detector":[131,136],"designed.":[134],"monitors":[137],"determines":[142],"whether":[143],"functioning":[147],"or":[150],"failure":[151],"mode.":[152],"advantages":[155],"non-intrusiveness":[160],"low":[162],"overheads":[164],"similar":[167],"schemes":[168],"reported":[169],"literature.":[172]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}