{"id":"https://openalex.org/W2082936418","doi":"https://doi.org/10.1109/med.2014.6961385","title":"Similar sample selection approach based on sequence alignment; application to semiconductor industry","display_name":"Similar sample selection approach based on sequence alignment; application to semiconductor industry","publication_year":2014,"publication_date":"2014-06-01","ids":{"openalex":"https://openalex.org/W2082936418","doi":"https://doi.org/10.1109/med.2014.6961385","mag":"2082936418"},"language":"en","primary_location":{"id":"doi:10.1109/med.2014.6961385","is_oa":false,"landing_page_url":"https://doi.org/10.1109/med.2014.6961385","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"22nd Mediterranean Conference on Control and Automation","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110494333","display_name":"Mohamad Chakaroun","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114274","display_name":"Laboratoire d\u2019Informatique et Syst\u00e8mes","ror":"https://ror.org/0257sgk90","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I143002897","https://openalex.org/I21491767","https://openalex.org/I4210114274"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Mohamad Chakaroun","raw_affiliation_strings":["Laboratory of Information Sciences and Systems, France","Process Control departement in ST Microelectronics, France"],"affiliations":[{"raw_affiliation_string":"Laboratory of Information Sciences and Systems, France","institution_ids":["https://openalex.org/I4210114274"]},{"raw_affiliation_string":"Process Control departement in ST Microelectronics, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090018285","display_name":"Mohand Djeziri","orcid":"https://orcid.org/0000-0002-1597-3193"},"institutions":[{"id":"https://openalex.org/I4210114274","display_name":"Laboratoire d\u2019Informatique et Syst\u00e8mes","ror":"https://ror.org/0257sgk90","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I143002897","https://openalex.org/I21491767","https://openalex.org/I4210114274"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Mohand Djeziri","raw_affiliation_strings":["Laboratory of Information Sciences and Systems, France"],"affiliations":[{"raw_affiliation_string":"Laboratory of Information Sciences and Systems, France","institution_ids":["https://openalex.org/I4210114274"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110160381","display_name":"Mustapha Ouladsine","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114274","display_name":"Laboratoire d\u2019Informatique et Syst\u00e8mes","ror":"https://ror.org/0257sgk90","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I143002897","https://openalex.org/I21491767","https://openalex.org/I4210114274"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Mustapha Ouladsine","raw_affiliation_strings":["Laboratory of Information Sciences and Systems, France"],"affiliations":[{"raw_affiliation_string":"Laboratory of Information Sciences and Systems, France","institution_ids":["https://openalex.org/I4210114274"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011705857","display_name":"Jacques Pinaton","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Jacques Pinaton","raw_affiliation_strings":["Process Control departement in ST Microelectronics, France"],"affiliations":[{"raw_affiliation_string":"Process Control departement in ST Microelectronics, France","institution_ids":["https://openalex.org/I4210104693"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5110494333"],"corresponding_institution_ids":["https://openalex.org/I4210104693","https://openalex.org/I4210114274"],"apc_list":null,"apc_paid":null,"fwci":0.6158,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.76182604,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"287","last_page":"292"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11741","display_name":"Flexible and Reconfigurable Manufacturing Systems","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.7069038152694702},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5982952117919922},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5850560069084167},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.5664029121398926},{"id":"https://openalex.org/keywords/semiconductor-device-fabrication","display_name":"Semiconductor device fabrication","score":0.5296594500541687},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.5289922952651978},{"id":"https://openalex.org/keywords/sequence","display_name":"Sequence (biology)","score":0.5279901027679443},{"id":"https://openalex.org/keywords/similarity","display_name":"Similarity (geometry)","score":0.5074395537376404},{"id":"https://openalex.org/keywords/root-cause","display_name":"Root cause","score":0.4711925983428955},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.2743754982948303},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.236050546169281},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.23104700446128845}],"concepts":[{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.7069038152694702},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5982952117919922},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5850560069084167},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.5664029121398926},{"id":"https://openalex.org/C66018809","wikidata":"https://www.wikidata.org/wiki/Q1570432","display_name":"Semiconductor device fabrication","level":3,"score":0.5296594500541687},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.5289922952651978},{"id":"https://openalex.org/C2778112365","wikidata":"https://www.wikidata.org/wiki/Q3511065","display_name":"Sequence (biology)","level":2,"score":0.5279901027679443},{"id":"https://openalex.org/C103278499","wikidata":"https://www.wikidata.org/wiki/Q254465","display_name":"Similarity (geometry)","level":3,"score":0.5074395537376404},{"id":"https://openalex.org/C84945661","wikidata":"https://www.wikidata.org/wiki/Q7366567","display_name":"Root cause","level":2,"score":0.4711925983428955},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2743754982948303},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.236050546169281},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.23104700446128845},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/med.2014.6961385","is_oa":false,"landing_page_url":"https://doi.org/10.1109/med.2014.6961385","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"22nd Mediterranean Conference on Control and Automation","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.6200000047683716,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W114677292","https://openalex.org/W1600715103","https://openalex.org/W1964243794","https://openalex.org/W1990484865","https://openalex.org/W2020460778","https://openalex.org/W2028969961","https://openalex.org/W2074231493","https://openalex.org/W2087064593","https://openalex.org/W2103117824","https://openalex.org/W2107629050","https://openalex.org/W2123974696","https://openalex.org/W2135674775","https://openalex.org/W2151186428","https://openalex.org/W2163270687","https://openalex.org/W2164816439","https://openalex.org/W4236952641","https://openalex.org/W6657592914","https://openalex.org/W6676238595"],"related_works":["https://openalex.org/W4205762803","https://openalex.org/W2754538212","https://openalex.org/W2375480909","https://openalex.org/W2535856026","https://openalex.org/W2265065644","https://openalex.org/W2353314428","https://openalex.org/W2012019886","https://openalex.org/W2166090428","https://openalex.org/W2799474201","https://openalex.org/W3166468957"],"abstract_inverted_index":{"In":[0,55],"semiconductor":[1,49,158],"manufacturing":[2,159],"system,":[3],"diagnosis":[4,46],"method":[5],"consists":[6],"in":[7,30,48,116,129,147,157],"measuring":[8],"and":[9,26,136],"comparing":[10],"similar":[11,42,60,134,167],"samples":[12,43,61,168],"that":[13,169],"are":[14],"taken":[15],"at":[16],"the":[17,23,27,34,39,63,70,85,111,117,127,133,139,151,174],"same":[18,24,28],"process":[19,74],"level,":[20,75],"processed":[21],"by":[22],"equipment":[25],"instructions":[29],"order":[31,130,148],"to":[32,81,97,125,131,137,149],"identify":[33],"defect":[35],"root":[36],"cause.":[37],"However,":[38],"number":[40,165],"of":[41,114,166,182],"available":[44],"for":[45,62,173],"analysis":[47,64,183],"industries":[50],"is":[51,65,123],"often":[52],"very":[53],"limited.":[54],"this":[56],"case,":[57],"select":[58],"more":[59],"a":[66,103,163,179],"great":[67],"challenge.":[68],"First,":[69],"different":[71],"factors":[72],"(same":[73],"measurable":[76],"sample,":[77],"comparable":[78],"sample)":[79],"need":[80,96],"be":[82,98,171],"considered.":[83],"Second,":[84],"various":[86],"data":[87,156],"(process":[88],"historic":[89],"data,":[90,93],"product":[91],"models":[92],"measurement":[94,175],"data)":[95],"analyzed.":[99],"This":[100],"paper":[101],"proposes":[102],"Similar":[104],"Samples":[105],"Selection":[106],"(3S)":[107],"approach":[108,153],"based":[109],"on":[110,154],"activity":[112],"sequences":[113],"products":[115],"process.":[118],"Local":[119],"sequence":[120],"alignment":[121],"algorithm":[122],"used":[124],"align":[126],"activities":[128],"determine":[132],"regions":[135],"calculate":[138],"similarity":[140],"index.":[141],"A":[142],"prototype":[143],"has":[144],"been":[145],"developed":[146],"test":[150],"proposed":[152],"real":[155],"system.":[160],"Result":[161],"shows":[162],"large":[164],"could":[170],"selected":[172],"as":[176,178],"well":[177],"significant":[180],"reduction":[181],"time.":[184]},"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}