{"id":"https://openalex.org/W4400276910","doi":"https://doi.org/10.1109/meco62516.2024.10577831","title":"Measuring the SoC development process quality with Fault-slip-Through methodology","display_name":"Measuring the SoC development process quality with Fault-slip-Through methodology","publication_year":2024,"publication_date":"2024-06-11","ids":{"openalex":"https://openalex.org/W4400276910","doi":"https://doi.org/10.1109/meco62516.2024.10577831"},"language":"en","primary_location":{"id":"doi:10.1109/meco62516.2024.10577831","is_oa":false,"landing_page_url":"https://doi.org/10.1109/meco62516.2024.10577831","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 13th Mediterranean Conference on Embedded Computing (MECO)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5031662341","display_name":"Antti Rautakoura","orcid":"https://orcid.org/0000-0002-5236-8363"},"institutions":[{"id":"https://openalex.org/I166825849","display_name":"Tampere University","ror":"https://ror.org/033003e23","country_code":"FI","type":"education","lineage":["https://openalex.org/I166825849"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Antti Rautakoura","raw_affiliation_strings":["Tampere University,Computing Sciences,Tampere,Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tampere University,Computing Sciences,Tampere,Finland","institution_ids":["https://openalex.org/I166825849"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078390067","display_name":"Erno Salminen","orcid":null},"institutions":[{"id":"https://openalex.org/I166825849","display_name":"Tampere University","ror":"https://ror.org/033003e23","country_code":"FI","type":"education","lineage":["https://openalex.org/I166825849"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Erno Salminen","raw_affiliation_strings":["Tampere University,Computing Sciences,Tampere,Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tampere University,Computing Sciences,Tampere,Finland","institution_ids":["https://openalex.org/I166825849"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102937415","display_name":"Timo D. H\u00e4m\u00e4l\u00e4inen","orcid":"https://orcid.org/0000-0002-7867-0800"},"institutions":[{"id":"https://openalex.org/I166825849","display_name":"Tampere University","ror":"https://ror.org/033003e23","country_code":"FI","type":"education","lineage":["https://openalex.org/I166825849"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Timo H\u00e4m\u00e4l\u00e4inen","raw_affiliation_strings":["Tampere University,Computing Sciences,Tampere,Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tampere University,Computing Sciences,Tampere,Finland","institution_ids":["https://openalex.org/I166825849"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.443,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.57426726,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.561414897441864},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5218695402145386},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5006389617919922},{"id":"https://openalex.org/keywords/slip","display_name":"Slip (aerodynamics)","score":0.47836631536483765},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.429917573928833},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1658884882926941},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.0667741596698761},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.062170445919036865}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.561414897441864},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5218695402145386},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5006389617919922},{"id":"https://openalex.org/C195268267","wikidata":"https://www.wikidata.org/wiki/Q1928883","display_name":"Slip (aerodynamics)","level":2,"score":0.47836631536483765},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.429917573928833},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1658884882926941},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0667741596698761},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.062170445919036865},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/meco62516.2024.10577831","is_oa":false,"landing_page_url":"https://doi.org/10.1109/meco62516.2024.10577831","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 13th Mediterranean Conference on Embedded Computing (MECO)","raw_type":"proceedings-article"},{"id":"pmh:oai:trepo.tuni.fi:10024/225963","is_oa":false,"landing_page_url":"https://trepo.tuni.fi/handle/10024/225963","pdf_url":null,"source":{"id":"https://openalex.org/S7407055260","display_name":"Trepo - Institutional Repository of Tampere University","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"conference"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1494658332","https://openalex.org/W1988505672","https://openalex.org/W2064006372","https://openalex.org/W2101144553","https://openalex.org/W2563480821","https://openalex.org/W2899407111","https://openalex.org/W2913135501","https://openalex.org/W2936567838","https://openalex.org/W3015825087","https://openalex.org/W3115318755","https://openalex.org/W4308090474","https://openalex.org/W4313484901","https://openalex.org/W4313496611","https://openalex.org/W4316813660","https://openalex.org/W6614096965"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052","https://openalex.org/W2382290278","https://openalex.org/W2352015183"],"abstract_inverted_index":{"The":[0,45,135,167],"System-on-Chip":[1],"(SoC)":[2],"development":[3,67,81,99,124,154,164,178],"process":[4,68,78,100,142,165,179,189],"is":[5,30],"needed":[6,160],"to":[7,25,33,96,103,110,121,175,218],"manage":[8],"SoC":[9,66,98,123,131,163,177,186],"projects":[10],"in":[11,50,144],"terms":[12,51,145],"of":[13,52,125,139,146,152,197,212,224],"quality":[14,143,180],"and":[15,54,59,149,188],"schedule.":[16],"At":[17],"the":[18,35,65,104,112,117,122,153,192,198,203,210,213],"same":[19],"time":[20],"design":[21,46,187],"complexity":[22],"has":[23,69],"grown":[24],"a":[26,40,75],"level":[27],"where":[28],"it":[29],"nearly":[31],"impossible":[32],"get":[34],"chip":[36],"fully":[37],"bug-free":[38],"with":[39,132,181],"single":[41],"tapeout":[42],"without":[43],"re-spins.":[44],"tools":[47],"have":[48],"improved":[49],"efficiency":[53],"can":[55,172],"handle":[56],"more":[57,60],"extensive":[58],"complex":[61,126],"designs.":[62],"In":[63],"contrast,":[64],"taken":[70],"only":[71],"small":[72],"steps":[73],"from":[74],"conventional":[76],"waterfall-based":[77],"toward":[79],"agile":[80],"practices.":[82],"These":[83],"improvements":[84],"are":[85,91,194],"important,":[86],"but":[87,205],"so":[88],"far":[89],"there":[90],"no":[92],"quantified":[93],"measurements":[94,138],"done":[95],"evaluate":[97,176],"quality.":[101,166],"Due":[102],"situation,":[105],"we":[106],"present":[107],"novel":[108],"results":[109,157,168,193],"improve":[111],"current":[113],"state":[114],"by":[115],"applying":[116],"Fault-Slip-Through":[118],"(FST)":[119],"methodology":[120],"15":[127],"mm<sup":[128],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[129],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[130],"multiple":[133],"subsystems.":[134],"FST":[136,171],"includes":[137],"fault":[140],"costs,":[141],"slipped":[147,201],"bugs,":[148],"improvement":[150],"potential":[151],"process.":[155],"Our":[156],"provide":[158],"eagerly":[159],"insight":[161],"into":[162],"indicate":[169],"that":[170,195,206],"be":[173],"used":[174],"certain":[182],"considerations.":[183],"With":[184],"our":[185],"under":[190],"evaluation,":[191],"28%":[196],"found":[199],"bugs":[200],"through":[202],"milestones,":[204],"happened":[207],"mainly":[208],"at":[209],"beginning":[211],"project.":[214],"Fault":[215],"costs":[216],"due":[217],"slips":[219],"were":[220],"340":[221],"engineering":[222],"days":[223],"work.":[225]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}