{"id":"https://openalex.org/W4411726359","doi":"https://doi.org/10.1109/meco66322.2025.11049202","title":"Digital Image Analysis of Surface Quality in Manufactured Flat Optical Lenses","display_name":"Digital Image Analysis of Surface Quality in Manufactured Flat Optical Lenses","publication_year":2025,"publication_date":"2025-06-10","ids":{"openalex":"https://openalex.org/W4411726359","doi":"https://doi.org/10.1109/meco66322.2025.11049202"},"language":"en","primary_location":{"id":"doi:10.1109/meco66322.2025.11049202","is_oa":false,"landing_page_url":"https://doi.org/10.1109/meco66322.2025.11049202","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 14th Mediterranean Conference on Embedded Computing (MECO)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006685342","display_name":"Vladimir Hristov","orcid":"https://orcid.org/0000-0002-1613-2177"},"institutions":[{"id":"https://openalex.org/I31151848","display_name":"Technical University of Sofia","ror":"https://ror.org/052prhs50","country_code":"BG","type":"education","lineage":["https://openalex.org/I31151848"]}],"countries":["BG"],"is_corresponding":false,"raw_author_name":"Vladimir Hristov","raw_affiliation_strings":["Technical University of Sofia,Faculty of Automatics,Sofia,Bulgaria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technical University of Sofia,Faculty of Automatics,Sofia,Bulgaria","institution_ids":["https://openalex.org/I31151848"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078674630","display_name":"Dimitar Pepedzhiev","orcid":null},"institutions":[{"id":"https://openalex.org/I31151848","display_name":"Technical University of Sofia","ror":"https://ror.org/052prhs50","country_code":"BG","type":"education","lineage":["https://openalex.org/I31151848"]}],"countries":["BG"],"is_corresponding":false,"raw_author_name":"Dimitar Pepedzhiev","raw_affiliation_strings":["Technical University of Sofia,Faculty of Automatics,Sofia,Bulgaria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technical University of Sofia,Faculty of Automatics,Sofia,Bulgaria","institution_ids":["https://openalex.org/I31151848"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I31151848"],"apc_list":null,"apc_paid":null,"fwci":9.1182,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.97661053,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9384999871253967,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9384999871253967,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.5009133815765381},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.49578580260276794},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.49431324005126953},{"id":"https://openalex.org/keywords/image-quality","display_name":"Image quality","score":0.41698235273361206},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3869645595550537},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.33924657106399536},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.2966238260269165},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.2945190668106079},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19962522387504578},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19082826375961304},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.14324608445167542}],"concepts":[{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.5009133815765381},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.49578580260276794},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.49431324005126953},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.41698235273361206},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3869645595550537},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.33924657106399536},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.2966238260269165},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.2945190668106079},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19962522387504578},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19082826375961304},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.14324608445167542},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/meco66322.2025.11049202","is_oa":false,"landing_page_url":"https://doi.org/10.1109/meco66322.2025.11049202","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 14th Mediterranean Conference on Embedded Computing (MECO)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2049814681","https://openalex.org/W4361186119"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W4404995717","https://openalex.org/W2016187641","https://openalex.org/W4404725684","https://openalex.org/W4246450666","https://openalex.org/W4388998267","https://openalex.org/W4409278740","https://openalex.org/W2898370298","https://openalex.org/W4410118003","https://openalex.org/W2137437058"],"abstract_inverted_index":{"The":[0,59,114],"production":[1],"of":[2,64,69],"optical":[3],"lenses":[4],"demands":[5],"stringent":[6],"quality":[7,123],"control":[8],"to":[9,79],"ensure":[10],"compliance":[11],"with":[12,87],"international":[13],"standards,":[14],"particularly":[15],"ISO":[16],"10110-7":[17],"for":[18,40,120,127],"surface":[19],"defects.":[20],"Traditional":[21],"manual":[22],"inspection":[23],"methods":[24],"are":[25],"labor-intensive":[26],"and":[27,55,73,92,108],"subjective,":[28],"necessitating":[29],"automated":[30,93],"solutions.":[31],"This":[32],"study":[33],"presents":[34],"a":[35,47,62],"cost-effective,":[36],"microscope-based":[37],"imaging":[38],"system":[39,60,116],"defect":[41,83,98,104],"analysis":[42],"in":[43,97],"plano-parallel":[44],"lenses,":[45],"integrating":[46],"high-resolution":[48],"Euromex":[49],"camera,":[50],"Schoelly":[51],"Flexilux":[52],"LED":[53],"illumination,":[54],"ImageFocus":[56],"Alpha":[57],"software.":[58],"achieves":[61],"resolution":[63],"0.8":[65],"\u00b5m/pixel,":[66],"enabling":[67],"detection":[68],"scratches":[70],"\u22651":[71],"\u00b5m":[72],"pits":[74],"\u226550":[75],"\u00b5m2,":[76],"while":[77],"adhering":[78],"the":[80,118],"5%":[81],"total":[82],"area":[84],"limit.":[85],"Calibration":[86],"NIST-traceable":[88],"standards":[89],"ensures":[90],"traceability,":[91],"workflows":[94],"reduce":[95],"subjectivity":[96],"assessment.":[99],"Experimental":[100],"results":[101],"demonstrate":[102],"successful":[103],"identification,":[105],"including":[106],"chips":[107],"scratches,":[109],"validated":[110],"against":[111],"reference":[112],"etalons.":[113],"proposed":[115],"lays":[117],"groundwork":[119],"future":[121],"AI-driven":[122],"control,":[124],"offering":[125],"scalability":[126],"industrial":[128],"applications.":[129]},"counts_by_year":[{"year":2025,"cited_by_count":3}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}