{"id":"https://openalex.org/W3179668470","doi":"https://doi.org/10.1109/meco52532.2021.9460162","title":"Dynamic Swapping of Fault- Tolerant Architectures Based on FPGAs for Flexible Manufacturing Systems","display_name":"Dynamic Swapping of Fault- Tolerant Architectures Based on FPGAs for Flexible Manufacturing Systems","publication_year":2021,"publication_date":"2021-06-07","ids":{"openalex":"https://openalex.org/W3179668470","doi":"https://doi.org/10.1109/meco52532.2021.9460162","mag":"3179668470"},"language":"en","primary_location":{"id":"doi:10.1109/meco52532.2021.9460162","is_oa":false,"landing_page_url":"https://doi.org/10.1109/meco52532.2021.9460162","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 10th Mediterranean Conference on Embedded Computing (MECO)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028522101","display_name":"Gehad I. Alkady","orcid":"https://orcid.org/0000-0002-1965-8377"},"institutions":[{"id":"https://openalex.org/I107720978","display_name":"Ain Shams University","ror":"https://ror.org/00cb9w016","country_code":"EG","type":"education","lineage":["https://openalex.org/I107720978"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Gehad I. Alkady","raw_affiliation_strings":["Ain Shams University,Faculty of Engineering,Electronics and Electrical Communications Department,Cairo,Egypt","Electronics and Electrical Communications Department, Faculty of Engineering, Ain Shams University, Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ain Shams University,Faculty of Engineering,Electronics and Electrical Communications Department,Cairo,Egypt","institution_ids":["https://openalex.org/I107720978"]},{"raw_affiliation_string":"Electronics and Electrical Communications Department, Faculty of Engineering, Ain Shams University, Cairo, Egypt","institution_ids":["https://openalex.org/I107720978"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001909113","display_name":"Ihab Adly","orcid":"https://orcid.org/0000-0003-4513-9818"},"institutions":[{"id":"https://openalex.org/I154023281","display_name":"British University in Egypt","ror":"https://ror.org/0066fxv63","country_code":"EG","type":"education","lineage":["https://openalex.org/I154023281"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Ihab Adly","raw_affiliation_strings":["The British University in Egypt (BUE),Electrical Engineering Department,Cairo,Egypt","Electrical Engineering Department, The British University in Egypt (BUE), Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The British University in Egypt (BUE),Electrical Engineering Department,Cairo,Egypt","institution_ids":["https://openalex.org/I154023281"]},{"raw_affiliation_string":"Electrical Engineering Department, The British University in Egypt (BUE), Cairo, Egypt","institution_ids":["https://openalex.org/I154023281"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110743704","display_name":"Ram\u00e8z M. Daoud","orcid":null},"institutions":[{"id":"https://openalex.org/I80693520","display_name":"American University in Cairo","ror":"https://ror.org/0176yqn58","country_code":"EG","type":"education","lineage":["https://openalex.org/I80693520"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Ramez M. Daoud","raw_affiliation_strings":["The American University in Cairo,Electronics and Communication Engineering Department,Cairo,Egypt","Electronics and Communication Engineering Department, The American University in Cairo, Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The American University in Cairo,Electronics and Communication Engineering Department,Cairo,Egypt","institution_ids":["https://openalex.org/I80693520"]},{"raw_affiliation_string":"Electronics and Communication Engineering Department, The American University in Cairo, Cairo, Egypt","institution_ids":["https://openalex.org/I80693520"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046748172","display_name":"Yves Sallez","orcid":"https://orcid.org/0000-0002-3376-5566"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210089617","display_name":"Laboratoire d'Automatique, de M\u00e9canique et d'Informatique Industrielles et Humaines","ror":"https://ror.org/006z7v557","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210089617","https://openalex.org/I4210159245","https://openalex.org/I4387154098","https://openalex.org/I70348806","https://openalex.org/I70348806"]},{"id":"https://openalex.org/I70348806","display_name":"Universit\u00e9 Polytechnique Hauts-de-France","ror":"https://ror.org/02ezch769","country_code":"FR","type":"education","lineage":["https://openalex.org/I70348806"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Yves Sallez","raw_affiliation_strings":["LAMIH, UMR CNRS 8201, Université Polytechnique Hauts-de-France,Valenciennes,France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LAMIH, UMR CNRS 8201, Université Polytechnique Hauts-de-France,Valenciennes,France","institution_ids":["https://openalex.org/I4210089617","https://openalex.org/I1294671590","https://openalex.org/I70348806"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102912766","display_name":"Hany M. ElSayed","orcid":"https://orcid.org/0000-0003-1066-2238"},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Hany Elsayed","raw_affiliation_strings":["Cairo University,Electronics and Communications Engineering Department,Cairo,Egypt","Electronics and Communications Engineering Department, Cairo University, Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Cairo University,Electronics and Communications Engineering Department,Cairo,Egypt","institution_ids":["https://openalex.org/I145487455"]},{"raw_affiliation_string":"Electronics and Communications Engineering Department, Cairo University, Cairo, Egypt","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109553881","display_name":"Hassanein H. Amer","orcid":null},"institutions":[{"id":"https://openalex.org/I80693520","display_name":"American University in Cairo","ror":"https://ror.org/0176yqn58","country_code":"EG","type":"education","lineage":["https://openalex.org/I80693520"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Hassanein H. Amer","raw_affiliation_strings":["The American University in Cairo,Electronics and Communication Engineering Department,Cairo,Egypt","Electronics and Communication Engineering Department, The American University in Cairo, Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The American University in Cairo,Electronics and Communication Engineering Department,Cairo,Egypt","institution_ids":["https://openalex.org/I80693520"]},{"raw_affiliation_string":"Electronics and Communication Engineering Department, The American University in Cairo, Cairo, Egypt","institution_ids":["https://openalex.org/I80693520"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087597892","display_name":"Hani Ragai","orcid":"https://orcid.org/0000-0002-7999-8824"},"institutions":[{"id":"https://openalex.org/I107720978","display_name":"Ain Shams University","ror":"https://ror.org/00cb9w016","country_code":"EG","type":"education","lineage":["https://openalex.org/I107720978"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Hani F. Ragai","raw_affiliation_strings":["Ain Shams University,Faculty of Engineering,Electronics and Electrical Communications Department,Cairo,Egypt","Electronics and Electrical Communications Department, Faculty of Engineering, Ain Shams University, Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ain Shams University,Faculty of Engineering,Electronics and Electrical Communications Department,Cairo,Egypt","institution_ids":["https://openalex.org/I107720978"]},{"raw_affiliation_string":"Electronics and Electrical Communications Department, Faculty of Engineering, Ain Shams University, Cairo, Egypt","institution_ids":["https://openalex.org/I107720978"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11741","display_name":"Flexible and Reconfigurable Manufacturing Systems","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11741","display_name":"Flexible and Reconfigurable Manufacturing Systems","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11125","display_name":"Petri Nets in System Modeling","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10551","display_name":"Scheduling and Optimization Algorithms","score":0.9872000217437744,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spare-part","display_name":"Spare part","score":0.7748702764511108},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.651402473449707},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6258049011230469},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6045635342597961},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5749777555465698},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.5406064987182617},{"id":"https://openalex.org/keywords/production-line","display_name":"Production line","score":0.5363354086875916},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5328598022460938},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5307761430740356},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.45215344429016113},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.36182159185409546},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3267841935157776},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3230261206626892},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.08498087525367737}],"concepts":[{"id":"https://openalex.org/C194648553","wikidata":"https://www.wikidata.org/wiki/Q1364774","display_name":"Spare part","level":2,"score":0.7748702764511108},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.651402473449707},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6258049011230469},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6045635342597961},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5749777555465698},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.5406064987182617},{"id":"https://openalex.org/C99862985","wikidata":"https://www.wikidata.org/wiki/Q10858068","display_name":"Production line","level":2,"score":0.5363354086875916},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5328598022460938},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5307761430740356},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.45215344429016113},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.36182159185409546},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3267841935157776},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3230261206626892},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.08498087525367737},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/meco52532.2021.9460162","is_oa":false,"landing_page_url":"https://doi.org/10.1109/meco52532.2021.9460162","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 10th Mediterranean Conference on Embedded Computing (MECO)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-03710436v1","is_oa":false,"landing_page_url":"https://uphf.hal.science/hal-03710436","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"https://ieeexplore.ieee.org/document/9460162","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.41999998688697815,"id":"https://metadata.un.org/sdg/17","display_name":"Partnerships for the goals"},{"score":0.4000000059604645,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W652161612","https://openalex.org/W1491995787","https://openalex.org/W1523087909","https://openalex.org/W1533751637","https://openalex.org/W2312852230","https://openalex.org/W2392084527","https://openalex.org/W2555148761","https://openalex.org/W2878471950","https://openalex.org/W2900433245","https://openalex.org/W2907045127","https://openalex.org/W3092449994","https://openalex.org/W3128972319","https://openalex.org/W4231340621","https://openalex.org/W4243744907","https://openalex.org/W4253091331","https://openalex.org/W6790261316"],"related_works":["https://openalex.org/W2376859990","https://openalex.org/W2912704652","https://openalex.org/W2381161177","https://openalex.org/W2319226115","https://openalex.org/W830772239","https://openalex.org/W2970750595","https://openalex.org/W2366601680","https://openalex.org/W2392193501","https://openalex.org/W2738649048","https://openalex.org/W2387929917"],"abstract_inverted_index":{"Nowadays,":[0],"flexible":[1],"manufacturing":[2],"is":[3,15,37,76,146],"a":[4,45,59,150,169],"vital":[5],"aspect":[6],"of":[7,44,58,66,69,142,153],"factory":[8],"automation.":[9],"Focusing":[10],"on":[11,168],"developing":[12,74],"countries,":[13],"it":[14,36],"crucial":[16],"to":[17,40,138],"increase":[18],"production":[19,96],"line":[20],"reliability":[21,55],"at":[22],"the":[23,42,51,64,67,95,102,143],"lowest":[24],"extra":[25],"cost.":[26],"There":[27],"are":[28,86,129,136,164],"two":[29,126,144],"contributions":[30],"presented":[31],"in":[32,73,109],"this":[33],"paper.":[34],"First,":[35],"shown":[38],"how":[39],"reduce":[41],"cost":[43],"power":[46,53],"station":[47,54],"and":[48,106,112,132,157,161,166],"still":[49],"obtain":[50],"same":[52],"as":[56,99,101],"that":[57],"conventional":[60],"1-out-of-2":[61],"system.":[62],"Second,":[63],"problem":[65],"availability":[68],"spare":[70],"parts":[71],"(sensors)":[72],"countries":[75],"mitigated":[77],"by":[78,93],"swapping":[79,116],"fault-tolerant":[80,127],"architectures":[81,128,145],"whenever":[82],"different":[83],"quality":[84],"sensors":[85],"used.":[87],"This":[88],"can":[89],"be":[90],"easily":[91],"done":[92],"housing":[94],"line's":[97],"controller":[98],"well":[100],"sensors'":[103],"error":[104,159],"detection":[105,160],"recovery":[107,162],"mechanism":[108,117],"an":[110,124],"FPGA":[111],"using":[113],"DPR":[114],"for":[115,149],"without":[118],"any":[119],"costly":[120],"hardware":[121],"replacement.":[122],"As":[123],"example,":[125],"considered:":[130],"TMR":[131,156],"4-sift-out.":[133],"Petri":[134],"Nets":[135],"used":[137],"decide":[139],"which":[140],"one":[141],"more":[147],"appropriate":[148],"pre-determined":[151],"level":[152],"reliability.":[154],"Both":[155],"Sift-out":[158],"mechanisms":[163],"synthesized":[165],"implemented":[167],"XC7K160TFFV676-1":[170],"device.":[171]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}